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| ASCII Text | x | ||
| G.K. Maki, D.H. Sawin, "Fault-Tolerant Asynchronous Sequential Machines," IEEE Transactions on Computers, vol. 23, no. 7, pp. 651-657, July, 1974. | |||
| BibTex | x | ||
| @article{ 10.1109/T-C.1974.224013, author = {G.K. Maki and D.H. Sawin}, title = {Fault-Tolerant Asynchronous Sequential Machines}, journal ={IEEE Transactions on Computers}, volume = {23}, number = {7}, issn = {0018-9340}, year = {1974}, pages = {651-657}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1974.224013}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Fault-Tolerant Asynchronous Sequential Machines IS - 7 SN - 0018-9340 SP651 EP657 EPD - 651-657 A1 - G.K. Maki, A1 - D.H. Sawin, PY - 1974 KW - Asynchronous sequential circuits KW - fault detection KW - fault tolerant KW - reliable design KW - sequential circuits. VL - 23 JA - IEEE Transactions on Computers ER - | |||
A general design technique for achieving single fault-tolerant asynchronous sequential circuits is described. The design procedures apply over a large range of fault conditions and are extremely easy to use. Generally, less than three times the logic required for a single copy is needed to achieve single fault tolerance. In addition to fault tolerance, real time fault detection is easily achieved and it is immediately known when single fault tolerant capability is exceeded.
Index Terms:
Asynchronous sequential circuits, fault detection, fault tolerant, reliable design, sequential circuits.
Citation:
G.K. Maki, D.H. Sawin, "Fault-Tolerant Asynchronous Sequential Machines," IEEE Transactions on Computers, vol. 23, no. 7, pp. 651-657, July 1974, doi:10.1109/T-C.1974.224013
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