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A Note on Easily Testable Realizations for Logic Functions
March 1974 (vol. 23 no. 3)
pp. 332-333
K.L. Kodandapani, School of Automation, Indian Institute of Science
It is shown that at most, n + 3 tests are required to detect any single stuck-at fault in an AND gate or a single faulty EXCLUSIVE OR (EOR) gate in a Reed-Muller canonical form realization of a switching function.
Index Terms:
Fault detection, Reed-Muller canonical form, stuck-at faults.
Citation:
K.L. Kodandapani, "A Note on Easily Testable Realizations for Logic Functions," IEEE Transactions on Computers, vol. 23, no. 3, pp. 332-333, March 1974, doi:10.1109/T-C.1974.223935
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