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Asynchronous Sequential Machines Designed for Fault Detection
March 1974 (vol. 23 no. 3)
pp. 239-249
D.H. Sawin, Naval Electronics Laboratory Center
A design procedure is presented which allows for detection of faults in asynchronous sequential machines in a real time environment. Faults affecting both the output states and the internal operation of the machine are detected. The class of faults initially considered are single stuck-at-1 and stuck-at-0 faults. However, since the detection system presented is static and continuous, the class of faults detected will be greatly extended to include intermittent and a large number of multiple faults.
Index Terms:
Asynchronous sequential machine design, fault detection, fault masking, reliability, self-testable machines.
Citation:
D.H. Sawin, G.K. Maki, "Asynchronous Sequential Machines Designed for Fault Detection," IEEE Transactions on Computers, vol. 23, no. 3, pp. 239-249, March 1974, doi:10.1109/T-C.1974.223918
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