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Asynchronous Sequential Machines Designed for Fault Detection
March 1974 (vol. 23 no. 3)
pp. 239-249
ASCII Text
x 
 
D.H. Sawin, G.K. Maki, "Asynchronous Sequential Machines Designed for Fault Detection," IEEE Transactions on Computers, vol. 23, no. 3, pp. 239-249, March, 1974.
 
 
BibTex
x
 
@article{ 10.1109/T-C.1974.223918,
author = {D.H. Sawin and G.K. Maki},
title = {Asynchronous Sequential Machines Designed for Fault Detection},
journal ={IEEE Transactions on Computers},
volume = {23},
number = {3},
issn = {0018-9340},
year = {1974},
pages = {239-249},
doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1974.223918},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - Asynchronous Sequential Machines Designed for Fault Detection
IS - 3
SN - 0018-9340
SP239
EP249
EPD - 239-249
A1 - D.H. Sawin,
A1 - G.K. Maki,
PY - 1974
KW - Asynchronous sequential machine design
KW - fault detection
KW - fault masking
KW - reliability
KW - self-testable machines.
VL - 23
JA - IEEE Transactions on Computers
ER -
 
D.H. Sawin, Naval Electronics Laboratory Center
A design procedure is presented which allows for detection of faults in asynchronous sequential machines in a real time environment. Faults affecting both the output states and the internal operation of the machine are detected. The class of faults initially considered are single stuck-at-1 and stuck-at-0 faults. However, since the detection system presented is static and continuous, the class of faults detected will be greatly extended to include intermittent and a large number of multiple faults.
Index Terms:
Asynchronous sequential machine design, fault detection, fault masking, reliability, self-testable machines.
Citation:
D.H. Sawin, G.K. Maki, "Asynchronous Sequential Machines Designed for Fault Detection," IEEE Transactions on Computers, vol. 23, no. 3, pp. 239-249, March 1974, doi:10.1109/T-C.1974.223918
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