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Some New Error Bounds and Approximations for Pattern Recognition
February 1974 (vol. 23 no. 2)
pp. 194-199
| ASCII Text | x | ||
| J.T. Chu, "Some New Error Bounds and Approximations for Pattern Recognition," IEEE Transactions on Computers, vol. 23, no. 2, pp. 194-199, February, 1974. | |||
| BibTex | x | ||
| @article{ 10.1109/T-C.1974.223887, author = {J.T. Chu}, title = {Some New Error Bounds and Approximations for Pattern Recognition}, journal ={IEEE Transactions on Computers}, volume = {23}, number = {2}, issn = {0018-9340}, year = {1974}, pages = {194-199}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1974.223887}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Some New Error Bounds and Approximations for Pattern Recognition IS - 2 SN - 0018-9340 SP194 EP199 EPD - 194-199 A1 - J.T. Chu, PY - 1974 KW - Character recognition KW - decision procedures KW - error probability KW - feature selection KW - pattern recognition KW - upper and lower bounds KW - and approximations. VL - 23 JA - IEEE Transactions on Computers ER - | |||
For the average error probability Pe associated with the Bayes recognition procedures for two possible patterns, using no context, new upper and lower bounds and approximations are obtained. Results are given in terms of simple functions of feature "reliability" and a priori probabilities of the patterns. Two kinds of feature "reliability" are considered, i.e., distance between probability distrib
Index Terms:
Character recognition, decision procedures, error probability, feature selection, pattern recognition, upper and lower bounds, and approximations.
Citation:
J.T. Chu, "Some New Error Bounds and Approximations for Pattern Recognition," IEEE Transactions on Computers, vol. 23, no. 2, pp. 194-199, Feb. 1974, doi:10.1109/T-C.1974.223887
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