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Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions
January 1974 (vol. 23 no. 1)
pp. 98-100
S.M. Reddy, Department of Electrical Engineering, University of Iowa
Networks to realize all n-variable symmetric threshold functions and elementary symmetric functions are given. It is also shown that only 2n test inputs are necessary and sufficient to test any number of faults in these networks.
Index Terms:
Easily testable networks, multiple faults, single faults, stuck-at-faults, symmetric functions, threshold functions.
Citation:
S.M. Reddy, J.R. Wilson, "Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions," IEEE Transactions on Computers, vol. 23, no. 1, pp. 98-100, Jan. 1974, doi:10.1109/T-C.1974.223787
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