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Multiple-Fault Detection and Location in Fan-Out Free Combinational Circuits
January 1974 (vol. 23 no. 1)
pp. 48-55
G. Fantauzzi, Societ? Italiana Telecomunicazioni Siemens
Two algorithms are presented for the detection and location of single or multiple stuck faults in a fan-out free combinational circuit. The algorithms are based on a canonic representation of the indistinguishability classes of faults. The number of tests required in these algorithms are shown to be a linear function of the number of gates in the circuit.
Index Terms:
Combinational circuits, fan-out free circuits, fault detection, fault diagnosis, fault location, multiple stuck faults, tree circuits.
Citation:
G. Fantauzzi, A. Marsella, "Multiple-Fault Detection and Location in Fan-Out Free Combinational Circuits," IEEE Transactions on Computers, vol. 23, no. 1, pp. 48-55, Jan. 1974, doi:10.1109/T-C.1974.223776
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