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Issue No.12 - December (1973 vol.22)
pp: 1061-1064
A.D. Friedman , Department of Electrical Engineering and Computer Science, University of Southern California
ABSTRACT
It has been shown that the number of tests required to detect all faults in a one-dimensional unilateral combinational iterative array consisting of p cells will, in general, be proportional to p. In this paper we consider properties of such systems that enable them to be tested with a fixed constant number of tests independent of p, the number of cells in the system. Such systems are referred to as C-testable. Necessary and sufficient conditions on the basic cell state table are derived for an iterative system to be C-testable. It is shown that an arbitrary N-state cell table can be augmented by the addition of, at most, one row and less than [log2 N]2 columns (for N = 2) so as to be C-testable.
INDEX TERMS
Fault detection, iterative systems.
CITATION
A.D. Friedman, "Easily Testable Iterative Systems", IEEE Transactions on Computers, vol.22, no. 12, pp. 1061-1064, December 1973, doi:10.1109/T-C.1973.223651
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