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M.E. Gravitz, Department of Electrical Engineering, University of Missouri
Generation of test patterns and diagnostics for complex digital modules often involves a ternary (0, 1, u) simulation program. A non-Boolean technique, presented herein, initializes u (unknown) values in such a way that diagnostic resolution and accuracy is enhanced. A pure ternary simulator lacks this initialization capability.
Index Terms:
Fault detection, fault machine, fault signature, good machine, initialization, input test vector, ternary simulator.
Citation:
M.E. Gravitz, "A Note on a Modified Ternary Simulator Capable of Initializing All Fault Machine Memory Elements," IEEE Transactions on Computers, vol. 22, no. 11, pp. 1042-1044, Nov. 1973, doi:10.1109/T-C.1973.223643
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