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May 1973 (vol. 22 no. 5)
pp. 547
S.Y.H. Su, Dep. Comput. and Inform. Sci. Case Inst. Technol. Case Western Reserve Univ.
Problems of testing switching networks have been with us since the first computer was built and have become more difficult as the technology moved from discrete components to integrated circuits. Consequently, there has been an increasing interest in this area. This book covers methods of deriving efficient tests for different classes of switching circuits.
Citation:
S.Y.H. Su, "B73-12 Fault Detection in Digital Circuits," IEEE Transactions on Computers, vol. 22, no. 5, pp. 547, May 1973, doi:10.1109/T-C.1973.223766
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