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May 1973 (vol. 22 no. 5)
pp. 501-512
| ASCII Text | x | ||
| H.Y.P. Chang, G.W. Heimbigner, D.J. Senese, T.L. Smith, "Maintenance Techniques of a Microprogrammed Self-Checking Control Complex of an Electronic Switching System," IEEE Transactions on Computers, vol. 22, no. 5, pp. 501-512, May, 1973. | |||
| BibTex | x | ||
| @article{ 10.1109/T-C.1973.223753, author = {H.Y.P. Chang and G.W. Heimbigner and D.J. Senese and T.L. Smith}, title = {Maintenance Techniques of a Microprogrammed Self-Checking Control Complex of an Electronic Switching System}, journal ={IEEE Transactions on Computers}, volume = {22}, number = {5}, issn = {0018-9340}, year = {1973}, pages = {501-512}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1973.223753}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Maintenance Techniques of a Microprogrammed Self-Checking Control Complex of an Electronic Switching System IS - 5 SN - 0018-9340 SP501 EP512 EPD - 501-512 A1 - H.Y.P. Chang, A1 - G.W. Heimbigner, A1 - D.J. Senese, A1 - T.L. Smith, PY - 1973 KW - Fault detection and diagnosis KW - maintainability and reliability KW - microprogramming KW - self-checking processor KW - switching systems. VL - 22 JA - IEEE Transactions on Computers ER - | |||
This paper describes the various fault detection, routine exercise, and diagnostic techniques used in the design of a switching complex. Unlike other electronic switching system (ESS) processors, the processor is entirely self-checking.
Index Terms:
Fault detection and diagnosis, maintainability and reliability, microprogramming, self-checking processor, switching systems.
Citation:
H.Y.P. Chang, G.W. Heimbigner, D.J. Senese, T.L. Smith, "Maintenance Techniques of a Microprogrammed Self-Checking Control Complex of an Electronic Switching System," IEEE Transactions on Computers, vol. 22, no. 5, pp. 501-512, May 1973, doi:10.1109/T-C.1973.223753
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