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| ASCII Text | x | ||
| M.A. Breuer, "Testing for Intermittent Faults in Digital Circuits," IEEE Transactions on Computers, vol. 22, no. 3, pp. 241-246, March, 1973. | |||
| BibTex | x | ||
| @article{ 10.1109/T-C.1973.223701, author = {M.A. Breuer}, title = {Testing for Intermittent Faults in Digital Circuits}, journal ={IEEE Transactions on Computers}, volume = {22}, number = {3}, issn = {0018-9340}, year = {1973}, pages = {241-246}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1973.223701}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Testing for Intermittent Faults in Digital Circuits IS - 3 SN - 0018-9340 SP241 EP246 EPD - 241-246 A1 - M.A. Breuer, PY - 1973 KW - Digital circuits KW - fault diagnosis KW - intermittent faults KW - testing. VL - 22 JA - IEEE Transactions on Computers ER - | |||
In this paper we present a few fundamental results related to the problems of characterization and detection of intermittent faults in digital circuits, which, up to now, have been almost totally ignored. This problem is important since in many technologies intermittency is a predominant mode of failure.
Index Terms:
Digital circuits, fault diagnosis, intermittent faults, testing.
Citation:
M.A. Breuer, "Testing for Intermittent Faults in Digital Circuits," IEEE Transactions on Computers, vol. 22, no. 3, pp. 241-246, March 1973, doi:10.1109/T-C.1973.223701
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