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March 1973 (vol. 22 no. 3)
pp. 241-246
M.A. Breuer, Department of Electrical Engineering, University of Southern California
In this paper we present a few fundamental results related to the problems of characterization and detection of intermittent faults in digital circuits, which, up to now, have been almost totally ignored. This problem is important since in many technologies intermittency is a predominant mode of failure.
Index Terms:
Digital circuits, fault diagnosis, intermittent faults, testing.
Citation:
M.A. Breuer, "Testing for Intermittent Faults in Digital Circuits," IEEE Transactions on Computers, vol. 22, no. 3, pp. 241-246, March 1973, doi:10.1109/T-C.1973.223701
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