The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.03 - March (1973 vol.22)
pp: 235-240
null Min-Wen Du , College of Engineering, National Chiao Tung University
ABSTRACT
A new approach is developed for finding multiple fault detection tests under quite arbitrary fault models. Computational results are reported and discussed.
INDEX TERMS
Combinational logic networks, computational experiments, fault detection, fault tree, function verification, multiple faults.
CITATION
null Min-Wen Du, C.D. Weiss, "Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results", IEEE Transactions on Computers, vol.22, no. 3, pp. 235-240, March 1973, doi:10.1109/T-C.1973.223700
38 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool