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Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results
March 1973 (vol. 22 no. 3)
pp. 235-240
null Min-Wen Du, College of Engineering, National Chiao Tung University
A new approach is developed for finding multiple fault detection tests under quite arbitrary fault models. Computational results are reported and discussed.
Index Terms:
Combinational logic networks, computational experiments, fault detection, fault tree, function verification, multiple faults.
Citation:
null Min-Wen Du, C.D. Weiss, "Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results," IEEE Transactions on Computers, vol. 22, no. 3, pp. 235-240, March 1973, doi:10.1109/T-C.1973.223700
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