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Algorithms ror Designing Fault-Detection Experiments ror Sequential Machines
February 1973 (vol. 22 no. 2)
pp. 159-167
D.E. Farmer, Department of Electrical and Computer Engineering, Clarkson College of Technology
In this paper we present algorithms for designing fault-detection experiments for sequential machines with special emphasis on the case in which the machine does not possess a distinguishing sequence. The length of an experiment is reduced through: 1) identifying each state with its own unique input/output set rather than using a common set for all states; 2) utilizing overlapping of the required input/output sequences so that a portion of the experiment serves more than one purpose; and 3) verifying the reference condition in which the machine is placed at many points in the experiment by as short a locating sequence as possible. Important distinctions are made between locating sequences of the type introduced in previous work and those defined and used here.
Index Terms:
Characterizing sequence, distinguishing sequence, fault-detection experiments, locating sequence, sequential machine.
Citation:
D.E. Farmer, "Algorithms ror Designing Fault-Detection Experiments ror Sequential Machines," IEEE Transactions on Computers, vol. 22, no. 2, pp. 159-167, Feb. 1973, doi:10.1109/T-C.1973.223678
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