System Modeling and Testing Procedures for Microdiagnostics

C.V. Ramamoorthy; L.C. Chang

doi:10.1109/T-C.1972.223474

Publication
1972
Issue No. 11 - November
Abstract - System Modeling and Testing Procedures for Microdiagnostics

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System Modeling and Testing Procedures for Microdiagnostics (PDF)

November 1972 (vol. 21 no. 11)

pp. 1169-1183

	ASCII Text	x
	C.V. Ramamoorthy, L.C. Chang, "System Modeling and Testing Procedures for Microdiagnostics," IEEE Transactions on Computers, vol. 21, no. 11, pp. 1169-1183, November, 1972.

	BibTex	x
	@article{ 10.1109/T-C.1972.223474, author = {C.V. Ramamoorthy and L.C. Chang}, title = {System Modeling and Testing Procedures for Microdiagnostics}, journal ={IEEE Transactions on Computers}, volume = {21}, number = {11}, issn = {0018-9340}, year = {1972}, pages = {1169-1183}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1972.223474}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - JOUR JO - IEEE Transactions on Computers TI - System Modeling and Testing Procedures for Microdiagnostics IS - 11 SN - 0018-9340 SP1169 EP1183 EPD - 1169-1183 A1 - C.V. Ramamoorthy, A1 - L.C. Chang, PY - 1972 KW - Diagnostics KW - fault detection KW - fault location KW - microdiagnostics KW - microprogram. VL - 21 JA - IEEE Transactions on Computers ER -

C.V. Ramamoorthy, Department of Electrical Engineering and Computer Science, University of California

L.C. Chang

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/T-C.1972.223474

Some basic ideas and practices in the area of microdiagnostics are surveyed, and these are molded into a theoretical framework that could help the design of microprogrammed computers, as well as the development of test procedures for fault detection and location. The basic architectural variations as seen in the current microprogrammed computers and their relationship to microdiagnostics are discussed.

Index Terms:

Diagnostics, fault detection, fault location, microdiagnostics, microprogram.

Citation:

C.V. Ramamoorthy, L.C. Chang, "System Modeling and Testing Procedures for Microdiagnostics," IEEE Transactions on Computers, vol. 21, no. 11, pp. 1169-1183, Nov. 1972, doi:10.1109/T-C.1972.223474

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