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Issue No.04 - April (1972 vol.21)
pp: 385-388
James C. Bassett , Department of Electrical Engineering, University of Wisconsin, Madison, Wis.
Charles R. Kime , Department of Electrical Engineering, University of Wisconsin, Madison, Wis.
ABSTRACT
The definition of the generalized fault table [1] is expanded to cover a representation employing more than one fault q cube per fault pattern. On the basis of this expanded definition and simple concepts from a cover algebra, a new procedure is developed for finding first- and second-order diagnostic resolutions.
CITATION
James C. Bassett, Charles R. Kime, "Improved Procedures for Determining Diagnostic Resolution", IEEE Transactions on Computers, vol.21, no. 4, pp. 385-388, April 1972, doi:10.1109/TC.1972.5008980
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