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Path Sensitization, Partial Boolean Difference, and Automated Fault Diagnosis
February 1972 (vol. 21 no. 2)
pp. 189-195
ASCII Text
x 
 
A. C. L. Chiang, I. S. Reed, A. V. Banes, "Path Sensitization, Partial Boolean Difference, and Automated Fault Diagnosis," IEEE Transactions on Computers, vol. 21, no. 2, pp. 189-195, February, 1972.
 
 
BibTex
x
 
@article{ 10.1109/TC.1972.5008925,
author = {A. C. L. Chiang and I. S. Reed and A. V. Banes},
title = {Path Sensitization, Partial Boolean Difference, and Automated Fault Diagnosis},
journal ={IEEE Transactions on Computers},
volume = {21},
number = {2},
issn = {0018-9340},
year = {1972},
pages = {189-195},
doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1972.5008925},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - Path Sensitization, Partial Boolean Difference, and Automated Fault Diagnosis
IS - 2
SN - 0018-9340
SP189
EP195
EPD - 189-195
A1 - A. C. L. Chiang,
A1 - I. S. Reed,
A1 - A. V. Banes,
PY - 1972
VL - 21
JA - IEEE Transactions on Computers
ER -
 
A. C. L. Chiang, Macrodata Company, Chatsworth, Calif. 91311.
I. S. Reed, Department of Electrical Engineering, University of Southern California, Los Angeles, Calif. 90007.
A. V. Banes, Macrodata Company, Chatsworth, Calif. 91311.
A tool employed in automated fault diagnosis is emphasized: path sensitization by partial Boolean difference analysis. Motivated by the analogy between a test system and a communication system, a model for fault detection of a logic net is outlined from the standpoint of information theory. The classical ``path sensitizing'' technique is made systematic using the partial Boolean difference. This technique is based on a new theorem on the partial Boolean difference. Finally, a programmable fault detection algorithm is presented along with an example.
Citation:
A. C. L. Chiang, I. S. Reed, A. V. Banes, "Path Sensitization, Partial Boolean Difference, and Automated Fault Diagnosis," IEEE Transactions on Computers, vol. 21, no. 2, pp. 189-195, Feb. 1972, doi:10.1109/TC.1972.5008925
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