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October 1970 (vol. 19 no. 10)
pp. 988-989
H.Y. Chang, Bell Telephone Labs., Inc.
This is an interesting paper. The authors consider two problems related to the testing of universal cellular tree circuits. The first is concerned with the detection and location of faulty cells by applying a minimal number of tests. The second is concerned with that of finding a set of switching functions that can be implemented by a faulty tree circuit.
Citation:
H.Y. Chang, "R70-41 Diagnosis and Utilization of Faulty Universal Tree Circuits," IEEE Transactions on Computers, vol. 19, no. 10, pp. 988-989, Oct. 1970, doi:10.1109/T-C.1970.222814
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