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July 1970 (vol. 19 no. 7)
pp. 660
J.P. Robinson, University of Iowa
This paper describes a sequential suboptimal test selection procedure for a combinational logic circuit. The goal is package level diagnosis assuming a single permanent fault and multiple outputs. The method extends to multiple permanent faults and/or a single output since the starting point is a fault table of test inputs as columns, faults as rows, and resulting output as the entry.
Citation:
J.P. Robinson, "R70-24 A Procedure for Selecting Diagnostic Tests," IEEE Transactions on Computers, vol. 19, no. 7, pp. 660, July 1970, doi:10.1109/T-C.1970.223011
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