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| ASCII Text | x | ||
| J.P. Robinson, "R70-24 A Procedure for Selecting Diagnostic Tests," IEEE Transactions on Computers, vol. 19, no. 7, pp. 660, July, 1970. | |||
| BibTex | x | ||
| @article{ 10.1109/T-C.1970.223011, author = {J.P. Robinson}, title = {R70-24 A Procedure for Selecting Diagnostic Tests}, journal ={IEEE Transactions on Computers}, volume = {19}, number = {7}, issn = {0018-9340}, year = {1970}, pages = {660}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1970.223011}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - R70-24 A Procedure for Selecting Diagnostic Tests IS - 7 SN - 0018-9340 SP EP EPD - 660 A1 - J.P. Robinson, PY - 1970 KW - null VL - 19 JA - IEEE Transactions on Computers ER - | |||
This paper describes a sequential suboptimal test selection procedure for a combinational logic circuit. The goal is package level diagnosis assuming a single permanent fault and multiple outputs. The method extends to multiple permanent faults and/or a single output since the starting point is a fault table of test inputs as columns, faults as rows, and resulting output as the entry.
Citation:
J.P. Robinson, "R70-24 A Procedure for Selecting Diagnostic Tests," IEEE Transactions on Computers, vol. 19, no. 7, pp. 660, July 1970, doi:10.1109/T-C.1970.223011
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