This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
June 1970 (vol. 19 no. 6)
pp. 564-565
J.P. Roth, IBM Corporation
This paper is concerned primarily with methods of diagnosis, as opposed with detection of (single-gate) failures in combinational circuits, with but one primary output. Most previous papers in this area have been concerned with diagnosis and have neglected the detection problem. One result of interest is that it is shown that "for complete diagnosis the number of tests which must be applied to the circuit is proportional to the number of gates and is independent of the number of primary input terminals." Assumed but not given in their method is an algorithm for the purpose of computing a test to distinguish between two failures if such exists.
Citation:
J.P. Roth, "R70-12 Diagnosis of Single-Gate Failures in Combinational Circuits," IEEE Transactions on Computers, vol. 19, no. 6, pp. 564-565, June 1970, doi:10.1109/T-C.1970.222983
Usage of this product signifies your acceptance of the Terms of Use.