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Issue No.06 - June (1970 vol.19)
pp: 564-565
J.P. Roth , IBM Corporation
ABSTRACT
This paper is concerned primarily with methods of diagnosis, as opposed with detection of (single-gate) failures in combinational circuits, with but one primary output. Most previous papers in this area have been concerned with diagnosis and have neglected the detection problem. One result of interest is that it is shown that "for complete diagnosis the number of tests which must be applied to the circuit is proportional to the number of gates and is independent of the number of primary input terminals." Assumed but not given in their method is an algorithm for the purpose of computing a test to distinguish between two failures if such exists.
INDEX TERMS
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CITATION
J.P. Roth, "R70-12 Diagnosis of Single-Gate Failures in Combinational Circuits", IEEE Transactions on Computers, vol.19, no. 6, pp. 564-565, June 1970, doi:10.1109/T-C.1970.222983