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August 1969 (vol. 18 no. 8)
pp. 760
| ASCII Text | x | ||
| T.F. Dwyer, "Comments on "Fault Testing and Diagnosis in Combinational Digital Circuits"," IEEE Transactions on Computers, vol. 18, no. 8, pp. 760, August, 1969. | |||
| BibTex | x | ||
| @article{ 10.1109/T-C.1969.222761, author = {T.F. Dwyer}, title = {Comments on "Fault Testing and Diagnosis in Combinational Digital Circuits"}, journal ={IEEE Transactions on Computers}, volume = {18}, number = {8}, issn = {0018-9340}, year = {1969}, pages = {760}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1969.222761}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Comments on "Fault Testing and Diagnosis in Combinational Digital Circuits" IS - 8 SN - 0018-9340 SP EP EPD - 760 A1 - T.F. Dwyer, PY - 1969 KW - Faults diagnosis KW - indistinguishable faults KW - intermittent faults KW - multiple faults. VL - 18 JA - IEEE Transactions on Computers ER - | |||
To be of general value, a digital fault diagnosis method must be able to handle intermittent and multiple faults.
Index Terms:
Faults diagnosis, indistinguishable faults, intermittent faults, multiple faults.
Citation:
T.F. Dwyer, "Comments on "Fault Testing and Diagnosis in Combinational Digital Circuits"," IEEE Transactions on Computers, vol. 18, no. 8, pp. 760, Aug. 1969, doi:10.1109/T-C.1969.222761
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