- W
- WWC
- 2004
- IEEE International Workshop on Workload Characterization, 2004. WWC-7. 2004
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IEEE International Workshop on Workload Characterization, 2004. WWC-7. 2004 Austin, TX, USA October 25-October 25 ISBN: 0-7803-8828-3 Table of Contents
 | Papers |
P.G. Sassone, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
D.S. Wills, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA pp. 11-18
A. Bhowmik, Dept. of Comput. Sci.&Autom., Indian Inst. of Sci., Bangalore, India pp. 19-26
C. Costa, Dept. of Comput. Sci., Fed. Univ. of Minas Gerais, Belo Horizonte, Brazil
C. Ramos, Dept. of Comput. Sci., Fed. Univ. of Minas Gerais, Belo Horizonte, Brazil
I. Cunha, Dept. of Comput. Sci., Fed. Univ. of Minas Gerais, Belo Horizonte, Brazil
J.M. Almeida, Dept. of Comput. Sci., Fed. Univ. of Minas Gerais, Belo Horizonte, Brazil pp. 29-36
R. Illikkal, Commun. Technol. Lab., Intel Corp., Santa Clara, CA, USA
R. Iyer, Commun. Technol. Lab., Intel Corp., Santa Clara, CA, USA
D. Newell, Commun. Technol. Lab., Intel Corp., Santa Clara, CA, USA pp. 37-44
M. Watson, Dept. of Comput. Sci., Brigham Young Univ., Provo, UT, USA
J.K. Flanagan, Dept. of Comput. Sci., Brigham Young Univ., Provo, UT, USA pp. 47-54
G. Franco, Fed. Univ. of Minas Gerais, Brazil
L. Silva, Fed. Univ. of Minas Gerais, Brazil
W. Meira, Fed. Univ. of Minas Gerais, Brazil
W. Santos, Fed. Univ. of Minas Gerais, Brazil pp. 63-70
P. Koka, Dept. of Electr.&Comput. Eng., Wisconsin Univ., Madison, WI, USA pp. 73-80
R. Ali, Scalable Syst. Group, Dell, Round Rock, TX, USA
G. Kochhar, Scalable Syst. Group, Dell, Round Rock, TX, USA
J. Hsieh, Scalable Syst. Group, Dell, Round Rock, TX, USA pp. 81-88 Usage of this product signifies your acceptance of the Terms of Use.
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