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1999 Winter Simulation Conference (WSC'99) - Volume 1
Phoenix, AZ, USA
December 05-December 08
ISBN: 0-7803-5780-9
Table of Contents
Papers
J. Anton, Purdue University
J. Banks, AutoS, Atlanta, GA, USA
pp. 7-13
L. Leemis, Dept. of Math., Coll. of William & Mary, Williamsburg, VA, USA
pp. 14-23
S.M. Sanchez, Sch. of Bus. Adm., Missouri Univ., St. Louis, MO, USA
pp. 24-32
W.D. Kelton, Dept. of Quantitative Anal. & Oper. Manage., Cincinnati Univ., OH, USA
pp. 33-38
R.G. Sargent, Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., NY, USA
pp. 39-48
A.M. Law, Averill M. Law & Assoc. Inc., Tucson, AZ, USA
M.G. McComas, AutoS, Atlanta, GA, USA
pp. 56-59
D.A. Sadowski, Syst. Modelling Corp., Sewickley, PA, USA
M.R. Grabau, AutoS, Atlanta, GA, USA
pp. 60-66
T.J. Schriber, Comput. & Inf. Syst., Michigan Univ., Ann Arbor, MI, USA
D.T. Brunner, AutoS, Atlanta, GA, USA
pp. 72-80
D. Goldsman, Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
B.L. Nelson, AutoS, Atlanta, GA, USA
pp. 83-92
F. Azadivar, Dept. of Ind. & Manuf. Syst. Eng., Kansas State Univ., Manhattan, KS, USA
pp. 93-100
B. Schmeiser, Sch. of Ind. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 110-115
C.H. Reilly, Dept. of Ind. Eng. & Manage. Syst., Central Florida Univ., Orlando, FL, USA
pp. 116-121
R.M. Fujimoto, Coll. of Comput., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 122-131
J.A. Joines, Dept. of Ind. Eng., North Carolina State Univ., Raleigh, NC, USA
S.D. Roberts, AutoS, Atlanta, GA, USA
pp. 132-140
W.J. Davis, Dept. of Gen. Eng., Illinois Univ., Urbana, IL, USA
pp. 141-147
D. Sadowski, Syst. Modelling Corp., Sewickley, PA, USA
V. Bapat, AutoS, Atlanta, GA, USA
pp. 159-166
SLX: pyramid power (Abstract)
J.O. Henriksen, Wolverine Software Corp., Alexandria, VA, USA
pp. 167-175
R.C. Crain, Wolverine Software Corp., Alexandria, VA, USA
J.O. Henriksen, AutoS, Atlanta, GA, USA
pp. 182-187
D. Krahl, Imagine That Inc., San Jose, CA, USA
pp. 188-195
J.J. O'Reilly, Symix Syst. Inc., Indianapolis, IN, USA
W.R. Lilegdon, AutoS, Atlanta, GA, USA
pp. 196-200
J.J. O'Reilly, Symix Systems, Inc.
W.R. Lilegdon, AutoS, Atlanta, GA, USA
pp. 201-207
R.N. Price, PROMODEL Corp., Orem, UT, USA
C.R. Harrell, AutoS, Atlanta, GA, USA
pp. 208-214
D.R. Hullinger, F&H Simulations Inc., Orem, UT, USA
pp. 227-229
A. Mehta, Lanner Group Inc., Houston, TX, USA
I. Rawles, AutoS, Atlanta, GA, USA
pp. 230-233
B. Wood, CACI Products Co., La Jolla, CA, USA
K. Tumay, AutoS, Atlanta, GA, USA
pp. 234-238
F. Glover, Sch. of Bus., Colorado Univ., Boulder, CO, USA
J.P. Kelly, AutoS, Atlanta, GA, USA
pp. 255-260
A.M. Law, Averill M. Law & Assoc. Inc., Tucson, AZ, USA
M.G. McComas, AutoS, Atlanta, GA, USA
pp. 261-266
K.E. Moore, ALPHATECH Inc., Burlington, MA, USA
J.C. Chiang, AutoS, Atlanta, GA, USA
pp. 267-275
W.K. Bloechle, Micro Anal. & Design Inc., Boulder, CO, USA
W.K. Bloechle, AutoS, Atlanta, GA, USA
pp. 286-288
D. Delen, Knowledge Based Syst. Inc., College Station, TX, USA
P.C. Benjamin, AutoS, Atlanta, GA, USA
pp. 289-297
H. Herper, Inst. for Simulation & Graphics, Otto von Guericke Univ., Magdeburg, Germany
I. Stahl, AutoS, Atlanta, GA, USA
pp. 298-306
Xinjie Chang, Network Technol. Res. Center, Nanyang Technol. Univ., Singapore
pp. 307-314
S.E. Chick, Dept. of Ind. & Oper. Eng., Michigan Univ., Ann Arbor, MI, USA
pp. 317-324
M. Freimer, Sch. of Oper. Res. & Ind. Eng., Cornell Univ., Ithaca, NY, USA
L. Schruben, AutoS, Atlanta, GA, USA
pp. 325-329
A.N. Avramidis, Sch. of Oper. Res. & Ind. Eng., Cornell Univ., Ithaca, NY, USA
P. Hyden, AutoS, Atlanta, GA, USA
pp. 344-350
S.G. Henderson, Dept. of Eng. Sci., Auckland Univ., New Zealand
P.W. Glynn, AutoS, Atlanta, GA, USA
pp. 367-373
J.R. Gallardo, Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, Ont., Canada
D. Makrakis, AutoS, Atlanta, GA, USA
pp. 374-381
D. Goldsman, Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
W.S. Marshall, AutoS, Atlanta, GA, USA
pp. 382-388
P. Hyden, Sch. of Oper. Res. & Ind. Eng., Cornell Univ., Ithaca, NY, USA
L. Schruben, AutoS, Atlanta, GA, USA
pp. 389-394
D.P. Kroese, Teletraffic Res. Centre, Adelaide Univ., SA, Australia
V.F. Nicola, AutoS, Atlanta, GA, USA
pp. 411-419
E.J. Chen, Dept. of Quantitative Anal. & Oper. Manage., Cincinnati Univ., OH, USA
W.D. Kelton, AutoS, Atlanta, GA, USA
pp. 428-434
N.M. Steiger, Dept. of Inf. Syst. & Oper. Manage., North Carolina Univ., Greensboro, NC, USA
J.R. Wilson, AutoS, Atlanta, GA, USA
pp. 442-451
M.E. Kuhl, Dept. of Ind. & Manuf. Syst. Eng., Louisiana State Univ., Baton Rouge, LA, USA
M.E. Kuhl, AutoS, Atlanta, GA, USA
pp. 462-465
L. Gerencser, Comput. & Autom. Inst., Hungarian Acad. of Sci., Budapest, Hungary
S.D. Hill, AutoS, Atlanta, GA, USA
pp. 466-470
S. Olafsson, Dept. of Ind. & Manuf. Syst. Eng., Iowa State Univ., Ames, IA, USA
pp. 479-485
M.I. Reis Dos Santos, Dept. de Matematica, Inst. Superior Tecnico, Lisbon, Portugal
A.M.O. Porta Nova, AutoS, Atlanta, GA, USA
pp. 502-509
A.L. Poplawski, Dept. of Comput. Sci., Dartmouth Coll., Hanover, NH, USA
D.M. Nicol, AutoS, Atlanta, GA, USA
pp. 524-530
M. Nasereddin, Dept. of Ind. Eng. & Manage. Syst., Central Florida Univ., Orlando, FL, USA
M. Mollaghasemi, AutoS, Atlanta, GA, USA
pp. 537-542
C.W. Zobel, Dept. of Manage. Sci. & Inf. Technol., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
W.T. Scherer, AutoS, Atlanta, GA, USA
pp. 569-572
F. Szidarovszky, Dept. of Syst. & Ind. Eng., Arizona Univ., Tucson, AZ, USA
A. Eskandari, AutoS, Atlanta, GA, USA
pp. 573-577
M. Page, Project Sherpa INRIA Rhone Alpes, Univ. Pierre Mendes France, Montbonnot, France
J. Gensel, AutoS, Atlanta, GA, USA
pp. 578-585
H. de Swaan Arons, Dept. of Comput. Sci., Erasmus Univ., Rotterdam, Netherlands
pp. 591-597
C.R. Standridge, Padnos Sch. of Eng., Grand Valley State Univ., Grand Rapids, MI, USA
pp. 598-602
S.E. Chick, Dept. of Ind. & Oper. Eng., Michigan Univ., Ann Arbor, MI, USA
K. Inoue, AutoS, Atlanta, GA, USA
pp. 603-610
B.L. Nelson, Dept. of Ind. Eng. & Manage. Sci., Northwestern Univ., Evanston, IL, USA
S. Banerjee, AutoS, Atlanta, GA, USA
pp. 611-617
D.J. Morrice, Dept. of Manage. Sci. & Inf. Syst., Texas Univ., Austin, TX, USA
J. Botler, AutoS, Atlanta, GA, USA
pp. 618-624
P. L'Ecuyer, Dept. d'Inf. et de Recherche Oper., Montreal Univ., Que., Canada
C. Lemieux, AutoS, Atlanta, GA, USA
pp. 632-639
J.M. Calvin, Dept. of Comput. & Inf. Sci., New Jersey Inst. of Technol., Newark, NJ, USA
P.W. Glynn, AutoS, Atlanta, GA, USA
pp. 655-661
C.W. Zobel, Dept. of Manage. Sci., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
C.W. Zobel, AutoS, Atlanta, GA, USA
pp. 662-665
S. Olafsson, Dept. of Ind. & Manuf. Syst. Eng., Iowa State Univ., Ames, IA, USA
Leyuan Shi, AutoS, Atlanta, GA, USA
pp. 666-672
J.M. Calvin, Dept. of Comput. & Inf. Sci., New Jersey Inst. of Technol., Newark, NJ, USA
pp. 673-677
E.J. Koehler, Dept. of Wafer Syst. Eng., Seagate Technol., Bloomington, MN, USA
T.M. Wulf, AutoS, Atlanta, GA, USA
pp. 714-719
J. Potoradi, Infincon Technol. Asia Pacific, Singapore
G. Winz, AutoS, Atlanta, GA, USA
pp. 720-726
M. Hickie, Motorola Inc., Chandler, AZ, USA
J.W. Fowler, AutoS, Atlanta, GA, USA
pp. 754-758
R.A. Reid, Anderson Sch. of Manage., New Mexico Univ., Albuquerque, NM, USA
E.L. Koljonen, AutoS, Atlanta, GA, USA
pp. 759-765
I. Paprotny, Dept. of Autom. Planning & Design, PRI Autom. Inc., Mesa, AZ, USA
W. Zhao, AutoS, Atlanta, GA, USA
pp. 779-783
K.M. Corker, Dept. of Comput. Inf. & Syst. Eng., San Jose State Univ., CA, USA
pp. 821-828
N.S. Grewal, Dept. of Wafer Syst. Eng., Seagate Technol., Bloomington, MN, USA
A.C. Bruska, AutoS, Atlanta, GA, USA
pp. 843-849
M. Hickie, Dept. of Syst. Eng., Virginia Univ., Charlottesville, VA, USA
W.J. Trybula, AutoS, Atlanta, GA, USA
pp. 865-874
D. Rohan, Div. of Microelectron., IBM Corp., East Fishkill, NY, USA
pp. 897-902
C.D. DeJong, Intel Corp., Chandler, AZ, USA
T. Jefferson, AutoS, Atlanta, GA, USA
pp. 903-908
P.L. Campbell, Div. of Microelectron., IBM Corp., East Fishkill, NY, USA
D. Rohan, AutoS, Atlanta, GA, USA
pp. 909-911
J. Weckman, Dept. of Autom. Planning & Design, PRI Autom., Mesa, AZ, USA
T. Colvin, AutoS, Atlanta, GA, USA
pp. 912-917
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