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Fourth IEEE Workshop on Applications of Computer Vision (WACV'98)
Princeton, New Jersey
October 19-October 21
ISBN: 0-8186-8606-5
Table of Contents
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Session 1A: Tracking
Alan J. Lipton, Carnegie Mellon University
Hironobu Fujiyoshi, Carnegie Mellon University
Raju S. Patil, Carnegie Mellon University
pp. 8
Moshe Ben-Ezra, The Hebrew University of Jerusalem
Shmuel Peleg, The Hebrew University of Jerusalem
Michael Werman, The Hebrew University of Jerusalem
pp. 22
Session 1B: Actions and Activities
John Krumm, Sandia National Laboratories
Greg Kirk, Sandia National Laboratories
pp. 30
Xiaoguang Wang, University of Massachusetts
Allen R Hanson, University of Massachusetts
pp. 36
Douglas Ayers, University of Central Florida
Mubarak Shah, University of Central Florida
pp. 42
Session 2A: Mosaicing I
H. S. Sawhney, Sarnoff Corporation
R. Kumar, Sarnoff Corporation
G. Gendel, Sarnoff Corporation
J. Bergen, Sarnoff Corporation
D. Dixon, Sarnoff Corporation
V. Paragano, Sarnoff Corporation
pp. 56
Session 3A: Indexing
S. Ravela, University of Massachusetts
R. Manmatha, University of Massachusetts
pp. 82
Session 3B: Medical and Document Imaging
Olivier G?rard, Laboratoires d?Electronique Philips S.A.S.
Sh?rif Makram-Ebeid, Laboratoires d?Electronique Philips S.A.S.
pp. 115
Rahul Singh, University of Minnesota, Minneapolis
Michael C. Wade, University of Minnesota, Minneapolis
Nikolaos P. Papanikolopoulos, University of Minnesota, Minneapolis
pp. 121
Session 4A: Industrial Inspection
Suchendra M Bhandarkar, The University of Georgia
Timothy D Faust, The University of Georgia
Mengjin Tang, The University of Georgia
pp. 134
G Cong, Lawrence Berkeley National Laboratory
B Parvin, Lawrence Berkeley National Laboratory
pp. 140
Session 4B: Mosaicing II
Ruzena Bajcsy, University of Pennsylvania
Reyes Enciso, University of Pennsylvania
Gerda Kamberova, University of Pennsylvania
Lucien Nocera, University of Pennsylvania
Radim S?ra, Czech Technical University
pp. 160
Stephen Pollard, Hewlett-Packard Laboratories
Maurizio Pilu, Hewlett-Packard Laboratories
Sean Hayes, Hewlett-Packard Laboratories
Adele Lorusso, Hewlett-Packard Laboratories
pp. 168
Session 5A: Terrain Recovery and Manipulation
Xiaoguang Wang, University of Massachusetts, Amherst
Allen R Hanson, University of Massachusetts, Amherst
Edward M Riseman, University of Massachusetts, Amherst
Howard Schultz, University of Massachusetts, Amherst
pp. 182
James J Little, University of British Columbia
Ping Shi, University of British Columbia
pp. 188
Marcus A Maloof, Georgetown University
Pat Langley, Institute for the Study of Learning and Expertise
Thomas O Binford, Stanford University
Ramakant Nevatia, University of Southern California
pp. 194
Session 5B: Face Analysis and Pose Estimation
Takahiro Otsuka, ATR Media Integration & Communications Research Laboratories
Jun Ohya, ATR Media Integration & Communications Research Laboratories
pp. 220
Vinayadatt V. Kohir, Indian Institute of Technology
U. B. Desai, Indian Institute of Technology
pp. 226
Demo 1: Demo Session I
Heung-Yeung Shum, Microsoft Research
Richard Szeliski, Microsoft Research
Simon Baker, Columbia University
Mei Han, Carnegie Mellon University
P. Anandan, Microsoft Research
pp. 234
Shree K. Nayar, Columbia University
Joshua Gluckman, Columbia University
Rahul Swaminathan, Columbia University
Simon Lok, Columbia University
Terry Boult, Columbia University
pp. 236
Yoav Rosenberg, The Hebrew University of Jerusalem
Michael Werman, The Hebrew University of Jerusalem
pp. 238
Thomas O?Donnell, Siemens Corporate Research
Gareth Funka-Lea, Siemens Corporate Research
pp. 240
Terry Boult, EECS Department Lehigh University
Chen Qian, EECS Department Lehigh University
Weihong Yin, EECS Department Lehigh University
Ali Erkin, EECS Department Lehigh University
Peter Lewis, EECS Department Lehigh University
Chris Power, EECS Department Lehigh University
Ross Micheals, EECS Department Lehigh University
pp. 242
Edgar Gardu?, University of Pennsylvania
Gabor T. Herman, University of Pennsylvania
pp. 244
Ali Bani-Hashemi, Siemens Corporate Research, Princeton
Nassir Navab, Siemens Corporate Research, Princeton
Mariappan Nadar, Siemens Corporate Research, Princeton
Bernhard Geiger, Siemens Corporate Research, Princeton
Rama Ramaraj, Siemens Corporate Research, Princeton
Karl Wiesent, Siemens AG
Thomas Brunner, Siemens AG
pp. 246
Demo 2: Demo Session II
Huaibin Zhao, The University of Texas at Austin
Shishir Shah, The University of Texas at Austin
Jae Hun Choi, The University of Texas at Austin
Dinesh Nair, The University of Texas at Austin
J. K. Aggarwal, The University of Texas at Austin
pp. 262
Demo 3: Demo Session III
Madirakshi Das, University of Massachusetts
Shih-Ping Liou, Siemens Corporate Research
pp. 274
Pascal Bertolino, INRIA Rh?nes-Alpes, IMAG
Roger Mohr, INRIA Rh?nes-Alpes, IMAG
Cordelia Schmid, INRIA Rh?nes-Alpes, IMAG
Patrick Bouthemy, IRISA/INRIA
Marc Gelgon, IRISA/INRIA
Fabien Spindler, IRISA/INRIA
Serge Benayoun, Alcatel Alsthom Recherche
Helene Bernard, Alcatel Alsthom Recherche
pp. 276
Nassir Navab, Siemens Corporate Research, Princeton
Nick Craft, Siemens Corporate Research, Princeton
Sven Bauer, Siemens Corporate Research, Princeton
Ali Bani-Hashemi, Siemens Corporate Research, Princeton
pp. 278
Demo 4: Demo Session IV
Jayan Eledath, Sarnoff Corporation
Luke McDowell, Sarnoff Corporation
Michael Hansen, Sarnoff Corporation
Lambert Wixson, Sarnoff Corporation
Art Pope, Sarnoff Corporation
Gary Gendel, Sarnoff Corporation
pp. 284
Assaf Zomet, The Hebrew University of Jerusalem
Shmuel Peleg, The Hebrew University of Jerusalem
pp. 286
R. Mandelbaum, Sarnoff Corporation
L. McDowell, Sarnoff Corporation
L. Bogoni, Sarnoff Corporation
B. Reich, Sarnoff Corporation
M. Hansen, Sarnoff Corporation
pp. 288
J. Asmuth, Sarnoff Corporation
D. Dixon, Sarnoff Corporation
K. Hanna, Sarnoff Corporation
S.C. Hsu, Sarnoff Corporation
R. Kumar, Sarnoff Corporation
V. Paragano, Sarnoff Corporation
A. Pope, Sarnoff Corporation
S. Samarasekera, Sarnoff Corporation
H. Sawhney, Sarnoff Corporation
pp. 290
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pp. 292
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