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Applications of Computer Vision, IEEE Workshop on (1998)
Princeton, New Jersey
Oct. 19, 1998 to Oct. 21, 1998
ISBN: 0-8186-8606-5
TABLE OF CONTENTS
Preface (PDF)
pp. x
Committees (PDF)
pp. xi
Session 1A: Tracking
Frank Dellaert , Carnegie Mellon University
Sebastian Thrun , Carnegie Mellon University
Chuck Thorpe , Carnegie Mellon University
pp. 2
Alan J. Lipton , Carnegie Mellon University
Hironobu Fujiyoshi , Carnegie Mellon University
Raju S. Patil , Carnegie Mellon University
pp. 8
Hironobu Fujiyoshi , Carnegie Mellon University
Alan J. Lipton , Carnegie Mellon University
pp. 15
Moshe Ben-Ezra , The Hebrew University of Jerusalem
Shmuel Peleg , The Hebrew University of Jerusalem
Michael Werman , The Hebrew University of Jerusalem
pp. 22
Session 1B: Actions and Activities
John Krumm , Sandia National Laboratories
Greg Kirk , Sandia National Laboratories
pp. 30
Xiaoguang Wang , University of Massachusetts
Allen R Hanson , University of Massachusetts
pp. 36
Douglas Ayers , University of Central Florida
Mubarak Shah , University of Central Florida
pp. 42
Session 2A: Mosaicing I
Fady Badra , McGill University
Ala Qumsieh , McGill University
Gregory Dudek , McGill University
pp. 50
H. S. Sawhney , Sarnoff Corporation
R. Kumar , Sarnoff Corporation
G. Gendel , Sarnoff Corporation
J. Bergen , Sarnoff Corporation
D. Dixon , Sarnoff Corporation
V. Paragano , Sarnoff Corporation
pp. 56
Toshiyasu Nakao , NEC Corporation
Atsushi Kashitani , NEC Corporation
Akio Kaneyoshi , NEC Corporation
pp. 63
Yalin Xiong , Jet Propulsion Laboratory
Ken Turkowski , Apple Computer
pp. 69
Session 3A: Indexing
Dorin Comaniciu , Rutgers University
Peter Meer , Rutgers University
David Foran , UMDNJ-RWJ
Attila Medl , Rutgers University
pp. 76
S. Ravela , University of Massachusetts
R. Manmatha , University of Massachusetts
pp. 82
Madirakshi Das , University of Massachusetts
R. Manmatha , University of Massachusetts
Edward M. Riseman , University of Massachusetts
pp. 94
Session 3B: Medical and Document Imaging
Yusuf Sinan Akgul , University of Delaware
Chandra Kambhamettu , University of Delaware
Maureen Stone , The University of Maryland Medical School
pp. 109
Olivier G?rard , Laboratoires d?Electronique Philips S.A.S.
Sh?rif Makram-Ebeid , Laboratoires d?Electronique Philips S.A.S.
pp. 115
Rahul Singh , University of Minnesota, Minneapolis
Michael C. Wade , University of Minnesota, Minneapolis
Nikolaos P. Papanikolopoulos , University of Minnesota, Minneapolis
pp. 121
Session 4A: Industrial Inspection
C. Awanzino , Universit? Blaise Pascal; CEA-LETI
L. Letellier , CEA-LETI
J.M. Lavest , Universit? Blaise Pascal
M. Dhome , Universit? Blaise Pascal
C. Faye , ENSEA-ETIS
pp. 128
Suchendra M Bhandarkar , The University of Georgia
Timothy D Faust , The University of Georgia
Mengjin Tang , The University of Georgia
pp. 134
G Cong , Lawrence Berkeley National Laboratory
B Parvin , Lawrence Berkeley National Laboratory
pp. 140
Yuji Takagi , Hitachi Ltd.
Gerard Medioni , University of Southern California
pp. 146
Session 4B: Mosaicing II
Ruzena Bajcsy , University of Pennsylvania
Reyes Enciso , University of Pennsylvania
Gerda Kamberova , University of Pennsylvania
Lucien Nocera , University of Pennsylvania
Radim S?ra , Czech Technical University
pp. 160
Stephen Pollard , Hewlett-Packard Laboratories
Maurizio Pilu , Hewlett-Packard Laboratories
Sean Hayes , Hewlett-Packard Laboratories
Adele Lorusso , Hewlett-Packard Laboratories
pp. 168
Amnon Shashua , Hebrew University of Jerusalem
pp. 174
Session 5A: Terrain Recovery and Manipulation
Xiaoguang Wang , University of Massachusetts, Amherst
Allen R Hanson , University of Massachusetts, Amherst
Edward M Riseman , University of Massachusetts, Amherst
Howard Schultz , University of Massachusetts, Amherst
pp. 182
James J Little , University of British Columbia
Ping Shi , University of British Columbia
pp. 188
Marcus A Maloof , Georgetown University
Pat Langley , Institute for the Study of Learning and Expertise
Thomas O Binford , Stanford University
Ramakant Nevatia , University of Southern California
pp. 194
Session 5B: Face Analysis and Pose Estimation
Takahiro Otsuka , ATR Media Integration & Communications Research Laboratories
Jun Ohya , ATR Media Integration & Communications Research Laboratories
pp. 220
Vinayadatt V. Kohir , Indian Institute of Technology
U. B. Desai , Indian Institute of Technology
pp. 226
Demo 1: Demo Session I
Heung-Yeung Shum , Microsoft Research
Richard Szeliski , Microsoft Research
Simon Baker , Columbia University
Mei Han , Carnegie Mellon University
P. Anandan , Microsoft Research
pp. 234
Shree K. Nayar , Columbia University
Joshua Gluckman , Columbia University
Rahul Swaminathan , Columbia University
Simon Lok , Columbia University
Terry Boult , Columbia University
pp. 236
Yoav Rosenberg , The Hebrew University of Jerusalem
Michael Werman , The Hebrew University of Jerusalem
pp. 238
Thomas O?Donnell , Siemens Corporate Research
Gareth Funka-Lea , Siemens Corporate Research
pp. 240
Terry Boult , EECS Department Lehigh University
Chen Qian , EECS Department Lehigh University
Weihong Yin , EECS Department Lehigh University
Ali Erkin , EECS Department Lehigh University
Peter Lewis , EECS Department Lehigh University
Chris Power , EECS Department Lehigh University
Ross Micheals , EECS Department Lehigh University
pp. 242
Edgar Gardu? , University of Pennsylvania
Gabor T. Herman , University of Pennsylvania
pp. 244
Ali Bani-Hashemi , Siemens Corporate Research, Princeton
Nassir Navab , Siemens Corporate Research, Princeton
Mariappan Nadar , Siemens Corporate Research, Princeton
Bernhard Geiger , Siemens Corporate Research, Princeton
Rama Ramaraj , Siemens Corporate Research, Princeton
Karl Wiesent , Siemens AG
Thomas Brunner , Siemens AG
pp. 246
Demo 2: Demo Session II
Justus H. Piater , University of Massachusetts
Adriana Mincheva , University of Massachusetts
pp. 252
Vera Bakic , Michigan State University
George Stockman , Michigan State University
pp. 256
Toshio Moriya , Hitachi, Ltd.
Fumiko Shiojiri , Hitachi, Ltd.
Haruo Takeda , Hitachi, Ltd.
pp. 260
Huaibin Zhao , The University of Texas at Austin
Shishir Shah , The University of Texas at Austin
Jae Hun Choi , The University of Texas at Austin
Dinesh Nair , The University of Texas at Austin
J. K. Aggarwal , The University of Texas at Austin
pp. 262
Demo 3: Demo Session III
Dorin Comaniciu , Rutgers University
Peter Meer , Rutgers University
David Foran , UMDNJ-RWJ
Attila Medl , Rutgers University
pp. 268
Shih-Fu Chang , Columbia University
William Chen , Columbia University
Hari Sundaram , Columbia University
pp. 270
Madirakshi Das , University of Massachusetts
Shih-Ping Liou , Siemens Corporate Research
pp. 274
Pascal Bertolino , INRIA Rh?nes-Alpes, IMAG
Roger Mohr , INRIA Rh?nes-Alpes, IMAG
Cordelia Schmid , INRIA Rh?nes-Alpes, IMAG
Patrick Bouthemy , IRISA/INRIA
Marc Gelgon , IRISA/INRIA
Fabien Spindler , IRISA/INRIA
Serge Benayoun , Alcatel Alsthom Recherche
Helene Bernard , Alcatel Alsthom Recherche
pp. 276
Nassir Navab , Siemens Corporate Research, Princeton
Nick Craft , Siemens Corporate Research, Princeton
Sven Bauer , Siemens Corporate Research, Princeton
Ali Bani-Hashemi , Siemens Corporate Research, Princeton
pp. 278
Demo 4: Demo Session IV
Jayan Eledath , Sarnoff Corporation
Luke McDowell , Sarnoff Corporation
Michael Hansen , Sarnoff Corporation
Lambert Wixson , Sarnoff Corporation
Art Pope , Sarnoff Corporation
Gary Gendel , Sarnoff Corporation
pp. 284
Assaf Zomet , The Hebrew University of Jerusalem
Shmuel Peleg , The Hebrew University of Jerusalem
pp. 286
R. Mandelbaum , Sarnoff Corporation
L. McDowell , Sarnoff Corporation
L. Bogoni , Sarnoff Corporation
B. Reich , Sarnoff Corporation
M. Hansen , Sarnoff Corporation
pp. 288
J. Asmuth , Sarnoff Corporation
D. Dixon , Sarnoff Corporation
K. Hanna , Sarnoff Corporation
S.C. Hsu , Sarnoff Corporation
R. Kumar , Sarnoff Corporation
V. Paragano , Sarnoff Corporation
A. Pope , Sarnoff Corporation
S. Samarasekera , Sarnoff Corporation
H. Sawhney , Sarnoff Corporation
pp. 290
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pp. 292
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