ISBN: 0-8186-7620-5

M.-P.D. Jolly, Siemens Corp. Res. Inc., Princeton, NJ, USA

A. Gupta, Siemens Corp. Res. Inc., Princeton, NJ, USA

Benoit Huet, University of York

Edwin R. Hancock, University of York

Ralf Toenjes, Universitaet Hannover

D. Gibbins, Centre for Sensor Signal & Inf. Process., Signal Process. Res. Inst., Adelaide, SA, Australia

G.N. Newsam, Centre for Sensor Signal & Inf. Process., Signal Process. Res. Inst., Adelaide, SA, Australia

M.J. Brooks, Centre for Sensor Signal & Inf. Process., Signal Process. Res. Inst., Adelaide, SA, Australia

Kashi Rao, Texas Instruments

Sarma (Gopal) Pingali, Bell Laboratories Lucent Technologies

Jakub Segen, Bell Laboratories Lucent Technologies

A. Bobick, Media Lab., MIT, Cambridge, MA, USA

J. Davis, Media Lab., MIT, Cambridge, MA, USA

W. Puech, Inst. Albert Bonniot, TIMC-IMAG Lab., La Tronche, France

J. Chassery, Inst. Albert Bonniot, TIMC-IMAG Lab., La Tronche, France

A.G. Bors, Inst. Albert Bonniot, TIMC-IMAG Lab., La Tronche, France

I. Pitas, Inst. Albert Bonniot, TIMC-IMAG Lab., La Tronche, France

Sevket Gumustekin, University of Pittsburgh

Richard W. Hall, University of Pittsburgh

Ming-Chao Chiang, Columbia University

Terrance E. Boult, Lehigh University

A. Branca, Istituto di Elaborazione Segnali ed Immagini, CNR, Bari, Italy

E. Stella, Istituto di Elaborazione Segnali ed Immagini, CNR, Bari, Italy

A. Distante, Istituto di Elaborazione Segnali ed Immagini, CNR, Bari, Italy

Simon Moss, University of York.

Edwin R. Hancock, University of York.

Mauricio Marengoni, University of Massachusetts

Allen Hanson, University of Massachusetts

Ramesh Sitaraman, University of Massachusetts

Bruce A. Draper, Colorado State University

X.Y. Jiang, Univ. of Bern

H. Bunke, Univ. of Bern

U. Meier, GfAI, Herrenschwanden

Bilge Gunsel, University of Rochester

A. Mufit Ferman, University of Rochester

A. Murat Tekalp, University of Rochester

G. Pass, Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA

R. Zabih, Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA

D.A. Forsyth, Div. of Comput. Sci., California Univ., Berkeley, CA, USA

M.M. Fleck, Div. of Comput. Sci., California Univ., Berkeley, CA, USA

Tae-Hyeon Kim, Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea

Tai-Hoon Cho, Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea

Young-Shik Moon, Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea

Sung-Han Park, Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea

Yukio Matsuyama

Toshifumi Honda

Hisae Yamamura

Hideaki Sasazawa

Mineo Nomoto

Takanori Ninomiya

Ltd. Hitachi

Anton Schick, Siemens AG

Ludwig Listl, Siemens AG

Paul Koelensperger, Siemens AG

Dieter Spriegel, Siemens AG

Peter Mengel, Siemens AG

Richard Schneider, Siemens AG

Ken Martin, General Electric Corporate R&D

Rich Hammond, General Electric Corporate R&D

Charles V. Stewart, Rensselaer Polytechnic Institute

Yoshinori Kuno, Osaka University

Osamu Takae, Osaka University

Takuya Takahashi, Osaka University

Yoshiaki Shirai, Osaka University

Eric Huber, NASA Johnson Space Center

Jie Yang, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA

A. Waibel, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA

Z. Lei, Brown University

M. M. Blane, Brown University

D. B. Cooper, Brown University

Fabio Cozman, Carnegie Mellon University

Eric Krotkov, Carnegie Mellon University

Zhigang Zhu, Tsinghua University

Bo Yang, Tsinghua University

Guangyou Xu, Tsinghua University

Dingji Shi, Tsinghua University

Tarak L. Gandhi, The Pennsylvania State University

Sadashiva Devadiga, The Pennsylvania State University

Rangachar Kasturi, The Pennsylvania State University

Octavia I. Camps, The Pennsylvania State University

P.P. Smyth, University of Manchester

C.J. Taylor, University of Manchester

J.E. Adams, University of Manchester

William A. Hoff, Colorado School of Mines

Richard D. Komistek, Colorado School of Mines

Douglas A. Dennis, Colorado School of Mines

Scott Walker, Colorado School of Mines

Eric Northcut, Colorado School of Mines

Keith Spargo, Colorado School of Mines

Yuan-Fang Wang, University of California, Santa Barbara

Darrin R. Uecker, Computer Motion Inc.

Yulun Wang, Computer Motion Inc.

Dinesh Nair, The University of Texas at Austin

J. K. Aggarwal, The University of Texas at Austin

Lin Hong

Xiangdong Liu, Hughes Network Systems

Roger Ehrich, Virginia Polytechnic Institute and State University

Daniel E. Stevenson, University of Iowa

Margaret M. Fleck, University of Iowa

R. Slater, Comput. Vision Lab., California Univ., Irvine, CA, USA

G. Healey, Comput. Vision Lab., California Univ., Irvine, CA, USA

P. Sheu, Comput. Vision Lab., California Univ., Irvine, CA, USA

C.W. Cotman, Comput. Vision Lab., California Univ., Irvine, CA, USA

J. Su, Comput. Vision Lab., California Univ., Irvine, CA, USA

A. Wasserman, Comput. Vision Lab., California Univ., Irvine, CA, USA

R. Shankle, Comput. Vision Lab., California Univ., Irvine, CA, USA

Hamed Sari-Sarraf, Oak Ridge National Laboratory

Shaun S. Gleason, Oak Ridge National Laboratory

Kathleen T. Hudson, The University of Tennessee Medical Center

Karl F. Hubner, The University of Tennessee Medical Center

Shinji Yamamoto, Toyohashi University of Technology

Hao Jiang, Ministry of Posts and Telecommunications

Mitsuomi Matsumoto, Tokyo Metropolitan College of Allied Medical Science

Yukio Tateno, Tokyo Metropolitan College of Allied Medical Science

Takeshi Iinuma, Saitama Institute of Technology

Toru Matsumoto, National Institute of Radiological Science

Ruud M. Bolle, IBM Thomas J. Watson Research Center

Jonathan H. Connell, IBM Thomas J. Watson Research Center

Norman Haas, IBM Thomas J. Watson Research Center

Rakesh Mohan, IBM Thomas J. Watson Research Center

Gabriel Taubin, IBM Thomas J. Watson Research Center

A. Lynn Abbott, Virginia Tech

Yuedong Zhao, Virginia Tech

Suchendra M. Bhandarkar, The University of Georgia

Timothy D. Faust, The University of Georgia

Mengjin Tang, The University of Georgia

S. Negahdaripour, University of Miami

L. Jin, University of Miami

X. Xu, University of Miami

C. Tsukamoto, University of Hawaii

J. Yuh, University of Hawaii

F. Lebourgeois, Eqiupe de Reconnaissance de Formes et Vision, Inst. Nat. des Sci. Appliquees, Toulouse, France

J.L. Henry, Eqiupe de Reconnaissance de Formes et Vision, Inst. Nat. des Sci. Appliquees, Toulouse, France

Jisheng Liang, University of Washington

Jaekyu Ha, University of Washington

Robert M. Haralick, University of Washington

Ihsin T. Phillips, Seattle University

Yoshinobu Hotta, Fujitsu Ltd.

Satoshi Naoi, Fujitsu Ltd.

Misako Suwa, Fujitsu Ltd.