ISBN: 0-7695-2271-8

Zhen Jia, Nanyang Technological University, Singapore

Arjuna Balasuriya, Nanyang Technological University, Singapore

Yue Zhou, University of Illinois at Urbana- Champaign

Wei Xu, NEC Laboratories America, Inc.

Hai Tao, University of California, Santa Cruz

Yihong Gong, NEC Laboratories America, Inc.

John Wright, University of Illinois at Urbana-Champaign

Robert Pless, Washington University in St. Louis

Fatih Porikli, Mitsubishi Electric Research Laboratories

Ying-Li Tian, IBM T.J. Watson Research Center, Yorktown Heights, NY

Arun Hampapur, IBM T.J. Watson Research Center, Yorktown Heights, NY

Kideog Jeong, University of Kentucky, Lexington KY

Christopher Jaynes, University of Kentucky, Lexington KY

Maolin Chen, CASIA-SAIT HCI Joint Lab., Institute of Automation, CAS, Beijing, China

Gengyu Ma, CASIA-SAIT HCI Joint Lab., Institute of Automation, CAS, Beijing, China

Seokcheol Kee, Samsung Advanced Institute of Technology, Seoul, South Korea

David Biliotti, University of Siena, Italy

Gianluca Antonini, Swiss Federal Institute of Technology, Lausanne, CH

Jean Philippe Thiran, Swiss Federal Institute of Technology, Lausanne, CH

Joshua Migdal, Massachusetts Institute of Technology, Cambridge, Massachusetts

W. Eric L. Grimson, Massachusetts Institute of Technology, Cambridge, Massachusetts

Markus Enzweiler, York University, Toronto, ON, Canada; Bonn-Rhein-Sieg Univ. of Applied Sciences, Germany

Richard P. Wildes, York University, Toronto, ON, Canada

Rainer Herpers, York University, Toronto, ON, Canada; Bonn-Rhein-Sieg Univ. of Applied Sciences, Germany

Yuan XiaoTong, Shanghai Jiao Tong University, China

Yang ShuTang, Shanghai Jiao Tong University, China

Zhu HongWen, Shanghai Jiao Tong University, China

Daniel Roth, ETH Z?rich, Switzerland

Petr Doubek, ETH Z?rich, Switzerland

Luc Van Gool, ETH Z?rich, Switzerland

Alessandro Bevilacqua, University of Bologna, Italy

Luigi Di Stefano, University of Bologna, Italy

Stefano Vaccari, University of Bologna, Italy

Pradit Mittrapiyanuruk, Purdue Univerisy, USA

Guilherme N. DeSouza, The University of Western Australia

Avinash C. Kak, Purdue Univerisy, USA

Chris Stauffer, Massachusetts Institute of Technology, Cambridge, MA

A. Jacquot, INRIA Rh?ne Alpes, France

P. Sturm, INRIA Rh?ne Alpes, France

O. Ruch, Thales Optronique, France

Jinman Kang, University of Southern California, Los Angeles

Isaac Cohen, University of Southern California, Los Angeles

G?rard Medioni, University of Southern California, Los Angeles

Leonid Taycher, Massachusetts Institute of Technology, Cambridge, MA

John W. Fisher III, Massachusetts Institute of Technology, Cambridge, MA

Trevor Darrell, Massachusetts Institute of Technology, Cambridge, MA

Xiaomu Song, Oklahoma State University, Stillwater, OK

Guoliang Fan, Oklahoma State University, Stillwater, OK

Anthony Whitehead, Carleton University, Ottawa, Ontario, Canada

Robert Laganiere, University of Ottawa, Ontario, Canada

Prosenjit Bose, Carleton University, Ottawa, Ontario, Canada

Amit K Agrawal, University of Maryland, College Park, MD

Rama Chellappa, University of Maryland, College Park, MD

Rui Li, Boston University, MA

Stan Sclaroff, Boston University, MA

Jian Li, University of Maryland, College Park, MD

Rama Chellappa, University of Maryland, College Park, MD

Ameesh Makadia, University of Pennsylvania, Philadelphia, PA

Dinkar Gupta, University of Pennsylvania, Philadelphia, PA

Kostas Daniilidis, University of Pennsylvania, Philadelphia, PA

Mun Wai Lee, University of Southern California, Los Angeles

Ramakant Nevatia, University of Southern California, Los Angeles

Ashwin Thangali, Boston University, MA

Stan Sclaroff, Boston University, MA

Eun-Jung Holden, The University of Western Australia

Gareth Lee, The University of Western Australia

Robyn Owens, The University of Western Australia

Tai-Peng Tian, Boston University, MA

Stan Sclaroff, Boston University, MA

Richard Souvenir, Washington University in St. Louis

Robert Pless, Washington University in St. Louis

Yosi Keller, Yale University, New Haven, CT

Amir Averbuch, Tel-Aviv University, Israel

Moshe Israeli, Technion Institute of Technology, Israel

Motilal Agrawal, SRI International, Menlo Park, CA

Kurt Konolige, SRI International, Menlo Park, CA

Luca Iocchi, SRI International, Menlo Park, CA

Jiangjian Xiao, University of Central Florida, Orlando

Yunjun Zhang, University of Central Florida, Orlando

Mubarak Shah, University of Central Florida, Orlando

David D. Diel, Massachusetts Institute of Technology

Paul DeBitetto, Draper Laboratory

Seth Teller, Massachusetts Institute of Technology

Alessandro Bevilacqua, University of Bologna, Italy

Luigi Di Stefano, University of Bologna, Italy

Alessandro Lanza, University of Bologna, Italy

A. Vadivel, IIT Kharagpur, India

M. Mohan, IIT Kharagpur, India

Shamik Sural, IIT Kharagpur, India

A. K. Majumdar, IIT Kharagpur, India

Zongqing Lu, Xidian University, China

Weixin Xie, Xidian University, China

Jihong Pei, Shenzhen University, China

JianJun Huang, Shenzhen University, China

Tobias Jaeggli, Swiss Federal Institute of Technology (ETH), Switzerland; Katholieke Universiteit Leuven, Belgium

Geert Caenen, Katholieke Universiteit Leuven, Belgium

Rik Fransens, Katholieke Universiteit Leuven, Belgium

Luc Van Gool, Swiss Federal Institute of Technology (ETH), Switzerland; Katholieke Universiteit Leuven, Belgium

Jonathan Alon, Boston University, MA

Vassilis Athitsos, Boston University, MA

Quan Yuan, Boston University, MA

Stan Sclaroff, Boston University, MA

Crist?bal Curio, Ruhr University Bochum, Germany

Martin A. Giese, University Clinic T?bingen, Germany

Rita Cucchiara, D.I.I. - University of Modena and Reggio Emilia - Italy

Roberto Vezzani, D.I.I. - University of Modena and Reggio Emilia - Italy