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2013 IEEE 31st VLSI Test Symposium (VTS) (2010)
Santa Cruz, CA USA
Apr. 19, 2010 to Apr. 22, 2010
ISBN: 978-1-4244-6649-8
TABLE OF CONTENTS
Kwang-Ting Cheng , Univ. of California, Santa Barbara, CA, USA
Tsung-Ching Huang , Univ. of California, Santa Barbara, CA, USA
pp. 82
Wing Chiu Tam , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
R D Blanton , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
Wojciech P Maly , ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 200-205
Hsiu-Ming Chang , Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
Kuan-Yu Lin , Ind. Technol. Res. Inst., Hsinchu, Taiwan
Kwang-Ting Cheng , Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
pp. 295-300
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