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2013 IEEE 31st VLSI Test Symposium (VTS) (2005)
Palm Springs, California
May 1, 2005 to May 5, 2005
ISBN: 0-7695-2314-5
TABLE OF CONTENTS
5A: Panel Session - Robust Design from Unreliable Components: Why? When? How?
6C: IP Session - IP in Wireless Testing
4C: IP Session - High Speed I/O Test
4B: IP Session - Adaptive Test
7C: IP Session: Embedded Memory Test & Repair Drives Higher Yield in Nanometer Technologies
8C: IP Session - Test Resource Partitioning in Action
9A: Embedded Tutorial: Test with Variations - How Much Can Be Solved in the Design Process?
9C: Panel Session - Are DFT and Manufacturing Test Good Boosts for DFM?
10C: IP Session - SoC Test Practices in Japan
3C: IP Session - Soft Errors
13A: Panel Session - IEEE 1500: Embedded Core-Based Test Standard: Why Should I Adopt It?
13B: Hot Topic Session - Test and DFM: Managing Yield at 90nm and below
13C: Panel Session - Analog TRP: Is Convergence on Horizon?
2C: IP Session - DFT for SoCs in Wireless Applications
11C: IP Session - Delay Fault Testing: Industrial Case Studies
12C: IP Session - On the Way from DFT to DFM...Looking for Systematic Marginalities
Introduction
Foreword (PDF)
pp. xi
pp. xii-xiii
Plenary Session
pp. null
pp. null
pp. null
1A: Memory BIST
Yan-Ting Lai , National Tsing Hua University
Yuan-Yuan Shih , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
Jen-Chieh Yeh , National Tsing Hua University
Yen-Tai Lin , eMemory Technology Inc.
pp. 15-20
1B: Delay Testing I
Yi-Shing Chang , Intel Corporation
Sreejit Chakravarty , Intel Corporation
Hiep Hoang , Intel Corporation
Nick Thorpe , Intel Corporation
Khen Wee , Intel Corporation
pp. 29-34
Li-C. Wang , University of California at Santa Barbara
Praveen Parvathala , Intel Corporation
T. M. Mak , Intel Corporation
pp. 35-41
C. P. Ravikumar , Texas Instruments India
Mohammad Tehranipoor , Texas Instruments India
Nisar Ahmed , Texas Instruments India
pp. 42-47
2A: Memory Testing I
Jin-Fu Li , National Central University
Chou-Kun Lin , National Central University
pp. 60-65
Yuejian Wu , Nortel Networks
Josh Yang , University of British Columbia
Andr? Ivanov , University of British Columbia
Yervant Zorian , Virage Logic Corporation
pp. 66-71
2B: High-Speed Testing and Clock Skew Compensation
Ken Mockler , Freescale Semiconductor, Inc.
Dieu Van Dinh , Freescale Semiconductor, Inc.
Raoul Belleau , Teradyne, Inc.
Tim Donovan , Teradyne, Inc.
Reid Hewlitt , Teradyne, Inc.
pp. 75-84
Atsushi Nakayama , Toshiba Corporation Semiconductor Company
Naoko Itoga , Toshiba Corporation Semiconductor Company
Hitoshi Iwai , Toshiba Corporation Semiconductor Company
pp. 85-89
Martin Omaña , University of Bologna
Cecilia Metra , University of Bologna
pp. 90-95
3A: Test Data Compression and Self-Test
Hans-Joachim Wunderlich , Universit?t Stuttgart
Valentin Gherman , Universit?t Stuttgart
Michael Garbers , Philips Semiconductors GmbH
J? Schl?ffel , Philips Semiconductors GmbH
pp. 101-106
Li-C. Wang , University of California at Santa Barbara
Kwang-Ting Cheng , University of California at Santa Barbara
Kai Yang , University of California at Santa Barbara
Wei-Ting Liu , Industrial Technology Research Institute
Charles H.-P. Wen , University of California at Santa Barbara
pp. 107-113
Janusz Rajski , Mentor Graphics Corporation
pp. 114-119
3B: Analog Testing I
Cameron Dryden , Metrologic Instruments
Dongwoo Hong , University of California at Santa Barbara
pp. 123-130
Keith A. Jenkins , IBM T.J. Watson Research Center
Anup P. Jose , Columbia University
pp. 131-136
Soumendu Bhattacharya , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 137-142
4A: Defect-Oriented Testing
Scott Davidson , Sun Microsystems, Inc.
pp. 147-152
Li-C. Wang , University of Califoria at Santa Barbara
Benjamin N Lee , University of Califoria at Santa Barbara
pp. 153-160
Intaik Park , Stanford University
Edward J. McCluskey , Stanford University
pp. 161-166
5B: Emerging Technologies - Reliable and Fault-Tolerant Wireless Sensor Networks
Abstract (PDF)
pp. 173
6A: Memory Testing II
Ananta Majhi , Philips Research
Guido Gronthoud , Philips Research
Mohamed Azimane , Philips Research
pp. 177-182
Patrick Girard , Universit? de Montpellier II / CNRS
Luigi Dilillo , Universit? de Montpellier II / CNRS
Arnaud Virazel , Universit? de Montpellier II / CNRS
Magali Bastian Hage-Hassan , Infineon Technologies France
pp. 183-188
Sue A. Ung , University of Alberta
Ashwin S. Rao , University of Alberta
Daniel A. Leder , University of Alberta
Craig S. Joly , University of Alberta
John C. Koob , University of Alberta
Tyler Brandon , University of Alberta
Michael Hume , University of Alberta
Bruce F. Cockburn , University of Alberta
Duncan G. Elliott , University of Alberta
pp. 189-197
6B: FPGA & MEMS Testing
Chun-Chieh Wang , National Tsing Hua University
Jing-Jia Liou , National Tsing Hua University
Yen-Lin Peng , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 201-206
Ghazanfar-Hossein Asadi , Northeastern University
Mehdi Baradaran Tahoori , Northeastern University
pp. 207-212
N. Dumas , Universite Montpellier II/CNRS
F. Aza? , Universite Montpellier II/CNRS
L. Latorre , Universite Montpellier II/CNRS
P. Nouet , Universite Montpellier II/CNRS
pp. 213-218
7A: Delay Testing II
Olivier Barondeau , Infineon Technologies AG
Frank Poehl , Infineon Technologies AG
Xijiang Lin , Mentor Graphics Corporation
Matthias Beck , Infineon Technologies AG
pp. 223-228
Feng Lu , University of California at Santa Barbara
Kwang-Ting Cheng , University of California at Santa Barbara
pp. 229-234
Xiang Lu , Texas A&M University
Wangqi Qiu , Texas A&M University
Jing Wang , Texas A&M University
Steve Fancler , Texas A&M University
Weiping Shi , Texas A&M University
D. M. H. Walker , Texas A&M University
pp. 235-240
7B: RF Testing
S. Sermet Akbay , Georgia Institute of Technology
pp. 243-248
Radhika Venkatasubramanian , Texas A&M University
Rangakrishnan Srinivasan , Texas A&M University
Alberto Valdes-Garcia , Texas A&M University
Edgar S?nchez-Sinencio , Texas A&M University
pp. 249-254
Achintya Halder , Georgia Institute of Technology
pp. 255-260
8A: Low-Power Testing
Yoshiyuki Yamashita , Kyushu Institute of Technology
Seiji Kajihara , Kyushu Institute of Technology
Laung-Terng Wang , SynTest Technologies, Inc.
Xiaoqing Wen , Kyushu Institute of Technology
Kozo Kinoshita , Osaka Gakuin University
pp. 265-270
Kirti Joshi , University of Texas at El Paso
pp. 271-276
Min-Hao Chiu , National Taiwan University
pp. 277-282
8B: Nanometer and Circuit-Level Effects
Yuvraj S. Dhillon , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
Adit D. Singh , Auburn University
pp. 298-303
10A: Reliability
Shalini Ghosh , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 315-320
10B: Testing of Bridging Faults and Test Scheduling
YiShing Chang , Intel Corporation
Hiep Hoang , Intel Corporation
Sridhar Jayaraman , Intel Corporation
Sreejit Chakravarty , Intel Corporation
Cheryl Prunty , Intel Corporation
Eric W Savage , Intel Corporation
Rehan Sheikh , Intel Corporation
Eric N. Tran , Intel Corporation
Khen Wee , Intel Corporation
pp. 337-342
Sandip Kundu , Intel Corp.
Jean-Marc Galliere , LIRMM - UMII
Ilia Polian , Albert-Ludwigs-University
Michel Renovell , LIRMM - UMII
Bernd Becker , Albert-Ludwigs-University
pp. 343-348
Chunsheng Liu , University of Nebraska-Lincoln
Vikram Iyengar , IBM Microelectronics
Jiangfan Shi , University of Nebraska-Lincoln
Erika Cota , Universidade Federal do Rio Grande do Sul
pp. 349-354
11A: Diagnosis
John A. Waicukauski , Synopsys Inc.
Sanjay Patel , Synopsys Inc.
Cy Hay , Synopsys Inc.
Peter Wohl , Synopsys Inc.
Ben Mathew , Synopsys Inc.
pp. 359-365
Rao Desineni , Carnegie Mellon University
R. D. (Shawn) Blanton , Carnegie Mellon University
pp. 366-373
11B: Analog Testing II
Antonio Andrade Jr. , University Federal do Rio Grande do Sul
Gustavo Pereira , University Federal do Rio Grande do Sul
Marcelo Lubaszewski , Universidad Federal do Rio Grande do Sul and Universidad de Sevilla
Florence Aza? , Universit? de Montpellier II
Michel Renovell , Universit? de Montpellier II
pp. 389-394
12A: Design-for-Testability
Ahmad Al-Yamani , LSI Logic Corporation
Erik Chmelar , LSI Logic Corporation
Mikhail Grinchuck , LSI Logic Corporation
pp. 405-411
Yu-Ting Lin , University of Texas at Austin
pp. 412-417
12B: I_DDQ Testing and Power Supply Noise Analysis
Brady Benware , LSI Logic
Robert Madge , LSI Logic
Thaddeus Shannon , Portland State University
Ritesh Turakhia , Portland State University
pp. 427-432
Dhruva Acharyya , University of Maryland at Baltimore County
pp. 433-438
Mehrdad Nourani , University of Texas at Dallas
Nisar Ahmed , Texas Instruments
pp. 439-444
Author Index
Author Index (PDF)
pp. 453-455
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