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2013 IEEE 31st VLSI Test Symposium (VTS) (2004)
Napa Valley, California
Apr. 25, 2004 to Apr. 29, 2004
ISBN: 0-7695-2134-7
TABLE OF CONTENTS
Foreword (PDF)
pp. xii
pp. xvi
Reviewers (PDF)
pp. xvii
pp. xix
Plenary Session
pp. null
pp. null
1A: Paper Session - Defect-Oriented Testing
David Dorsey , Texas A&M University
Amy Wang , Texas A&M University
Jennifer Dworak , Texas A&M University
pp. 9
E. J. McCluskey , Stanford Center for Reliable Computing
Ahmad Al-Yamani , Stanford Center for Reliable Computing
James C.-M Li , Stanford Center for Reliable Computing
Chao-Wen Tseng , Stanford Center for Reliable Computing
Erik Volkerink , Stanford Center for Reliable Computing
Francois-Fabien Ferhani , Stanford Center for Reliable Computing
Edward Li , Stanford Center for Reliable Computing
Subhasish Mitra , Stanford Center for Reliable Computing
pp. 16
Srihari Sivaraj , Intel Corporation, Hillsboro, OR
Enamul Amyeen , Intel Corporation, Hillsboro, OR
Srikanth Venkataraman , Intel Corporation, Hillsboro, OR
Ajay Ojha , Intel Corporation, Hillsboro, OR
Ruifeng Guo , Intel Corporation, Hillsboro, OR
pp. 23
1B: Paper Session - Delay Testing
Xiang Lu , Texas A&M University, College Station
Jing Wang , Texas A&M University, College Station
Wangqi Qiu , Texas A&M University, College Station
D. M. H. Walker , Texas A&M University, College Station
Weiping Shi , Texas A&M University, College Station
pp. 37
Erik Volkerink , Stanford University, CA
Edward J. McCluskey , Stanford University, CA
Stefan Eichenberger , Philips Semiconductors, Nijmegen, The Netherlands
pp. 43
1C: Innovative Practices Session - Silicon Debug and Diagnosis
pp. null
2A: Paper Session - Current Based Testing
Josep Rius V?zquez , Universitat Polit?cnica de Catalunya, Spain
Jos? Pineda de Gyvez , Philips Research Laboratories, The Netherlands
pp. 53
C. Thibeault , Ecole de technologie superieure, Montreal, Canada
pp. 59
Sagar Sabade , Texas A&M University, College Station
D. M. H. Walker , Texas A&M University, College Station
pp. 65
2B: Paper Session - Test Data Compression and Low-Speed ATE
Samitha Samaranayake , Massachusetts Institute of Technology, Cambridge, MA
Rohit Kapur , Synopsys Inc., Mountain View, CA
Emil Gizdarski , Synopsys Inc., Mountain View, CA
Fredric Neuveux , Synopsys Inc., Mountain View, CA
T. W. Williams , Synopsys Inc., Mountain View, CA
pp. 73
Michael Nelms , IBM Microelectronics Division, Essex Junction, VT
Kevin Gorman , IBM Microelectronics Division, Essex Junction, VT
Darren Anand , IBM Microelectronics Division, Essex Junction, VT
pp. 87
2C: Innovative Practices Session - Practical Experience with Test and Repair of Large Memory Systems
3A: Paper Session - Pattern Debug, Yield Analysis and FPGA Testing
Debashis Nayak , Intel Corporation, Hillsboro, OR
Paul Thadikaran , Intel Corporation, Hillsboro, OR
pp. 97
A. Fudoli , ST Microelectronics, Cornaredo, Italy
K. Giarda , ST Microelectronics, Cornaredo, Italy
E. Gizdarski , Synopsys Inc., Mountain View, CA
D. Appello , ST Microelectronics, Cornaredo, Italy
V. Tancorre , ST Microelectronics, Cornaredo, Italy
pp. 103
3B: Paper Session - Memory Testing I
Said Hamdioui , Delft University of Technology, The Netherlands
Zaid Al-Ars , Delft University of Technology, The Netherlands
pp. 117
Mohamed Azimane , Philips Research Laboratories, Eindhoven, The Netherlands
pp. 123
P. Girard , Universit? de Montpellier II / CNRS, France
S. Pravossoudovitch , Universit? de Montpellier II / CNRS, France
L. Dilillo , Universit? de Montpellier II / CNRS, France
S. Borri , Infineon Technologies France
pp. 129
3C: Innovative Practices Session - Test Compression
4A: Paper Session - MEMs Testing and FPGA Testing
Nilmoni Deb , Carnegie Mellon University, Pittsburgh, PA
R. D. (Shawn) Blanton , Carnegie Mellon University, Pittsburgh, PA
pp. 139
Xingguo Xiong , University of Cincinnati, OH
Wen-Ben Jone , University of Cincinnati, OH
pp. 148
Edward J. McCluskey , Stanford University, CA
Mehdi B. Tahoori , Northeastern University, Boston, MA
Philippe Faure , LIRMM, France
pp. 154
4B: Embedded Tutorial Session - Challenges in Embedded Memory Test and Diagnosis
null (PDF)
pp. null
4C: Innovative Practices Session - ITRS Key Challenge: High Speed I/Os
null (PDF)
pp. null
5A: Embedded Tutorial Session - Advances in Wafer Probe Test
null (PDF)
pp. null
5B: HotTopic Session - Testing of Nanocircuits with High Defect Densities
null (PDF)
pp. null
6A: Paper Session - Low-Voltage and Thermal Testing
Piet Engelke , Albert-Ludwigs-University, Germany
Ilia Polian , Albert-Ludwigs-University, Germany
Michel Renovell , LIRMM - UMII, France
Bharath Seshadri , Purdue University, W. Lafayette, IN
Bernd Becker , Albert-Ludwigs-University, Germany
pp. 171
A. Rubio , Universitat Polit?cnica de Catalunya, Barcelona, Spain
A. Salhi , Universit? Bordeaux I, Bordeaux, France
J. L. G?lvez , Universitat Polit?cnica de Catalunya, Barcelona, Spain
S. Dilhaire , Universit? Bordeaux I, Bordeaux, France
A. Syal , The University of British Columbia. Vancouver. Canada
J. Altet , Universitat Polit?cnica de Catalunya, Barcelona, Spain
pp. 179
W. Robert Daasch , Portland State University, Oregon
Robert Madge , LSI Logic, Gresham
Brady Benware , LSI Logic, Fort Collins
pp. 185
6B: Paper Session - Logic Built-In Self-Test
Grzegorz Mrugalski , Mentor Graphics Corporation, Wilsonville, OR
Nilanjan Mukherjee , Mentor Graphics Corporation, Wilsonville, OR
Janusz Rajski , Mentor Graphics Corporation, Wilsonville, OR
Jerzy Tyszer , Poznan University of Technology, Poland
pp. 193
Thomas Rinderknecht , Mentor Graphics Corp., OR
Liyang Lai , University of Illinois at Urbana-Champaign
Janak H. Patel , University of Illinois at Urbana-Champaign
pp. 199
L. Garc? , Universitat Polit?cnica de Catalunya, Spain
L. Balado , Universitat Polit?cnica de Catalunya, Spain
E. Lupon , Universitat Polit?cnica de Catalunya, Spain
J. Rius , Universitat Polit?cnica de Catalunya, Spain
R. Rodr?guez , Universitat Polit?cnica de Catalunya, Spain
J. Figueras , Universitat Polit?cnica de Catalunya, Spain
pp. 206
6C: Innovative Practices Session - Latest Results in WirelessTest
7A: Paper Session - Analog Testing I
Yi Tang , University of Washington, Seattle
Qi Wang , University of Washington, Seattle
pp. 223
Soumendu Bhattacharya , Georgia Institute of Technology, Atlanta
Ganesh Srinivasan , Georgia Institute of Technology, Atlanta
Sasikumar Cherubal , Texas Instruments, Dallas, TX
Achintya Halder , Georgia Institute of Technology, Atlanta
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta
pp. 229
7B: Paper Session - Memory Testing II
Josh Yang , University of British Columbia, Vancouver, Canada
James Cicalo , University of British Columbia, Vancouver, Canada
Andr? Ivanov , University of British Columbia, Vancouver, Canada
Yervant Zorian , Virage Logic Corporation
pp. 237
Sudhakar M. Reddy , University of Iowa, Iowa City
Don E. Ross , Mentor Graphics Corporation, Wilsonville, Oregon
Wu-Tung Cheng , Mentor Graphics Corporation, Wilsonville, Oregon
Xiaogang Du , University of Iowa, Iowa City
pp. 243
S. Shoukourian , Virage Logic, Fremont, CA
V. A. Vardanian , Virage Logic, Fremont, CA
Y. Zorian , Virage Logic, Fremont, CA
pp. 249
7C: Innovative Practices Session - SoC Test Practice in Japan
8A: Paper Session - Analog Testing II
Jose Silva-Martinez , Texas A&M University, College Station, TX
Alberto Valdes-Garcia , Texas A&M University, College Station, TX
pp. 261
Dongwoo Hong , University of California, Santa Barbara
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
Chee-Kian Ong , University of California, Santa Barbara
pp. 267
Selim Sermet Akbay , Georgia Institute of Technology, Atlanta
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta
pp. 273
8B: New Topic Session - Advances in 3D Packaging
null (PDF)
pp. null
8C: Innovative Practices Session - Challenges
9A: Embedded Tutorial Session - Reliability & Dependability
null (PDF)
pp. null
9B: Panel Session - Elevator Talks
null (PDF)
pp. null
9C: Panel Session - Process Variation - How Severe Is the Problem of Design & Test
null (PDF)
pp. null
10A: Paper Session - Defect Analysis and Fault Simulation
Mehdi Baradaran Tahoori , Northeastern University, Boston, MA
Mariam Momenzadeh , Northeastern University, Boston, MA
Jing Huang , Northeastern University, Boston, MA
Fabrizio Lombardi , Northeastern University, Boston, MA
pp. 291
Sounil Biswas , Carnegie Mellon University, Pittsburgh, PA
R. D. (Shawn) Blanton , Carnegie Mellon University, Pittsburgh, PA
pp. 297
Chintan Patel , University of Maryland, Baltimore County
Jim Plusquellic , University of Maryland, Baltimore County
pp. 304
10B: Paper Session - Issues in Reliability
Nadir Achouri , iRoC Technologies, Grenoble, France
Michael Nicolaidis , iRoC Technologies, Grenoble, France
pp. 313
Sobeeh Almukhaizim , Yale University, New Haven, CT
Yiorgos Makris , Yale University, New Haven, CT
pp. 319
Balkaran S. Gill , Case Western Reserve University, Cleveland, Ohio
Chris Papachristou , Case Western Reserve University, Cleveland, Ohio
Francis G. Wolff , Case Western Reserve University, Cleveland, Ohio
pp. 325
11A: Paper Session - Wireless and System Testing
Arvinderpal Wander , University of Michigan, Ann Arbor
Hans Eberle , Sun Microsystems Laboratories
pp. 335
Brian Moore , BigBangWidth, Inc.
Chris Backhouse , University of Alberta, Edmonton, Canada
Martin Margala , University of Rochester, New York
pp. 341
Pei-Si Wu , National Taiwan University, Taipei
Ren-Chieh Liu , National Taiwan University, Taipei
Jeng-Han Tsai , National Taiwan University, Taipei
Huei Wang , National Taiwan University, Taipei
Tian-Wei Huang , National Taiwan University, Taipei
pp. 347
11B: Paper Session - System-on-Chip Testing
Gang Zeng , Chiba University, Japan
pp. 355
Erik Larsson , Link?pings Universitet, Sweden
Julien Pouget , Montpellier 2 University, France
Zebo Peng , Link?pings Universitet, Sweden
pp. 361
Saffat Quasem , University of Southern California
Sandeep Gupta , University of Southern California
pp. 367
11C: Innovative Practices Session - The Impact of SER
null (PDF)
pp. null
12A: Paper Session - Analog Testing and Design Validation
Hong Joong Shin , The University of Texas at Austin
Ashwin Raghunathan , The University of Texas at Austin
Abhijit Chatterjee , Georgia Institute of Technology
pp. 377
A. Andrade Jr. , Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
T. Balen , Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
M. Lubaszewski , Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil; Universidad de Sevilla, Spain
M. Renovell , Universit? de Montpellier II, France
pp. 383
12B: Embedded Tutorial Session - Design for Yield
null (PDF)
pp. null
12C: Innovative Practices Session - Optimizing Manufacturing Process
13A: Embedded Tutorial Session - Design for Manufacturability
null (PDF)
pp. null
13B: Hot Topic Session - Software-based Embedded Test
null (PDF)
pp. null
13C: Panel Session - Defect-based Testing and Burn-in: A Test Solution for Scaled Technology?
null (PDF)
pp. null
Author Index (PDF)
pp. 406
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