Defects and Faults in Quantum Cellular Automata at Nano Scale

Mehdi Baradaran Tahoori; Fabrizio Lombardi; Mariam Momenzadeh; Jing Huang

doi:10.1109/VTEST.2004.1299255

V
VTS
2004
22nd IEEE VLSI Test Symposium
Abstract - Defects and Faults in Quantum Cellular Automata at Nano Scale

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22nd IEEE VLSI Test Symposium

Defects and Faults in Quantum Cellular Automata at Nano Scale

Napa Valley, California

April 25-April 29

ISBN: 0-7695-2134-7

	ASCII Text	x
	Mehdi Baradaran Tahoori, Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi, "Defects and Faults in Quantum Cellular Automata at Nano Scale," VLSI Test Symposium, IEEE, pp. 291, 22nd IEEE VLSI Test Symposium, 2004.

	BibTex	x
	@article{ 10.1109/VTEST.2004.1299255, author = {Mehdi Baradaran Tahoori and Mariam Momenzadeh and Jing Huang and Fabrizio Lombardi}, title = {Defects and Faults in Quantum Cellular Automata at Nano Scale}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2004}, issn = {1093-0167}, pages = {291}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299255}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Defects and Faults in Quantum Cellular Automata at Nano Scale SN - 1093-0167 SP EP A1 - Mehdi Baradaran Tahoori, A1 - Mariam Momenzadeh, A1 - Jing Huang, A1 - Fabrizio Lombardi, PY - 2004 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Mehdi Baradaran Tahoori, Northeastern University, Boston, MA

Mariam Momenzadeh, Northeastern University, Boston, MA

Jing Huang, Northeastern University, Boston, MA

Fabrizio Lombardi, Northeastern University, Boston, MA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299255

There has been considerable research on quantum dot cellular automata (QCA) as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is majority voter. In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Testing of these devices is investigated and compared with conventional CMOS-based designs. Unique testing features of designs based on this technology are presented and interesting properties have been identified.

Citation:

Mehdi Baradaran Tahoori, Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi, "Defects and Faults in Quantum Cellular Automata at Nano Scale," vts, pp.291, 22nd IEEE VLSI Test Symposium, 2004

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