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2013 IEEE 31st VLSI Test Symposium (VTS) (2003)
Napa Valley, California
Apr. 27, 2003 to May 1, 2003
ISBN: 0-7695-1924-5
TABLE OF CONTENTS
Foreword (PDF)
pp. xiv
pp. xvii
pp. xviii
Reviewers (PDF)
pp. xix
pp. xx
Plenary Session
pp. null
Session 1A: New Directions in Scan Test
null (PDF)
pp. null
Samitha Samaranayake , Massachusetts Institute of Technology
Emil Gizdarski , Synopsys Inc.
Nodari Sitchinava , Massachusetts Institute of Technology
Frederic Neuveux , Synopsys Inc.
Rohit Kapur , Synopsys Inc.
T. W. Williams , Synopsys Inc.
pp. 9
Session 1B: Outlier Identification & Current Based Test
null (PDF)
pp. null
R. Madge , LSI Logic Corporation
B. R. Benware , LSI Logic Corporation
R. Daasch , Portland State University
pp. 39
Thomas J Vogels , Carnegie Mellon University
pp. 47
IP Session 1C: How to Get to Open Architecture ATE?
null (PDF)
pp. null
Session 2A: Advances in Built-In Self-Test - I
null (PDF)
pp. null
Grzegorz Mrugalski , Poznan University of Technology
Jerzy Tyszer , Poznan University of Technology
pp. 57
Ahmad A. Al-Yamani , Stanford University
Edward J. McCluskey , Stanford University
pp. 63
Subhasish Mitra , Intel Corporation
Edward J. McCluskey , Stanford University
pp. 69
Session 2B: Analog and Mixed-Signal Test - I
null (PDF)
pp. null
Marcelo Negreiros , Universidade Federal do Rio Grande do Sul - UFRGS
Altamiro Amadeu Susin , Universidade Federal do Rio Grande do Sul - UFRGS
pp. 77
Hak-soo Yu , The University of Texas at Austin
Sungbae Hwang , The University of Texas at Austin
Jacob A. Abraham , The University of Texas at Austin
pp. 83
IP Session 2C: Silicon Proven IP Cores
null (PDF)
pp. null
Session 3A: Test Compaction
null (PDF)
pp. null
Session 3B: Testing Buses and On-Chip Interconnect
null (PDF)
pp. null
M. Kreutz , PPGC - Inst. de Inform?tica
C.A. Zeferino , PPGC - Inst. de Inform?tica; Centro de Ci?ncias Tecnol?gicas da Terra e do Mar - Univali
L. Carro , PPGC - Inst. de Inform?tica; PPGEE - Depto. Engenharia El?trica
M. Lubaszewski , PPGC - Inst. de Inform?tica; PPGEE - Depto. Engenharia El?trica
E. Cota , PPGC - Inst. de Inform?tica
pp. 128
Mehdi Baradaran Tahoori , Stanford University, CA
Subhasish Mitra , Intel Corporation
pp. 134
IP Session 3C: Test and Diagnosis of ICs Using 130 nm & 90 nm Technologies
null (PDF)
pp. null
Session 4A: Test Challenges in Nanometer Technologies
null (PDF)
pp. null
Jos? Pineda de Gyvez , Philips Research Laboratories
Rosa Rodr?guez-Monta? , Philips Research Laboratories
pp. 145
Yi-Shing Chang , Intel Corp
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 151
N. Ahmed , The University of Texas at Dallas
M. H. Tehranipour , The University of Texas at Dallas
pp. 158
IP Session 4C: Test Data Analysis
null (PDF)
pp. null
C. Hora , Stefan Eichenberger, Philips
pp. null
Special Session 5A: Panel
Special Session 5B: Panel
Session 6A: Advanced Test Generation and Fault Simulation Techniques
null (PDF)
pp. null
Aiman El-Maleh , King Fahd University of Petroleum and Minerals
Khaled Al-Utaibi , King Fahd University of Petroleum and Minerals
pp. 179
Nabil M. Abdulrazzaq , United Arab Emirates University
Sandeep K. Gupta , University of Southern California
pp. 186
Session 6B: Analog and Mixed-Signal Test - 2
null (PDF)
pp. null
Chih-Hu Wang , National Central Univ.
Wei-Juo Wang , National Central Univ.
Chauchin Su , National Chiao Tung University
pp. 197
Welela Haileselassie , University of Washington, Seattle
Mani Soma , University of Washington, Seattle
pp. 203
IP Session 6C: Testing High Speed I/Os
null (PDF)
pp. null
Session 7A: Test Data Compression
null (PDF)
pp. null
Erik H. Volkerink , Stanford University; Agilent Laboratories
Subhasish Mitra , Intel Corporation
pp. 232
Session 7B: Memory Testing
null (PDF)
pp. null
Said Hamdioui , Intel Corporation; Delft University of Technology
Mike Rodgers , Intel Corporation
pp. 241
Kuo-Liang Cheng , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Chih-Wea Wang , National Tsing Hua University
pp. 248
Sultan M. Al-Harbi , Kuwait University
Sandeep K. Gupta , University of Southern California
pp. 254
IP Session 7C: ATE Facilities for Modular SoC Testing
null (PDF)
pp. null
Session 8A: Power Consumption and Test
null (PDF)
pp. null
Dan Zhao , State University of New York at Buffalo
pp. 273
Xiaoyun Sun , University of Minnesota
Larry Kinney , University of Minnesota
Bapiraju Vinnakota , University of Minnesota
pp. 279
Session 8B: Testing Core-Based SoCs
null (PDF)
pp. null
Tomokazu Yoneda , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 287
IP Session 8C: Layout Driven Design for Test & Manufacturability
null (PDF)
pp. null
Special Session 9A: Panel
Special Session 9B: Panel
Special Session 9C: Panel
T.M. Mak , Intel Corp
Kwang-Ting Cheng , Univ. of California-Santa Barbara
pp. 313
Session 10A: System-Level Test Issues
null (PDF)
pp. null
Erik Larsson , Linkopings Universitet; Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 319
Wei Zou , University of Iowa
Sudhakar M. Reddy , University of Iowa
Irith Pomeranz , Purdue University
Yu Huang , Mentor Graphics Corporation
pp. 325
Session 10B: Diagnosis Techniques
null (PDF)
pp. null
Angela Krstic , University of California, Santa Barbara
Li-C. Wang , University of California, Santa Barbara
Kwang-Ting Cheng , University of California, Santa Barbara
Jing-Jia Liou , National Tsing-Hua University, Taiwan
pp. 339
Guido Gronthoud , Philips Research Laboratories
Camelia Hora , Philips Research Laboratories
Maurice Lousberg , Philips Research Laboratories
Pop Valer , Univ. of Twente
Stefan Eichenberger , Philips Semiconductors
pp. 345
Session 11A: Advances in Built-In Self-Test - 2
null (PDF)
pp. null
Kwame Osei Boateng , Fujitsu Laboratories Ltd.
Hideaki Konishi , Fujitsu Ltd.
Koichi Itaya , Fujitsu Ltd.
Michiaki Emori , Fujitsu Ltd.
Hitoshi Yamanaka , Fujitsu Ltd.
Takahisa Hiraide , Fujitsu Laboratories Ltd.
pp. 359
Dimitri Kagaris , Southern Illinois University
pp. 365
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
Yervant Zorian , Logic Vision
pp. 371
Session 11B: Test in the Presence of Bridging Faults
null (PDF)
pp. null
Xiang Lu , Texas A&M University
Wangqi Qiu , Texas A&M University
Weiping Shi , Texas A&M University
Zhuo Li , Texas A&M University
pp. 379
Shahin Nazarian , University of Southern California
Lei Wang , University of Southern California
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 385
IP Session 11C: SoC Test Practices for Consumer Products
null (PDF)
pp. null
Session 12A: Emerging Circuit Technologies: Test Challenges
null (PDF)
pp. null
John P. Hayes , University of Michigan
Ketan N. Patel , University of Michigan
pp. 410
Chiu-sing Choy , The Chinese University of Hong Kong
Cheong-fat Chan , The Chinese University of Hong Kong
Jing-ling Yang , The University of Hong Kong
pp. 417
IP Session 12C: P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data
null (PDF)
pp. null
Special Session 13A: Panel
Special Session 13B: Panel
Special Session 13C: Panel
pp. 431
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