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20th IEEE VLSI Test Symposium
Monterey, California
April 28-May 02
ISBN: 0-7695-1570-3
ASCII Text
x 
 
Michael Hackworth, "Keynote Address," VLSI Test Symposium, IEEE, pp. xxxv, 20th IEEE VLSI Test Symposium, 2002.
 
 
BibTex
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@article{ 10.1109/VTS.2002.10002,
author = {Michael Hackworth},
title = {Keynote Address},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2002},
isbn = {0-7695-1570-3},
pages = {xxxv},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.10002},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Keynote Address
SN - 0-7695-1570-3
SP
EP
A1 - Michael Hackworth,
PY - 2002
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Michael Hackworth, Cirrus Logic, Inc.
Citation:
Michael Hackworth, "Keynote Address," vts, pp.xxxv, 20th IEEE VLSI Test Symposium, 2002
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