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2013 IEEE 31st VLSI Test Symposium (VTS) (2001)
Marina Del Rey, CA
Mar. 29, 2001 to Apr. 3, 2001
ISBN: 0-7695-1122-8
TABLE OF CONTENTS
Foreword (PDF)
pp. xiii
pp. xiv
pp. xvii
pp. xviii
Reviewers (PDF)
pp. xix
Keynote Address
Invited Presentation
Session 1: BIST Techniques
Abhijit Jas , University of Texas, Austin
C.V. Krishna , University of Texas, Austin
Nur A. Touba , University of Texas, Austin
pp. 0002
Douglas Kay , Santa Clara University
Samiha Mourad , Santa Clara University
pp. 0009
M. Psarakis , University of Athens
A. Paschalis , University of Athens
N. Kranitis , University of Athens
D. Gizopoulos , University of Piraeus
Y. Zorian , LogicVision Inc.
pp. 0015
Session 2: Diagnosis Methods
James C.-M. Li , Stanford University
E.J. McCluskey , Stanford University
pp. 0022
Ramesh C. Tekumalla , Intel Corporation
Srikanth Venkataraman , Intel Corporation
Jayabrata Ghosh-Dastidar , University of Texas
pp. 0028
Shi-Yu Huang , National Tsing-Hua University
pp. 0034
Session 3: Test Data Compression
A. Morosov , Potsdam University
M. Gossel , Potsdam University
K. Chakrabarty , Duke University
B. Bhattacharya , Indian Statistical Institute
pp. 0048
Aiman El-Maleh , King Fahd University of Petroleum and Minerals
Esam Khan , King Fahd University of Petroleum and Minerals
Saif al Zahir , University of British Columbia
pp. 0054
Session 4: Sythesis & Design for Testability
Richard M. Chou , LSI Logic Corp.
Kewal K. Saluja , University of Wisconsin-Madison
pp. 0062
Kelly Ockunzzi , Case Western Reserve University
Chris Papachristou , Case Western Reserve University
pp. 0075
Session 5: Scan Chain Design
llia Polian , Institute of Computer Science
Bernd Becker , Albert-Ludwigs-University
pp. 0088
Session 6: Innovative Measurement Techniques
Takahiro J. Yamaguchi , Advantest Laboratories, Ltd
Masahiro Ishida , Advantest Laboratories, Ltd
Mani Soma , University of Washington
David Halter , Motorola Inc.
Rajesh Raina , Motorola Inc.
Jim Nissen , Motorola Inc.
pp. 0102
Amir Attarha , The University of Texas at Dallas
Mehrdad Nourani , The University of Tehran
pp. 0111
Xiaoyun Sun , University of Minnesota
Bapiraju Vinnakota , University of Minnesota
pp. 0117
Session 7: Diagnosis & Verification ATPG
M. Enamul Amyeen , Purdue University
W. Kent Fuchs , Purdue University
Irith Pomeranz , Purdue University
Vamsi Boppana , Fujitsu Labs of America
pp. 0124
Julia Dushina , STMicroelectronics
Mike Benjamin , STMicroelectronics
Daniel Geist , IBM Haifa Research Lab
pp. 0131
Session 8: Defect Analysis and IDDx Diagnosis
Antonio Zenteno , National Institute for Astrophysics, Optics and Electronics-INAOE
Victor H. Champac , National Institute for Astrophysics, Optics and Electronics-INAOE
pp. 0138
Chintan Patel , University of Maryland Baltimore County
Jim Plusquellic , University of Maryland Baltimore County
pp. 0145
Special Session 1: Panel
Special Session 2: Hot Topic Session
Session 9: SOC Testing
Tek Jau Tan , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
pp. 0158
Ashish Giani , Intel Corporation
Shuo Sheng , Rutgers University
Michael S. Hsiao , Rutgers University
V. Agrawal , Bell Labs
pp. 0163
Session 10: Online Testing
E.S. Sogomonyan , Russian Academy of Science
A. Morosov , Potsdam University
J. Rzeha , Potsdam University
M. Gossel , Potsdam University
A. Singh , Auburn University
pp. 0184
Subhasish Mitra , Stanford University
Edward J. McCluskey , Stanford University
pp. 0190
Session 11: Self-Test Techniques
Jing-Reng Huang , University of California, Santa Barbara
Madhu K. Iyer , University of California, Santa Barbara
Kwang-Ting Cheng , University of California, Santa Barbara
pp. 0198
Wei-Cheng Lai , University of California, Santa Barbara
Jing-Reng Huang , University of California, Santa Barbara
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 0204
Benoît Charlot , TIMA laboratory
Salvador Mir , TIMA laboratory
Fabien Parrain , TIMA laboratory
Bernard Courtois , TIMA laboratory
pp. 0210
Session 12: Memory Testing
Mohammad Gh. Mohammad , University of Wisconsin
Kewal K. Saluja , University of Wisconsin
pp. 0218
Kuo-Liang Cheng , National Tsing Hua University
Ming-Fu Tsai , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 0225
Sultan M. Al-Harbi , University of Southern California
Sandeep K. Gupta , University of Southern California
pp. 0231
Session 13: Scalable Fault Simulation, Model Build and ATPG Methods
Ozgur Sinanoglu , University of California, San Diego
Alex Orailoglu , University of California, San Diego
pp. 0240
Yiorgos Makris , Yale University
Vishal Patel , University of California, San Diego
Alex Orailoglu , University of California, San Diego
pp. 0246
Session 14: Test Stimulus Generation for Analog Testing
Yue-Tsang Chen , Chung Shan Institute of Science and Technology
Chauchin Su , National Central University
pp. 0260
F. Azaïs , University of Montpellier
S. Bernard , University of Montpellier
Y. Bertrand , University of Montpellier
X. Michel , University of Montpellier
M. Renovell , University of Montpellier
pp. 0266
Eduardo J. Peralías , Universidad de Sevilla
Gloria Huertas , Universidad de Sevilla
Adoración Rueda , Universidad de Sevilla
José L. Huertas , Universidad de Sevilla
pp. 0272
Special Session 3: Hot Topic Session
Special Session 4: Embedded Tutorial
Special Session 5: Panel
Session 15: Memory Diagnosis
I. de Paúl , University Illes Balears
M. Rosales , University Illes Balears
B. Alorda , University Illes Balears
J. Segura , University Illes Balears
C. Hawkins , The University of New Mexico
J. Soden , Sandia National Labs
pp. 0286
John T. Chen , Carnegie Mellon University
Wojciech Maly , Carnegie Mellon University
Janusz Rajski , Mentor Graphics Corporation
Omar Kebichi , Mentor Graphics Corporation
Jitendra Khare , Intel Corporation-Sacramento
pp. 0292
Dirk Niggemeyer , University of Illinois
Elizabeth M. Rudnick , University of Illinois
pp. 0299
Session 16: Minimizing Test Power
Tobias Schuele , University of Karlsruhe
Albrecht P. Stroele , University of Karlsruhe
pp. 0312
Ranganathan Sankaralingam , University of Texas
Nur A. Toubas , University of Texas
Bahram Pouya , Motorola
pp. 0319
Session 17: Estimating and Reducing Infant Mortality
Thomas S. Barnett , Auburn University
Adit D. Singh , Auburn University
Victor P . Nelson , Auburn University
pp. 0326
Chao-Wen Tseng , Stanford University
Ray Chen , Stanford University
Edward J. McCluskey , Stanford University
Phil Nigh , IBM MicroElectronics
pp. 0339
Session 18: Novel ATPG Techniques
Emil Gizdarski , University of Rousse
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 0346
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 0352
Yi-Shing Chang , University of Southern California
Sandeep Gupta , University of Southern California
Melvin Breuer , University of Southern California
pp. 0358
Session 19: Test Scheduling, Leakage Estimation and Onchip Delay Measurement
José Pineda de Gyvez , Philips Research Labs
Eric van de Wetering , Philips Semiconductors
pp. 0375
Jiun-Lang Huang , University of California, Santa Barbara
Kwang-Ting Cheng , University of California, Santa Barbara
pp. 0380
Session 20: Fault Modeling and BIST Evaluation
Ginette Monté , Ecole Polytechnique de Montr?al
Bernard Antaki , Ecole Polytechnique de Montr?al
Serge Patenaude , Ecole Polytechnique de Montr?al
Yvon Savaria , Ecole Polytechnique de Montr?al
Claude Thibeault , Ecole de Technologie Sup?rieure de Montr?al
Pieter Trouborst , Nortel Networks
pp. 0388
Keerthi Heragu , Texas Instruments Inc.
Manish Sharma , University of Illinois
Rahul Kundu , Carnegie Mellon University
R.D. (Shawn) Blanton , Carnegie Mellon University
pp. 0396
Chao-Wen Tseng , Stanford University
Subhasish Mitra , Stanford University
Edward J. McCluskey , Stanford University
Scott Davidson , Sun Microsystems
pp. 0404
Special Session 6: Showcase
Special Session 7: Panel
Special Session 8: Panel
Author Index (PDF)
pp. 0416
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