"Testing the Limits of System-on-Chip," VLSI Test Symposium, IEEE, pp. xxxiii, 19th IEEE VLSI Test Symposium, 2001.

@article{ 10.1109/VTS.2001.10017,
author = {},
title = {Testing the Limits of System-on-Chip},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2001},
isbn = {0-7695-1122-8},
pages = {xxxiii},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.10017},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Testing the Limits of System-on-Chip
SN - 0-7695-1122-8
SP
EP
PY - 2001
VL - 0
JA - VLSI Test Symposium, IEEE
ER -