Test Technology Technical Council

V
VTS
2001
19th IEEE VLSI Test Symposium
Abstract - Test Technology Technical Council

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19th IEEE VLSI Test Symposium

Test Technology Technical Council (PDF)

Marina Del Rey, CA

March 29-April 03

ISBN: 0-7695-1122-8

	ASCII Text	x
	"Test Technology Technical Council," VLSI Test Symposium, IEEE, pp. xxvi, 19th IEEE VLSI Test Symposium, 2001.

	BibTex	x
	@article{ 10.1109/VTS.2001.10004, author = {}, title = {Test Technology Technical Council}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2001}, isbn = {0-7695-1122-8}, pages = {xxvi}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.10004}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Technology Technical Council SN - 0-7695-1122-8 SP EP PY - 2001 VL - 0 JA - VLSI Test Symposium, IEEE ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2001.10004

Citation:

"Test Technology Technical Council," vts, pp.xxvi, 19th IEEE VLSI Test Symposium, 2001

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