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2013 IEEE 31st VLSI Test Symposium (VTS) (1999)
San Diego, California
Apr. 26, 1999 to Apr. 30, 1999
ISBN: 0-7695-0146-X
TABLE OF CONTENTS
Foreword (PDF)
pp. xiii
pp. xvii
pp. xviii
Reviewers (PDF)
pp. xxii
pp. xxviii
Keynote Address
Invited Presentation
Session 1: Testing High-Speed and Dynamic Circuits: Moderators: B. Courtois, TIMA
Session 2: Core Testing: Moderators: R. Garcia, Schlumberger
Ken Batcher , Case Western Reserve University
Christos Papachristou , Case Western Reserve University
pp. 34
M. Gössel , University of Potsdam
A. Morosov , University of Potsdam
E.S. Sogomonyan , Russian Academy of Science
pp. 49
Session 3: Diagnosis: Moderators: R. Galivanche, Intel
Andreas Veneris , University of Illinois at Urbana
Ibrahim N. Hajj , University of Illinois at Urbana
Srikanth Venkataraman , Intel Corporation
W. Kent Fuchs , Purdue University
pp. 58
Session 4: Techniques for the Very-Deep Submicron: Moderators: L. Bouzaida, ST Microelectronics
Michael A. Margolese , University of California, at Santa Cruz
F. Joel Ferguson , University of California, at Santa Cruz
pp. 80
Yi-Shing Chang , University of Southern California
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 95
Session 5: Advanced Scan Path Techniques: Moderators: K. Ruparel, Cisco
Josef Schmid , Lucent Technologies
Joachim Knäblein , Lucent Technologies
pp. 106
Abhijit Jas , University of Texas at Austin
Jayabrata Ghosh-Dastidar , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 114
Sameer Sharma , Rutgers University
Michael S. Hsiao , Rutgers University
pp. 121
Session 6: IDDQ Testing: Moderators: C. Hawkins, University of New Mexico
C. Thibeault , ?cole de Technologie Sup?rieure
pp. 143
Session 7: Delay Fault Testing: Moderators: J. Aylor, University of Virginia
Irith Pomeranz , University of Iowa
Sudhakar M. Reddy , University of Iowa
pp. 152
Hyungwon Kim , University of Michigan
John P. Hayes , University of Michigan
pp. 160
Jayabrata Ghosh-Dastidar , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 168
Session 8: Validation, Verification, and Diagnosis: Moderators: D. Pradhan, Texas A&M University
Jian Shen , The University of Texas at Austin
Jacob A. Abraham , The University of Texas at Austin
pp. 189
Sreejit Chakravarty , Intel Corporation
Vinodh Gopal , Compaq Computer Corp.
pp. 195
M. Enamul Amyeen , Purdue University
W. Kent Fuchs , Purdue University
Irith Pomeranz , University of Iowa
Vamsi Boppana , Fujitsu Labs of America
pp. 201
Session 9: Mixed Signal Testing: Moderators: G. Roberts, McGill University
Pramodchandran N. Variyam , Georgia Institute of Technology
Junwei Hou , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 214
Jiun-Lang Huang , University of California at Santa Barbara
Chen-Yang Pan , University of California at Santa Barbara
Kwang-Ting Cheng , University of California at Santa Barbara
pp. 220
Stephen Sunter , LogicVision
Naveena Nagi , Advantest
pp. 226
Session 10: BIST: Moderators: S. Wu, Lucent Bell Labs
Janusz Rajski , Mentor Graphics Corporation
Grzegorz Mrugalski , Poznan University of Technology
Jerzy Tyszer , Poznan University of Technology
pp. 236
Mihalis Psarakis , NCSR "Demokritos"
Antonis Paschalis , NCSR "Demokritos"
Dimitris Gizopoulos , 4PLUS Technologies
Yervant Zorian , LogicVision, Inc.
pp. 252
Session 11: ATPG Related Approaches: Moderators: J. Sprock, Synopsys
Ruifeng Guo , University of Iowa
Irith Pomeranz , University of Iowa
Sudhakar M. Reddy , University of Iowa
pp. 260
Sudhakar M. Reddy , University of Iowa
Irith Pomeranz , University of Iowa
Nadir Z. Basturkmen , University of Iowa
Xijiang Lin , Mentor Graphics Corporation
pp. 275
Session 12: Testing MEMS, MCM and Analog Circuits: Moderators: D. Keezer, Georgia Tech
Bruce C. Kim , Michigan State University
Krishna Marella , Michigan State University
pp. 284
Zao Yang , Silicon Graphics Inc.
K.-T. Cheng , University of California at Santa Barbara
K.L. Tai , Bell Laboratories
pp. 290
Ramakrishna Voorakaranam , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 296
Session 13: Mixed Signal BIST: Moderators: B. Kaminska, Opmaxx
Sassan Tabatabaei , University of British Columbia
André Ivanov , University of British Columbia
pp. 311
Jinyan Zhang , University of Washington
Sam Huynh , University of Washington
Mani Soma , University of Washington
pp. 319
Session 14: High-Level Test Techniques: Moderators: K. Kinoshita, Osaka University
Ronald J. Hayne , University of Virginia
Barry W. Johnson , University of Virginia
pp. 333
Silvia Chiusano , Polit?cnico di Torino
Fulvio Corno , Polit?cnico di Torino
Paolo Prinetto , Polit?cnico di Torino
pp. 341
Session 15: Concurrent Checking: Moderators: J. Huertas, Centro Nacional de Microelec
Session 16: Memory Test: Moderators: C.-W. Wu, Tsing Hua University
Jun Zhao , Texas A&M University
Fred J. Meyer , Northeastern University
Fabrizio Lombardi , Northeastern University
pp. 378
Session 17: BIST Related Approaches: Moderators: R. David, Lab d'Automatique de Grenoble
P. Girard , Universit? Montpellier
L. Guiller C. Landrault , Universit? Montpellier
S. Pravossoudovitch , Universit? Montpellier
pp. 407
Carter Hamilton , University of Kentucky
Gretchen Gibson , University of Kentucky
Sajitha Wijesuriya , University of Kentucky
Charles Stroud , University of Kentucky
pp. 413
Session 18: Defect Oriented Test: Moderators: Y. Malaiya, Colorado State University
E. Isern , Universit?t Illes Balears
M. Roca , Universit?t Illes Balears
J. Segura , Universit?t Illes Balears
pp. 420
Ankur Jain , Rutgers University
Michael S. Hsiao , Rutgers University
Vamsi Boppana , Fujitsu Labs of America, Inc.
M. Fujita , Fujitsu Labs of America, Inc.
pp. 426
Wanli Jiang , University of Minnesota
Bapiraju Vinnakota , University of Minnesota
pp. 433
Session 19: On-Line Testing and Fault Tolerance: Moderators: M. Bayoumi, University of Southwestern Louisiana
Ismet Bayraktaroglu , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 446
M. Rebaudengo , Polit?cnico di Torino
M. Sonza Reorda , Polit?cnico di Torino
pp. 452
Session 20: DFT and Boundary Scan: Moderators: S. Mourad, Santa Clara University
Jingjing Xu , University of California at Santa Cruz
Rahul Kundu , University of California at Santa Cruz
F. Joel Ferguson , University of California at Santa Cruz
pp. 460
Special Session 2: IEEE P1500: SOC Test Standardization: Moderator: K. Wagner, Stream Machine
Embedded Presentation: At-Speed Logic Built-In Self-Test: Moderator: J. Rajski, J. Tyszer
Author Index (PDF)
pp. 487
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