ISBN: 0-8186-7810-0

Gadi Singer

General Manager

Design Technology

Intel Corporation

Gary Smith

Principal Analyst Dataquest

K. De, LSI Logic Corp., Milpitas, CA, USA

Nur A. Touba, University of Texas at Austin

Bahram Pouya, University of Texas at Austin

K. Hatayama, Res. Lab., Hitachi Ltd., Ibaraki, Japan

K. Hikone, Res. Lab., Hitachi Ltd., Ibaraki, Japan

T. Miyazaki, Res. Lab., Hitachi Ltd., Ibaraki, Japan

H. Yamada, Res. Lab., Hitachi Ltd., Ibaraki, Japan

V. Kim, Colorado State University

T. Chen, Colorado State University

H. Goto, Fac. of Eng., Chiba Univ., Japan

S. Nakamura, Fac. of Eng., Chiba Univ., Japan

K. Iwasaki, Fac. of Eng., Chiba Univ., Japan

A.J. van de Goor, Delft University of Technology

I.B.S. Tlili, Delft University of Technology

A.P. Stroele, Karlsruhe Univ., Germany

F. Mayer, Karlsruhe Univ., Germany

F. Fummi, Politecnico di Milano, Italy

D. Sciuto, Politecnico di Milano, Italy

S. Chiusano, Dipt. di Autom. e Inf., Politecnico di Torino, Italy

F. Corno, Dipt. di Autom. e Inf., Politecnico di Torino, Italy

P. Prinetto, Dipt. di Autom. e Inf., Politecnico di Torino, Italy

M. Sonza Reorda, Dipt. di Autom. e Inf., Politecnico di Torino, Italy

R. Rodriguez-Montanes, Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain

J. Figueras, Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain

Yiming Gong, Quickturn Syst. Inc., Mountain View, CA, USA

S. Chakravarty, Quickturn Syst. Inc., Mountain View, CA, USA

C. Thibeault, Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada

Liang-Chi Chen, Electrical Engineering -- Systems University of Southern California, CA, USA

Sandeep K. Gupta, Electrical Engineering -- Systems University of Southern California, CA, USA

Melvin A. Breuer, Electrical Engineering -- Systems University of Southern California, CA, USA

P. Girard, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

C. Landrault, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

V. Moreda, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

S. Pravossoudovitch, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

X.T. Chen, Texas A & M University

F.J. Meyer, Texas A & M University

F. Lombardi, Texas A & M University

Yi-Shing Chang, Electrical Engineering - Systems University of Southern California, Los Angeles

Sandeep K. Gupta, Electrical Engineering - Systems University of Southern California, Los Angeles

Melvin A. Breuer, Electrical Engineering - Systems University of Southern California, Los Angeles

P. Dahlgren, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden

T. Haulin, Ericsson Telecom AB, Stockholm, Sweden

P. Wohl, Adv. Test Technol. Inc., Williston, VT, USA

J. Waicukauski, Adv. Test Technol. Inc., Williston, VT, USA

Rathish Jayabharathi, Design Technology - Logic Test Technology Intel Corporation, Folsom, CA

Kyung Tek Lee, Computer Engineering Research Center University of Texas at Austin, Austin, TX

Jacob A. Abraham, Computer Engineering Research Center University of Texas at Austin, Austin, TX

Shi-Yu Huang, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

Kuang-Chien Chen, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

Martin Keim, Institute of Computer Science Albert-Ludwigs-University

Michael Martin, Institute of Computer Science Albert-Ludwigs-University

Bernd Becker, Institute of Computer Science Albert-Ludwigs-University

Rolf Drechsler, Institute of Computer Science Albert-Ludwigs-University

Paul Molitor, Institute of Computer Science Albert-Ludwigs-University

A. Abderrahman

E. Cerny

B. Kaminska

Karim Arabi, OPMAX Engineering Inc. Beaverton (OR)

Bozena Kaminska, Ecole Polytechnique de Montreal

Zbigniew Jaworski, Institute of Microelectronics and Optoelectronics Warsaw University of Technology zj@imio.pw.edu.pl, mn@imio.pw.edu.pl, wbk@imio.pw.edu.pl

Mariusz Niewczas, Institute of Microelectronics and Optoelectronics Warsaw University of Technology zj@imio.pw.edu.pl, mn@imio.pw.edu.pl, wbk@imio.pw.edu.pl

Wieslaw Kuzmicz, Institute of Microelectronics and Optoelectronics Warsaw University of Technology zj@imio.pw.edu.pl, mn@imio.pw.edu.pl, wbk@imio.pw.edu.pl

N.J. Godambe, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

C.-J.R. Shi, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

Michael S. Hsiao, Center for Reliable and High-Performance Computing University of Illinois, Urbana, IL http://www.crhc.uiuc.edu/

Elizabeth M. Rudnick, Center for Reliable and High-Performance Computing University of Illinois, Urbana, IL http://www.crhc.uiuc.edu/

Janak H. Patel, Center for Reliable and High-Performance Computing University of Illinois, Urbana, IL http://www.crhc.uiuc.edu/

Ismed Hartanto

Vamsi Boppana

Janak H. Patel

W. Kent Fuchs

hartanto@dtc.hp. com

A. Khoche, Sunrise Test Syst., Fremont, CA, USA

E. Brunvand, Sunrise Test Syst., Fremont, CA, USA

C. Metra, Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

M. Favalli, Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

B. Ricco, Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

X. Kavousianos, Dept. of Comput. Eng. & Inf., Patras Univ., Greece

D. Nikolos, Dept. of Comput. Eng. & Inf., Patras Univ., Greece

V.A. Vardanian, Armenian Nat. Academy of Sci., American Univ. of Armenia, Yerevan, Armenia

M. Renovell, LIRMM-UM, Montpellier, France

J. Figueras, LIRMM-UM, Montpellier, France

Y. Zorian, LIRMM-UM, Montpellier, France

Dimitris Gizopoulos, Institute of Informatics & Telecommunications, NCSR Athens, GREECE

Mihalis Psarakis, Institute of Informatics & Telecommunications, NCSR Athens, GREECE

Antonis Paschalis, Institute of Informatics & Telecommunications, NCSR Athens, GREECE

C.A. Fleischer, Dept. of Electr. & Comput. Eng., Marquette Univ., Milwaukee, WI, USA

L.A. Belfore, II, Dept. of Electr. & Comput. Eng., Marquette Univ., Milwaukee, WI, USA

Christian Dufaza, Laboratoire d'Informatique de Robotique

Hassan Ihs, Laboratoire d'Informatique de Robotique

P.N. Variyam, Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

A. Chatterjeee, Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

N. Nagi, Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

Soon Jyh Chang, Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

Chung Len Lee, Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

Jwu E Chen, Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

D. Krishnaswamy, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

E.M. Rudnick, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

P. Banerjee, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

Laura Farinetti, Dip. di Automatica e Informatica, Politecnico di Torino

Pier Luca Montessoro, Dip. di Ingegneria Elettrica, Gestionale e Meccanica Universita` degli Studi di Udine

J.-K. Zhao, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

E.M. Rudnick, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

W. Verhaegen, ESAT, Katholieke Univ., Leuven, Heverlee, Belgium

G. Van der Plas, ESAT, Katholieke Univ., Leuven, Heverlee, Belgium

G. Gielen, ESAT, Katholieke Univ., Leuven, Heverlee, Belgium

Eduardo Peralias, Instituto de Microelectr_nica de Sevilla (IMSE-CNM) email: rueda@cnm.us.es

Adoracion Rueda, Instituto de Microelectr_nica de Sevilla (IMSE-CNM) email: rueda@cnm.us.es

Jose L. Huertas, Instituto de Microelectr_nica de Sevilla (IMSE-CNM) email: rueda@cnm.us.es

W.D. Bartlett, Data Acquistion Products Test Engineer, FL, USA

P. Nigh, IBM

W. Needham, IBM

K. Butler, IBM

P. Maxwell, IBM

R. Aitken, IBM

Priyank Kalla, University of Massachusetts

Maciej Ciesielski, University of Massachusetts

I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

J. Yeandel, Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK

D. Thulborn, Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK

S. Jones, Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK

A. Hlawiczka, Inst. of Electronics., Silesian Tech. Univ., Gliwice, Poland

M. Gossel, Inst. of Electronics., Silesian Tech. Univ., Gliwice, Poland

E.S. Sogormonyan, Inst. of Electronics., Silesian Tech. Univ., Gliwice, Poland

G. Buonanno, Dipt. di Elettronica, Politecnico di Milano, Italy

M. Pugassi, Dipt. di Elettronica, Politecnico di Milano, Italy

M.G. Sami, Dipt. di Elettronica, Politecnico di Milano, Italy

S.R. Maka, Center for Reliable Comput., Stanford Univ., CA, USA

E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA

Robert B. Norwood, Stanford University

Edward J. McCluskey, Stanford University

Chen-Huan Chiang, University of Southern California

Sandeep K. Gupta

A. Jee, Semicond.. Diagnosis & Test, Mipitas, CA, USA

F.J. Ferguson, Semicond.. Diagnosis & Test, Mipitas, CA, USA

V. Prepin, Lab. d Autom. de Grenoble, France

R. David, Lab. d Autom. de Grenoble, France

J. Savir, Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA

Nur A. Touba, University of Texas at Austin

J. Savir, Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA

Can Oekmen, Institute of Computer Science Albert-Ludwigs-University

Martin Keim, Institute of Computer Science Albert-Ludwigs-University

Rolf Krieger, Institute of Computer Science Albert-Ludwigs-University

Bernd Becker, Institute of Computer Science Albert-Ludwigs-University

Josep Altet, Universitat Politecnica de Catalunya

Antonio Rubio, Universitat Politecnica de Catalunya

V. Szekely, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

M. Rencz, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

B. Courtois, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

J.T.Y. Chang, Center for Reliable Comput., Stanford Univ., CA, USA

E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA