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15th IEEE VLSI Test Symposium (VTS'97)
Monterey, California
April 27-May 01
ISBN: 0-8186-7810-0
| ASCII Text | x | ||
| "ATE for VLSI: What Challenges Lie Ahead?," VLSI Test Symposium, IEEE, pp. 318, 15th IEEE VLSI Test Symposium (VTS'97), 1997. | |||
| BibTex | x | ||
| @article{ 10.1109/VTS.1997.10008, author = {}, title = {ATE for VLSI: What Challenges Lie Ahead?}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {318}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1997.10008}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - VLSI Test Symposium, IEEE TI - ATE for VLSI: What Challenges Lie Ahead? SN - 0-8186-7810-0 SP EP PY - 1997 VL - 0 JA - VLSI Test Symposium, IEEE ER - | |||
Citation:
"ATE for VLSI: What Challenges Lie Ahead?," vts, pp.318, 15th IEEE VLSI Test Symposium (VTS'97), 1997
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