ISBN: 0-8186-7304-4

Joseph Borel

N.A. Touba, Center for Reliable Comput., Stanford Univ., CA, USA

E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA

R.D. Blanton, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

J.P. Hayes, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

F. Muradali, Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

J. Rajski, Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

S. Barbagallo, Central R&D Dept., Italy

M. Lobetti Bodoni, Central R&D Dept., Italy

D. Medina, Central R&D Dept., Italy

F. Corno, Central R&D Dept., Italy

P. Prinetto, Central R&D Dept., Italy

M. Sonza Reorda, Central R&D Dept., Italy

K. Heragu, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

V.D. Agrawal, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

D. Vazquez, Centro Nacional de Microelectron., Seville Univ., Spain

J.L. Huertas, Centro Nacional de Microelectron., Seville Univ., Spain

A. Rueda, Centro Nacional de Microelectron., Seville Univ., Spain

E. Felt, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA

A. Sangiovanni-Vincentelli, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA

M. Renovell, Lab. d'Inf., Robotique et Microelectronique, Montpellier, France

F. Azais, Lab. d'Inf., Robotique et Microelectronique, Montpellier, France

Y. Bertrand, Lab. d'Inf., Robotique et Microelectronique, Montpellier, France

M. Ehsanian, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

B. Kaminska, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

K. Arabi, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

J. Van Spaandonk, Eindhoven Univ. of Technol., Netherlands

T.A.M. Kevenaar, Eindhoven Univ. of Technol., Netherlands

S. Bhattacharya, NEC Res. Inst., Princeton, NJ, USA

S. Dey, NEC Res. Inst., Princeton, NJ, USA

X. Wendling, Inst. Nat. Polytech. de Grenoble, France

R. Rochet, Inst. Nat. Polytech. de Grenoble, France

R. Leveugle, Inst. Nat. Polytech. de Grenoble, France

R.B. Norwood, Center for Reliable Comput., Stanford Univ., CA, USA

E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA

Y. Lu, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

M. Miegler, Inst. of Comput.-Aided Circuit Design, Erlangen-Nurnberg Univ., Germany

W. Wolz, Inst. of Comput.-Aided Circuit Design, Erlangen-Nurnberg Univ., Germany

A. Ferre, Univ. Politecnica de Catalunya, Barcelona, Spain

J. Figueras, Univ. Politecnica de Catalunya, Barcelona, Spain

A.E. Gattiker, Carnegie Mellon Univ., Pittsburgh, PA, USA

W. Maly, Carnegie Mellon Univ., Pittsburgh, PA, USA

S.P. Athan, Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA

D.L. Landis, Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA

S.A. Al-Arian, Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA

S. Manich, Univ. Politecnica de Catalunya, Barcelona, Spain

M. Nicolaidis, Univ. Politecnica de Catalunya, Barcelona, Spain

J. Figueras, Univ. Politecnica de Catalunya, Barcelona, Spain

H. Balachandran, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

D.M.H. Walker, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

E.S. Sogomonyan, Inst. of Control Sci., Acad. of Sci., Moscow, Russia

M. Gossel, Inst. of Control Sci., Acad. of Sci., Moscow, Russia

C. Metra, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

M. Favalli, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

B. Ricco, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

N. Gaitanis, Inst. of Inf., NCSR "Demokritos", Athens, Greece

D. Gizopoulos, Inst. of Inf., NCSR "Demokritos", Athens, Greece

A. Paschalis, Inst. of Inf., NCSR "Demokritos", Athens, Greece

P. Kostarakis, Inst. of Inf., NCSR "Demokritos", Athens, Greece

S.S. Gorshe, NEC America Inc., Hillsboro, OR, USA

B. Bose, NEC America Inc., Hillsboro, OR, USA

Vl.V. Saposhnikov, St. Petersburg State Univ., Russia

A. Dmitriev, St. Petersburg State Univ., Russia

M. Goessel, St. Petersburg State Univ., Russia

V.V. Saposhnikov, St. Petersburg State Univ., Russia

J.-L. Dufour, RAMS Dept., Matra Transp. Int., Montrouge, France

V. Boppana, Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA

I. Hartanto, Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA

W.K. Fuchs, Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA

J.W. Sheppard, ARINC Res. Corp., Annapolis, MD, USA

W.R. Simpson, ARINC Res. Corp., Annapolis, MD, USA

M. Sanada, NEC Corp., Kawasaki, Japa

S. Chakravarty, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA

S. Venkataraman, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA

I. Hartanto, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA

W. Kent Fuchs, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA

W.K. Huang, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA

X.T. Chen, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA

F. Lombardi, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA

M.S. Hsiao, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

E.M. Rudnick, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA

K.B. Rajan, Sun Microsyst., Menlo Park, CA, USA

D.E. Long, Sun Microsyst., Menlo Park, CA, USA

M. Abramovici, Sun Microsyst., Menlo Park, CA, USA

R.H. Klenke, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA

J.H. Aylor, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA

J.M. Wolf, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA

M. Keim, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

B. Becker, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

B. Stenner, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

J.A. Wehbeh, MIPS Technol. Inc., Mountain View, CA, USA

D.G. Saab, MIPS Technol. Inc., Mountain View, CA, USA

T.R. Damarla, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA

M.J. Chung, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA

Wei Su, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA

G.T. Michael, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA

B.C. Kim, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

A. Chatterjee, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

M. Swaminathan, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

V.A. Koval

D Fedasyuk

A.J. van de Goor, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

G.N. Gaydadjiev, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

V.G. Mikitjuk, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

V.N. Yarmolik, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

M.P. Kluth, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc

F. Simon, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc

J.Y. Le Gall, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc

E. Muller, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc

P. Uppaluri, Avant Corp., Research Triangle Park, NC, USA

U. Sparmann, Avant Corp., Research Triangle Park, NC, USA

I. Pomeranz, Avant Corp., Research Triangle Park, NC, USA

S. Cremoux, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

C. Fagot, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

P. Girard, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

C. Landrault, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

S. Pravossoudovitch, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

V.A. Vardanian, Inst. of Inf. & Autom. Problems, Acad. of Sci., Yerevan, Armenia

S. Crepaux-Motte, Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France

M. Jacomino, Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France

R. David, Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France

M. Sivaraman, Carnegie Mellon Univ., Pittsburgh, PA, USA

A.J. Strojwas, Carnegie Mellon Univ., Pittsburgh, PA, USA

P. Wohl, Microelectron. Div., IBM Corp., Essex Junction, VT, USA

J. Waicukauski, Microelectron. Div., IBM Corp., Essex Junction, VT, USA

M. Graf, Microelectron. Div., IBM Corp., Essex Junction, VT, USA

J.T.-Y. Chang, Center for Reliable Comput., Stanford Univ., CA, USA

E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA

M. Renovell, Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

P. Huc, Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

Y. Bertrand, Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France

Yuyun Liao, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

D.M.H. Walker, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

A. Chatterjee, Georgia Inst. of Technol., Atlanta, GA, USA

R. Jayabharathi, Georgia Inst. of Technol., Atlanta, GA, USA

P. Pant, Georgia Inst. of Technol., Atlanta, GA, USA

J.A. Abraham, Georgia Inst. of Technol., Atlanta, GA, USA

M. Soufi, Ecole Polytech. de Montreal, Que., Canada

S. Rochon, Ecole Polytech. de Montreal, Que., Canada

Y. Savaria, Ecole Polytech. de Montreal, Que., Canada

B. Kaminska, Ecole Polytech. de Montreal, Que., Canada

D. Kagaris, Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA

S. Tragoudas, Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA

A.P. Stroele, Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany

C. Stroud, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA

S. Konala, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA

Ping Chen, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA

M. Abramovici, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA

N.A. Touba, Center for Reliable Comput., Stanford Univ., CA, USA

E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA

T.J. Powell, Texas Instrum. Inc., Dallas, TX, USA

J. Khare, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

W. Maly, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

N. Tiday, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

P. Dahlgren, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden

P. Liden, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden

H. Konuk, California Design Center, Hewlett-Packard Co., CA, USA

F.J. Ferguson, California Design Center, Hewlett-Packard Co., CA, USA

S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

S. Kajihara, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

M.B. Amin, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA

B. Vinnakota, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA

A. Vergis, Dept. of Comput. Eng., Patras Univ., Greece

C. Tobon, Dept. of Comput. Eng., Patras Univ., Greece

W.K. Huang, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA

F. Lombardi, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA

T. Lee, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA

I.N. Hajj, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA

E.M. Rudnick, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA

J.H. Patel, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA

D.K. Das, Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India

U.K. Bhattacharya, Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India

B.B. Bhattacharya, Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India

H.H. Zheng, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA

A. Balivada, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA

J.A. Abraham, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA

K. Arabi, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

B. Kaminska, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

B. Vinnakota, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

Chen-Yang Pan, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

F. Mohamed, TIMA Lab., Grenoble, France

M. Manzouki, TIMA Lab., Grenoble, France

A. Biassizo, TIMA Lab., Grenoble, France

F. Novak, TIMA Lab., Grenoble, France