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14th IEEE VLSI Test Symposium (VTS '96)
Princeton, NJ
April 28-May 01
ISBN: 0-8186-7304-4
Table of Contents
Keynote Address
Invited Talk
Session 1: Design for Testability
N.A. Touba, Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA
pp. 2
R.D. Blanton, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
J.P. Hayes, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 9
F. Muradali, Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
J. Rajski, Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
pp. 17
S. Barbagallo, Central R&D Dept., Italy
M. Lobetti Bodoni, Central R&D Dept., Italy
D. Medina, Central R&D Dept., Italy
F. Corno, Central R&D Dept., Italy
P. Prinetto, Central R&D Dept., Italy
M. Sonza Reorda, Central R&D Dept., Italy
pp. 26
K. Heragu, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
V.D. Agrawal, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 32
Session 2: Testability of Analog Circuits
D. Vazquez, Centro Nacional de Microelectron., Seville Univ., Spain
J.L. Huertas, Centro Nacional de Microelectron., Seville Univ., Spain
A. Rueda, Centro Nacional de Microelectron., Seville Univ., Spain
pp. 42
E. Felt, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
A. Sangiovanni-Vincentelli, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
pp. 48
M. Renovell, Lab. d'Inf., Robotique et Microelectronique, Montpellier, France
F. Azais, Lab. d'Inf., Robotique et Microelectronique, Montpellier, France
Y. Bertrand, Lab. d'Inf., Robotique et Microelectronique, Montpellier, France
pp. 54
M. Ehsanian, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
B. Kaminska, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
K. Arabi, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
pp. 60
J. Van Spaandonk, Eindhoven Univ. of Technol., Netherlands
T.A.M. Kevenaar, Eindhoven Univ. of Technol., Netherlands
pp. 66
Session 3: Synthesis for Testability
X. Wendling, Inst. Nat. Polytech. de Grenoble, France
R. Rochet, Inst. Nat. Polytech. de Grenoble, France
R. Leveugle, Inst. Nat. Polytech. de Grenoble, France
pp. 81
R.B. Norwood, Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA
pp. 87
Y. Lu, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 93
M. Miegler, Inst. of Comput.-Aided Circuit Design, Erlangen-Nurnberg Univ., Germany
W. Wolz, Inst. of Comput.-Aided Circuit Design, Erlangen-Nurnberg Univ., Germany
pp. 99
Session 4: IDDQ Testing
A. Ferre, Univ. Politecnica de Catalunya, Barcelona, Spain
J. Figueras, Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 106
A.E. Gattiker, Carnegie Mellon Univ., Pittsburgh, PA, USA
W. Maly, Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 112
S.P. Athan, Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA
D.L. Landis, Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA
S.A. Al-Arian, Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA
pp. 118
S. Manich, Univ. Politecnica de Catalunya, Barcelona, Spain
M. Nicolaidis, Univ. Politecnica de Catalunya, Barcelona, Spain
J. Figueras, Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 124
H. Balachandran, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
D.M.H. Walker, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
pp. 130
Session 5: On-Line Testing
E.S. Sogomonyan, Inst. of Control Sci., Acad. of Sci., Moscow, Russia
M. Gossel, Inst. of Control Sci., Acad. of Sci., Moscow, Russia
pp. 138
C. Metra, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Favalli, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
B. Ricco, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
pp. 145
N. Gaitanis, Inst. of Inf., NCSR "Demokritos", Athens, Greece
D. Gizopoulos, Inst. of Inf., NCSR "Demokritos", Athens, Greece
A. Paschalis, Inst. of Inf., NCSR "Demokritos", Athens, Greece
P. Kostarakis, Inst. of Inf., NCSR "Demokritos", Athens, Greece
pp. 151
S.S. Gorshe, NEC America Inc., Hillsboro, OR, USA
B. Bose, NEC America Inc., Hillsboro, OR, USA
pp. 157
Vl.V. Saposhnikov, St. Petersburg State Univ., Russia
A. Dmitriev, St. Petersburg State Univ., Russia
M. Goessel, St. Petersburg State Univ., Russia
V.V. Saposhnikov, St. Petersburg State Univ., Russia
pp. 162
J.-L. Dufour, RAMS Dept., Matra Transp. Int., Montrouge, France
pp. 169
Session 6: Fault Diagnosis and Dictionaries
V. Boppana, Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA
I. Hartanto, Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA
W.K. Fuchs, Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA
pp. 174
J.W. Sheppard, ARINC Res. Corp., Annapolis, MD, USA
W.R. Simpson, ARINC Res. Corp., Annapolis, MD, USA
pp. 180
S. Chakravarty, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
pp. 192
S. Venkataraman, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
I. Hartanto, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
W. Kent Fuchs, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 198
W.K. Huang, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
X.T. Chen, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
F. Lombardi, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 204
Panel Session 1:
Panel Session 2
Session 7: Sequential Circuit Testing
M.S. Hsiao, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
E.M. Rudnick, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 216
K.B. Rajan, Sun Microsyst., Menlo Park, CA, USA
D.E. Long, Sun Microsyst., Menlo Park, CA, USA
M. Abramovici, Sun Microsyst., Menlo Park, CA, USA
pp. 224
R.H. Klenke, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
J.H. Aylor, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
J.M. Wolf, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
pp. 231
M. Keim, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
B. Becker, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
B. Stenner, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
pp. 240
J.A. Wehbeh, MIPS Technol. Inc., Mountain View, CA, USA
D.G. Saab, MIPS Technol. Inc., Mountain View, CA, USA
pp. 246
Session 8: Multi-Chip Modules and Memory Testing
T.R. Damarla, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
M.J. Chung, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
Wei Su, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
G.T. Michael, Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
pp. 254
B.C. Kim, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
A. Chatterjee, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
M. Swaminathan, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 260
A.J. van de Goor, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
G.N. Gaydadjiev, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
V.G. Mikitjuk, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
V.N. Yarmolik, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
pp. 272
M.P. Kluth, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
F. Simon, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
J.Y. Le Gall, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
E. Muller, Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
pp. 281
Session 9: Delay Fault Testing
P. Uppaluri, Avant Corp., Research Triangle Park, NC, USA
U. Sparmann, Avant Corp., Research Triangle Park, NC, USA
I. Pomeranz, Avant Corp., Research Triangle Park, NC, USA
pp. 288
S. Cremoux, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
C. Fagot, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
P. Girard, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
C. Landrault, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
S. Pravossoudovitch, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 296
S. Crepaux-Motte, Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France
M. Jacomino, Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France
R. David, Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France
pp. 308
M. Sivaraman, Carnegie Mellon Univ., Pittsburgh, PA, USA
A.J. Strojwas, Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 316
Session 10: Non-Traditional Testing
P. Wohl, Microelectron. Div., IBM Corp., Essex Junction, VT, USA
J. Waicukauski, Microelectron. Div., IBM Corp., Essex Junction, VT, USA
M. Graf, Microelectron. Div., IBM Corp., Essex Junction, VT, USA
pp. 324
J.T.-Y. Chang, Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA
pp. 332
M. Renovell, Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
P. Huc, Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Y. Bertrand, Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 338
Yuyun Liao, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
D.M.H. Walker, Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
pp. 344
A. Chatterjee, Georgia Inst. of Technol., Atlanta, GA, USA
R. Jayabharathi, Georgia Inst. of Technol., Atlanta, GA, USA
P. Pant, Georgia Inst. of Technol., Atlanta, GA, USA
J.A. Abraham, Georgia Inst. of Technol., Atlanta, GA, USA
pp. 354
Panel Session 3:
Panel Session 4:
Panel Session 5:
Session 11: Advances in Built-In Self-Test
M. Soufi, Ecole Polytech. de Montreal, Que., Canada
S. Rochon, Ecole Polytech. de Montreal, Que., Canada
Y. Savaria, Ecole Polytech. de Montreal, Que., Canada
B. Kaminska, Ecole Polytech. de Montreal, Que., Canada
pp. 368
D. Kagaris, Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
S. Tragoudas, Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
pp. 374
A.P. Stroele, Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany
pp. 380
C. Stroud, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
S. Konala, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Ping Chen, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
M. Abramovici, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
pp. 387
N.A. Touba, Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA
pp. 393
Session 12: Fault Modeling and Defect Coverage
J. Khare, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
W. Maly, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
N. Tiday, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 405
P. Dahlgren, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
P. Liden, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
pp. 414
H. Konuk, California Design Center, Hewlett-Packard Co., CA, USA
F.J. Ferguson, California Design Center, Hewlett-Packard Co., CA, USA
pp. 422
S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S. Kajihara, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 430
Session 13: Fault Simulation and Test Generation
M.B. Amin, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
B. Vinnakota, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
pp. 438
A. Vergis, Dept. of Comput. Eng., Patras Univ., Greece
C. Tobon, Dept. of Comput. Eng., Patras Univ., Greece
pp. 444
W.K. Huang, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
F. Lombardi, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 450
T. Lee, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
I.N. Hajj, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
E.M. Rudnick, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
J.H. Patel, Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
pp. 456
D.K. Das, Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
U.K. Bhattacharya, Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
B.B. Bhattacharya, Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
pp. 463
Session 14: Mixed-Signal Test Techniques
H.H. Zheng, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
A. Balivada, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
J.A. Abraham, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
pp. 470
K. Arabi, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
B. Kaminska, Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
pp. 476
B. Vinnakota, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
pp. 483
Chen-Yang Pan, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 489
F. Mohamed, TIMA Lab., Grenoble, France
M. Manzouki, TIMA Lab., Grenoble, France
A. Biassizo, TIMA Lab., Grenoble, France
F. Novak, TIMA Lab., Grenoble, France
pp. 495
Panel Session 6:
Panel Session 7:
Panel Session 8:
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