The Community for Technology Leaders
RSS Icon
Subscribe
2013 IEEE 31st VLSI Test Symposium (VTS) (1996)
Princeton, NJ
Apr. 28, 1996 to May 1, 1996
ISBN: 0-8186-7304-4
TABLE OF CONTENTS
Foreword (PDF)
pp. xiii
pp. xvi
Reviewers (PDF)
pp. xix
Keynote Address
Invited Talk
Session 1: Design for Testability
N.A. Touba , Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey , Center for Reliable Comput., Stanford Univ., CA, USA
pp. 2
R.D. Blanton , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
J.P. Hayes , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 9
F. Muradali , Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
J. Rajski , Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
pp. 17
S. Barbagallo , Central R&D Dept., Italy
M. Lobetti Bodoni , Central R&D Dept., Italy
D. Medina , Central R&D Dept., Italy
F. Corno , Central R&D Dept., Italy
P. Prinetto , Central R&D Dept., Italy
M. Sonza Reorda , Central R&D Dept., Italy
pp. 26
K. Heragu , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
V.D. Agrawal , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 32
Session 2: Testability of Analog Circuits
D. Vazquez , Centro Nacional de Microelectron., Seville Univ., Spain
J.L. Huertas , Centro Nacional de Microelectron., Seville Univ., Spain
A. Rueda , Centro Nacional de Microelectron., Seville Univ., Spain
pp. 42
E. Felt , Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
A. Sangiovanni-Vincentelli , Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
pp. 48
M. Renovell , Lab. d'Inf., Robotique et Microelectronique, Montpellier, France
F. Azais , Lab. d'Inf., Robotique et Microelectronique, Montpellier, France
Y. Bertrand , Lab. d'Inf., Robotique et Microelectronique, Montpellier, France
pp. 54
M. Ehsanian , Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
B. Kaminska , Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
K. Arabi , Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
pp. 60
J. Van Spaandonk , Eindhoven Univ. of Technol., Netherlands
T.A.M. Kevenaar , Eindhoven Univ. of Technol., Netherlands
pp. 66
Session 3: Synthesis for Testability
S. Bhattacharya , NEC Res. Inst., Princeton, NJ, USA
S. Dey , NEC Res. Inst., Princeton, NJ, USA
pp. 74
X. Wendling , Inst. Nat. Polytech. de Grenoble, France
R. Rochet , Inst. Nat. Polytech. de Grenoble, France
R. Leveugle , Inst. Nat. Polytech. de Grenoble, France
pp. 81
R.B. Norwood , Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey , Center for Reliable Comput., Stanford Univ., CA, USA
pp. 87
Y. Lu , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 93
M. Miegler , Inst. of Comput.-Aided Circuit Design, Erlangen-Nurnberg Univ., Germany
W. Wolz , Inst. of Comput.-Aided Circuit Design, Erlangen-Nurnberg Univ., Germany
pp. 99
Session 4: IDDQ Testing
A. Ferre , Univ. Politecnica de Catalunya, Barcelona, Spain
J. Figueras , Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 106
A.E. Gattiker , Carnegie Mellon Univ., Pittsburgh, PA, USA
W. Maly , Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 112
S.P. Athan , Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA
D.L. Landis , Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA
S.A. Al-Arian , Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA
pp. 118
S. Manich , Univ. Politecnica de Catalunya, Barcelona, Spain
M. Nicolaidis , Univ. Politecnica de Catalunya, Barcelona, Spain
J. Figueras , Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 124
H. Balachandran , Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
D.M.H. Walker , Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
pp. 130
Session 5: On-Line Testing
E.S. Sogomonyan , Inst. of Control Sci., Acad. of Sci., Moscow, Russia
M. Gossel , Inst. of Control Sci., Acad. of Sci., Moscow, Russia
pp. 138
C. Metra , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Favalli , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
B. Ricco , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
pp. 145
N. Gaitanis , Inst. of Inf., NCSR "Demokritos", Athens, Greece
D. Gizopoulos , Inst. of Inf., NCSR "Demokritos", Athens, Greece
A. Paschalis , Inst. of Inf., NCSR "Demokritos", Athens, Greece
P. Kostarakis , Inst. of Inf., NCSR "Demokritos", Athens, Greece
pp. 151
S.S. Gorshe , NEC America Inc., Hillsboro, OR, USA
B. Bose , NEC America Inc., Hillsboro, OR, USA
pp. 157
Vl.V. Saposhnikov , St. Petersburg State Univ., Russia
A. Dmitriev , St. Petersburg State Univ., Russia
M. Goessel , St. Petersburg State Univ., Russia
V.V. Saposhnikov , St. Petersburg State Univ., Russia
pp. 162
J.-L. Dufour , RAMS Dept., Matra Transp. Int., Montrouge, France
pp. 169
Session 6: Fault Diagnosis and Dictionaries
V. Boppana , Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA
I. Hartanto , Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA
W.K. Fuchs , Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA
pp. 174
J.W. Sheppard , ARINC Res. Corp., Annapolis, MD, USA
W.R. Simpson , ARINC Res. Corp., Annapolis, MD, USA
pp. 180
S. Chakravarty , Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
pp. 192
S. Venkataraman , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
I. Hartanto , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
W. Kent Fuchs , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 198
W.K. Huang , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
X.T. Chen , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
F. Lombardi , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 204
Panel Session 1:
Panel Session 2
Session 7: Sequential Circuit Testing
M.S. Hsiao , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
E.M. Rudnick , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 216
K.B. Rajan , Sun Microsyst., Menlo Park, CA, USA
D.E. Long , Sun Microsyst., Menlo Park, CA, USA
M. Abramovici , Sun Microsyst., Menlo Park, CA, USA
pp. 224
R.H. Klenke , Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
J.H. Aylor , Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
J.M. Wolf , Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
pp. 231
M. Keim , Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
B. Becker , Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
B. Stenner , Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
pp. 240
J.A. Wehbeh , MIPS Technol. Inc., Mountain View, CA, USA
D.G. Saab , MIPS Technol. Inc., Mountain View, CA, USA
pp. 246
Session 8: Multi-Chip Modules and Memory Testing
T.R. Damarla , Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
M.J. Chung , Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
Wei Su , Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
G.T. Michael , Nat. Res. Council, US Army Res. Labs., Fort Monmouth, NJ, USA
pp. 254
B.C. Kim , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
A. Chatterjee , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
M. Swaminathan , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 260
A.J. van de Goor , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
G.N. Gaydadjiev , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
V.G. Mikitjuk , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
V.N. Yarmolik , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
pp. 272
M.P. Kluth , Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
F. Simon , Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
J.Y. Le Gall , Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
E. Muller , Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, Franc
pp. 281
Session 9: Delay Fault Testing
P. Uppaluri , Avant Corp., Research Triangle Park, NC, USA
U. Sparmann , Avant Corp., Research Triangle Park, NC, USA
I. Pomeranz , Avant Corp., Research Triangle Park, NC, USA
pp. 288
S. Cremoux , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
C. Fagot , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
P. Girard , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
C. Landrault , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
S. Pravossoudovitch , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 296
V.A. Vardanian , Inst. of Inf. & Autom. Problems, Acad. of Sci., Yerevan, Armenia
pp. 302
S. Crepaux-Motte , Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France
M. Jacomino , Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France
R. David , Lab. d'Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d'Heres, France
pp. 308
M. Sivaraman , Carnegie Mellon Univ., Pittsburgh, PA, USA
A.J. Strojwas , Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 316
Session 10: Non-Traditional Testing
P. Wohl , Microelectron. Div., IBM Corp., Essex Junction, VT, USA
J. Waicukauski , Microelectron. Div., IBM Corp., Essex Junction, VT, USA
M. Graf , Microelectron. Div., IBM Corp., Essex Junction, VT, USA
pp. 324
J.T.-Y. Chang , Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey , Center for Reliable Comput., Stanford Univ., CA, USA
pp. 332
M. Renovell , Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
P. Huc , Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Y. Bertrand , Lab. d'Inf., Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 338
Yuyun Liao , Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
D.M.H. Walker , Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
pp. 344
A. Chatterjee , Georgia Inst. of Technol., Atlanta, GA, USA
R. Jayabharathi , Georgia Inst. of Technol., Atlanta, GA, USA
P. Pant , Georgia Inst. of Technol., Atlanta, GA, USA
J.A. Abraham , Georgia Inst. of Technol., Atlanta, GA, USA
pp. 354
Panel Session 3:
Panel Session 4:
Panel Session 5:
Session 11: Advances in Built-In Self-Test
M. Soufi , Ecole Polytech. de Montreal, Que., Canada
S. Rochon , Ecole Polytech. de Montreal, Que., Canada
Y. Savaria , Ecole Polytech. de Montreal, Que., Canada
B. Kaminska , Ecole Polytech. de Montreal, Que., Canada
pp. 368
D. Kagaris , Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
S. Tragoudas , Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
pp. 374
A.P. Stroele , Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany
pp. 380
C. Stroud , Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
S. Konala , Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Ping Chen , Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
M. Abramovici , Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
pp. 387
N.A. Touba , Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey , Center for Reliable Comput., Stanford Univ., CA, USA
pp. 393
Session 12: Fault Modeling and Defect Coverage
T.J. Powell , Texas Instrum. Inc., Dallas, TX, USA
pp. 400
J. Khare , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
W. Maly , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
N. Tiday , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 405
P. Dahlgren , Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
P. Liden , Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
pp. 414
H. Konuk , California Design Center, Hewlett-Packard Co., CA, USA
F.J. Ferguson , California Design Center, Hewlett-Packard Co., CA, USA
pp. 422
S.M. Reddy , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S. Kajihara , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 430
Session 13: Fault Simulation and Test Generation
M.B. Amin , Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
B. Vinnakota , Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
pp. 438
A. Vergis , Dept. of Comput. Eng., Patras Univ., Greece
C. Tobon , Dept. of Comput. Eng., Patras Univ., Greece
pp. 444
W.K. Huang , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
F. Lombardi , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 450
T. Lee , Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
I.N. Hajj , Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
E.M. Rudnick , Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
J.H. Patel , Gen. Syst. Lab., Hewlett-Packard Co., Roseville, CA, USA
pp. 456
D.K. Das , Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
U.K. Bhattacharya , Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
B.B. Bhattacharya , Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
pp. 463
Session 14: Mixed-Signal Test Techniques
H.H. Zheng , Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
A. Balivada , Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
J.A. Abraham , Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
pp. 470
K. Arabi , Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
B. Kaminska , Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
pp. 476
B. Vinnakota , Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
pp. 483
Chen-Yang Pan , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Kwang-Ting Cheng , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 489
F. Mohamed , TIMA Lab., Grenoble, France
M. Manzouki , TIMA Lab., Grenoble, France
A. Biassizo , TIMA Lab., Grenoble, France
F. Novak , TIMA Lab., Grenoble, France
pp. 495
Panel Session 6:
Panel Session 7:
pp. 504
Panel Session 8:
Author Index (PDF)
pp. 508
9 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool