Challenges in Future Technologies

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14th IEEE VLSI Test Symposium (VTS '96)

Princeton, NJ

April 28-May 01

ISBN: 0-8186-7304-4

	ASCII Text	x
	"Challenges in Future Technologies," VLSI Test Symposium, IEEE, pp. xxviii, 14th IEEE VLSI Test Symposium (VTS '96), 1996.

	BibTex	x
	@article{ 10.1109/VTS.1996.10007, author = {}, title = {Challenges in Future Technologies}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1996}, isbn = {0-8186-7304-4}, pages = {xxviii}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1996.10007}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Challenges in Future Technologies SN - 0-8186-7304-4 SP EP PY - 1996 VL - 0 JA - VLSI Test Symposium, IEEE ER -

Citation:

"Challenges in Future Technologies," vts, pp.xxviii, 14th IEEE VLSI Test Symposium (VTS '96), 1996

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