Current signatures [VLSI circuit testing]

A.E. Gattiker; W. Maly

doi:10.1109/VTEST.1996.510844

V
VTS
1996
14th IEEE VLSI Test Symposium (VTS '96)
Abstract - Current signatures [VLSI circuit testing]

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14th IEEE VLSI Test Symposium (VTS '96)

Current signatures [VLSI circuit testing]

Princeton, NJ

April 28-May 01

ISBN: 0-8186-7304-4

	ASCII Text	x
	A.E. Gattiker, W. Maly, "Current signatures [VLSI circuit testing]," VLSI Test Symposium, IEEE, pp. 112, 14th IEEE VLSI Test Symposium (VTS '96), 1996.

	BibTex	x
	@article{ 10.1109/VTEST.1996.510844, author = {A.E. Gattiker and W. Maly}, title = {Current signatures [VLSI circuit testing]}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1996}, isbn = {0-8186-7304-4}, pages = {112}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510844}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Current signatures [VLSI circuit testing] SN - 0-8186-7304-4 SP EP A1 - A.E. Gattiker, A1 - W. Maly, PY - 1996 KW - VLSI; integrated circuit testing; CMOS integrated circuits; VLSI circuit testing; I/sub DDQ/ testing; current signature; passive defects; active defects VL - 0 JA - VLSI Test Symposium, IEEE ER -

A.E. Gattiker, Carnegie Mellon Univ., Pittsburgh, PA, USA

W. Maly, Carnegie Mellon Univ., Pittsburgh, PA, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510844

In this paper we demonstrate that performing I/sub DDQ/ testing against a single threshold current value does not make sense. In place of the single current threshold we propose the "current signature". A die's current signature takes into account the relative measured level of current on all applied I/sub DDQ/ vectors. Preliminary results of current signature applications are discussed as well.

Index Terms:

VLSI; integrated circuit testing; CMOS integrated circuits; VLSI circuit testing; I/sub DDQ/ testing; current signature; passive defects; active defects

Citation:

A.E. Gattiker, W. Maly, "Current signatures [VLSI circuit testing]," vts, pp.112, 14th IEEE VLSI Test Symposium (VTS '96), 1996

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