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2013 IEEE 31st VLSI Test Symposium (VTS) (1995)
Princeton, New Jersey
Apr. 30, 1995 to May 3, 1995
ISBN: 0-8186-7000-2
TABLE OF CONTENTS
Foreword (PDF)
pp. xii
pp. xiii
Reviewers (PDF)
pp. xvi
pp. xx
Session 1: Advanced Test Pattern Generation Methods
D.E. Long , AT&T Bell Labs., Murray Hill, NJ, USA
M.A. Iyer , AT&T Bell Labs., Murray Hill, NJ, USA
M. Abramovici , AT&T Bell Labs., Murray Hill, NJ, USA
pp. 0004
M.C. Hansen , Advanced Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI, USA
J.P. Hayes , Advanced Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI, USA
pp. 0020
F. Corno , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
P. Prinetto , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M. Rebaudengo , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M.S. Reorda , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
E. Veiluva , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
pp. 0029
D. Gizopoulos , Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
D. Nikolos , Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
A. Paschalis , Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
pp. 0035
Session 2: Mixed-Signal Circuit Test
A. Balivada , Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Y. Hoskote , Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
J.A. Abraham , Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
pp. 0042
D. Vazquez , Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
A. Rueda , Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
J.L. Huertas , Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
pp. 0048
S. Khaled , Ecole Polytech., Montreal, Que., Canada
B. Kaminska , Ecole Polytech., Montreal, Que., Canada
B. Courtois , Ecole Polytech., Montreal, Que., Canada
M. Lubaszewski , Ecole Polytech., Montreal, Que., Canada
pp. 0054
S. Sunter , Telecom Microelectron. Centre, Northern Telecom Electron. Ltd., Nepean, Ont., Canada
pp. 0060
L. Sebaa , Western Digital Corp., Irvine, CA, USA
N. Gardner , Western Digital Corp., Irvine, CA, USA
R. Neidorff , Western Digital Corp., Irvine, CA, USA
R. Valley , Western Digital Corp., Irvine, CA, USA
pp. 0066
Session 3: Defect Coverage and Test Quality
L.-C. Wang , Texas Univ., Austin, TX, USA
P.R. Mercer , Texas Univ., Austin, TX, USA
S.W. Kao , Texas Univ., Austin, TX, USA
T.W. Williams , Texas Univ., Austin, TX, USA
pp. 0074
P.C. Maxwell , Hewlett-Packard Co., USA
pp. 0084
V. Dabholkar , State Univ. of New York, Buffalo, NY, USA
S. Chakravarty , State Univ. of New York, Buffalo, NY, USA
J. Najm , State Univ. of New York, Buffalo, NY, USA
J. Patel , State Univ. of New York, Buffalo, NY, USA
pp. 0089
J.A. Segura , Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
M. Roca , Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
D. Mateo , Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
A. Rubio , Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
pp. 0095
J. Arguelles , Dept. de Electron., Cantabria Univ., Santander, Spain
M.J. Lopez , Dept. de Electron., Cantabria Univ., Santander, Spain
J. Blanco , Dept. de Electron., Cantabria Univ., Santander, Spain
M. Martinez , Dept. de Electron., Cantabria Univ., Santander, Spain
S. Bracho , Dept. de Electron., Cantabria Univ., Santander, Spain
pp. 0101
Session 4: Advanced BIST Approaches
J. Savir , IBM Corp., Hopewell Junction, NY, USA
pp. 0108
A.P. Stroele , Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany
pp. 0118
S.K. Mukund , Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey , Center for Reliable Comput., Stanford Univ., CA, USA
T.R.N. Rao , Center for Reliable Comput., Stanford Univ., CA, USA
pp. 0125
N. Mukherjee , Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
H. Kassab , Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Rajski , Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Tyszer , Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
pp. 0132
J.A. Floyd , Semicond Product Center, Motorola Inc., Austin, TX, USA
M. Perry , Semicond Product Center, Motorola Inc., Austin, TX, USA
pp. 0140
Session 5: Synthesis for Testability
H. Yotsuyanagi , Dept. of Appl. Phys., Osaka Univ., Japan
S. Kajihara , Dept. of Appl. Phys., Osaka Univ., Japan
K. Kinoshita , Dept. of Appl. Phys., Osaka Univ., Japan
pp. 0152
F.F. Hsu , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 0158
Ting-Yu Kuo , Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Chun-Yeh Liu , Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
K.K. Saluja , Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
pp. 0164
K. Vahidi , Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
A. Orailoglu , Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
pp. 0170
Xinli Gu , Dept. of Comput. & Inf. Sci., Linkoping Univ., Sweden
pp. 0176
Session 6: Fault Modeling
M. Renovell , Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
P. Huc , Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Y. Bertrand , Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 0184
Ding Lu , Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
C.Q. Tong , Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
pp. 0190
S.R. Makar , Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey , Center for Reliable Comput., Stanford Univ., CA, USA
pp. 0196
V.H. Champac , Inst. Nacional de Astrofisica, Opt. y Electron., Puebla, Mexico
J. Figueras , Inst. Nacional de Astrofisica, Opt. y Electron., Puebla, Mexico
pp. 0202
P. Liden , Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
P. Dahlgren , Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
pp. 0208
Session 7: Fault Simulation I
T.J. Chakraborty , AT&T Bell Labs., Princeton, NJ, USA
V.D. Agrawal , AT&T Bell Labs., Princeton, NJ, USA
pp. 0216
R. Nair , Synopsys Inc., Mountain View, CA, USA
Dong Sam Ha , Synopsys Inc., Mountain View, CA, USA
pp. 0221
M. Riedel , MACS Lab., McGill Univ., Montreal, Que., Canada
J. Rajski , MACS Lab., McGill Univ., Montreal, Que., Canada
pp. 0227
A. Bogliolo , DEIS, Bologna Univ., Italy
M. Damiani , DEIS, Bologna Univ., Italy
P. Olivo , DEIS, Bologna Univ., Italy
B. Ricco , DEIS, Bologna Univ., Italy
pp. 0235
Session 8: Fault Diagnosis
C.E. Stroud , Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
T.R. Damarla , Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
pp. 0244
S. Edirisooriya , Motorola Comput. Group, USA
G. Edirisooriya , Motorola Comput. Group, USA
pp. 0250
T. Liu , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
F. Lombardi , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
J. Salinas , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 0256
C. Thibeault , Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
pp. 0262
Session 9: Design for Testability
S. Narayanan , Sun Microsyst. Inc., Mountain View, CA, USA
M.A. Breuer , Sun Microsyst. Inc., Mountain View, CA, USA
pp. 0270
Kwang-Ting Cheng , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 0277
A. Khoche , Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
E. Brunvand , Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
pp. 0283
M. Soufi , Ecole Polytech. de Montreal, Que., Canada
Y. Savaria , Ecole Polytech. de Montreal, Que., Canada
B. Kaminska , Ecole Polytech. de Montreal, Que., Canada
pp. 0290
O.A. Petlin , Dept. of Comput. Sci., Manchester Univ., UK
S.B. Furber , Dept. of Comput. Sci., Manchester Univ., UK
pp. 0296
Session 10: Iddq Testing
M. Dalpasso , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Favalli , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
P. Olivo , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
pp. 0304
R.S. Reddy , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S.M. Reddy , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S. Kajihara , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 0310
U. Mahlstedt , Inst. fur Theor. Elektrotech., Hannover Univ., Germany
J. Alt , Inst. fur Theor. Elektrotech., Hannover Univ., Germany
M. Heinitz , Inst. fur Theor. Elektrotech., Hannover Univ., Germany
pp. 0317
J. Rius , Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
J. Figueras , Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 0324
M.B. Santos , INESC, Lisbon, Portugal
M. Simoes , INESC, Lisbon, Portugal
I. Teixeira , INESC, Lisbon, Portugal
J.P. Teixeira , INESC, Lisbon, Portugal
pp. 0330
Session 11: Automatic Test Pattern Generation
F. Corno , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
P. Prinetto , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M. Sonza Reorda , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
U. Glaser , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
H.T. Vierhaus , Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
pp. 0338
T. Inoue , Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
H. Maeda , Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
H. Fujiwara , Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
pp. 0344
A. Zemva , Ljubljana Univ., Slovenia
F. Brglez , Ljubljana Univ., Slovenia
pp. 0350
M.H. Konijnenburg , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
J.T. van der Linden , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
A.J. van de Goor , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
pp. 0358
B. Vinnakota , Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
N.J. Stessman , Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
pp. 0367
Session 12: Delay Fault Testing
A. Krstic , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Kwang-Ting Cheng , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 0374
P. Girard , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
C. Landrault , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
S. Pravossoudovitch , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
B. Rodriguez , Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 0380
H. Hengster , Dept. of Comput. Sci., Frankfurt Univ., Germany
R. Drechsler , Dept. of Comput. Sci., Frankfurt Univ., Germany
B. Becker , Dept. of Comput. Sci., Frankfurt Univ., Germany
pp. 0387
I.P. Shaik , Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
M.L. Bushnell , Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 0393
W. Ke , Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
P.R. Menon , Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
pp. 0400
Session 13: Test Pattern Generation for BIST
N.A. Touba , Dept. of Electr. Eng., Stanford Univ., CA, USA
E.J. McCluskey , Dept. of Electr. Eng., Stanford Univ., CA, USA
pp. 0410
M. Chatterjee , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
D.K. Pradhan , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 0417
N. Zacharia , Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Rajski , Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Tyszer , Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
pp. 0426
S. Lejmi , Ecole Polytech. de Montreal, Que., Canada
B. Kaminska , Ecole Polytech. de Montreal, Que., Canada
B. Ayari , Ecole Polytech. de Montreal, Que., Canada
pp. 0434
G. Kemnitz , Inst. fur Tech. Inf., Tech. Univ. Dresden, Germany
pp. 0440
Session 14: Self-Checking Systems I
S.K. Shoukourian , Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
A.G. Kostanian , Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
V.A. Margarian , Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
A.A. Ashour , Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
pp. 0448
A. Bogliolo , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Damiani , Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
pp. 0454
S. Brown , AMCC, San Diego, CA, USA
G. Gutierrez , AMCC, San Diego, CA, USA
R. Nelson , AMCC, San Diego, CA, USA
C. VanKrevelen , AMCC, San Diego, CA, USA
pp. 0467
W.W. Weber , Dept. of Electr. Eng., Auburn Univ., AL, USA
A.D. Singh , Dept. of Electr. Eng., Auburn Univ., AL, USA
pp. 0472
Best Paper - 1994
J. Carletta , Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
C. Papachristou , Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
pp. 0486
Author Index (PDF)
pp. 0492
5 ms
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