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13th IEEE VLSI Test Symposium (VTS'95) Princeton, New Jersey April 30-May 03 ISBN: 0-8186-7000-2 Table of Contents
 | Session 1: Advanced Test Pattern Generation Methods |
D.E. Long, AT&T Bell Labs., Murray Hill, NJ, USA
M.A. Iyer, AT&T Bell Labs., Murray Hill, NJ, USA pp. 0004
M.C. Hansen, Advanced Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI, USA
J.P. Hayes, Advanced Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI, USA pp. 0020
F. Corno, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
P. Prinetto, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M. Rebaudengo, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M.S. Reorda, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
E. Veiluva, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy pp. 0029
D. Gizopoulos, Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
D. Nikolos, Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
A. Paschalis, Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece pp. 0035
 | Session 2: Mixed-Signal Circuit Test |
A. Balivada, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Y. Hoskote, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
J.A. Abraham, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA pp. 0042
D. Vazquez, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
A. Rueda, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
J.L. Huertas, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain pp. 0048
S. Khaled, Ecole Polytech., Montreal, Que., Canada pp. 0054
S. Sunter, Telecom Microelectron. Centre, Northern Telecom Electron. Ltd., Nepean, Ont., Canada pp. 0060
L. Sebaa, Western Digital Corp., Irvine, CA, USA
N. Gardner, Western Digital Corp., Irvine, CA, USA
R. Valley, Western Digital Corp., Irvine, CA, USA pp. 0066
 | Session 3: Defect Coverage and Test Quality |
J. Najm, State Univ. of New York, Buffalo, NY, USA
J. Patel, State Univ. of New York, Buffalo, NY, USA pp. 0089
J.A. Segura, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
M. Roca, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
D. Mateo, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
A. Rubio, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain pp. 0095
J. Arguelles, Dept. de Electron., Cantabria Univ., Santander, Spain
M.J. Lopez, Dept. de Electron., Cantabria Univ., Santander, Spain
J. Blanco, Dept. de Electron., Cantabria Univ., Santander, Spain
M. Martinez, Dept. de Electron., Cantabria Univ., Santander, Spain
S. Bracho, Dept. de Electron., Cantabria Univ., Santander, Spain pp. 0101
 | Session 4: Advanced BIST Approaches |
J. Savir, IBM Corp., Hopewell Junction, NY, USA pp. 0108
A.P. Stroele, Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany pp. 0118
S.K. Mukund, Center for Reliable Comput., Stanford Univ., CA, USA
T.R.N. Rao, Center for Reliable Comput., Stanford Univ., CA, USA pp. 0125
N. Mukherjee, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
H. Kassab, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Rajski, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Tyszer, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada pp. 0132
J.A. Floyd, Semicond Product Center, Motorola Inc., Austin, TX, USA
M. Perry, Semicond Product Center, Motorola Inc., Austin, TX, USA pp. 0140
 | Session 5: Synthesis for Testability |
F.F. Hsu, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA pp. 0158
Ting-Yu Kuo, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Chun-Yeh Liu, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
K.K. Saluja, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA pp. 0164
K. Vahidi, Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
A. Orailoglu, Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA pp. 0170
Xinli Gu, Dept. of Comput. & Inf. Sci., Linkoping Univ., Sweden pp. 0176
 | Session 6: Fault Modeling |
M. Renovell, Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
P. Huc, Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Y. Bertrand, Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France pp. 0184
Ding Lu, Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
C.Q. Tong, Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA pp. 0190
S.R. Makar, Center for Reliable Comput., Stanford Univ., CA, USA pp. 0196
V.H. Champac, Inst. Nacional de Astrofisica, Opt. y Electron., Puebla, Mexico
J. Figueras, Inst. Nacional de Astrofisica, Opt. y Electron., Puebla, Mexico pp. 0202
P. Liden, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
P. Dahlgren, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden pp. 0208
 | Session 7: Fault Simulation I |
R. Nair, Synopsys Inc., Mountain View, CA, USA pp. 0221
M. Riedel, MACS Lab., McGill Univ., Montreal, Que., Canada
J. Rajski, MACS Lab., McGill Univ., Montreal, Que., Canada pp. 0227
 | Session 8: Fault Diagnosis |
C.E. Stroud, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
T.R. Damarla, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA pp. 0244
T. Liu, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
F. Lombardi, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
J. Salinas, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA pp. 0256
C. Thibeault, Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada pp. 0262
 | Session 9: Design for Testability |
M.A. Breuer, Sun Microsyst. Inc., Mountain View, CA, USA pp. 0270
Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA pp. 0277
A. Khoche, Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
E. Brunvand, Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA pp. 0283
M. Soufi, Ecole Polytech. de Montreal, Que., Canada
Y. Savaria, Ecole Polytech. de Montreal, Que., Canada pp. 0290
O.A. Petlin, Dept. of Comput. Sci., Manchester Univ., UK
S.B. Furber, Dept. of Comput. Sci., Manchester Univ., UK pp. 0296
 | Session 10: Iddq Testing |
M. Dalpasso, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Favalli, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
P. Olivo, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy pp. 0304
R.S. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S. Kajihara, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA pp. 0310
U. Mahlstedt, Inst. fur Theor. Elektrotech., Hannover Univ., Germany
J. Alt, Inst. fur Theor. Elektrotech., Hannover Univ., Germany
M. Heinitz, Inst. fur Theor. Elektrotech., Hannover Univ., Germany pp. 0317
J. Rius, Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
J. Figueras, Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain pp. 0324
 | Session 11: Automatic Test Pattern Generation |
F. Corno, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
P. Prinetto, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M. Sonza Reorda, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
U. Glaser, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
H.T. Vierhaus, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy pp. 0338
T. Inoue, Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
H. Maeda, Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
H. Fujiwara, Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan pp. 0344
B. Vinnakota, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
N.J. Stessman, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA pp. 0367
 | Session 12: Delay Fault Testing |
A. Krstic, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA pp. 0374
P. Girard, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
C. Landrault, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
S. Pravossoudovitch, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
B. Rodriguez, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France pp. 0380
H. Hengster, Dept. of Comput. Sci., Frankfurt Univ., Germany
R. Drechsler, Dept. of Comput. Sci., Frankfurt Univ., Germany
B. Becker, Dept. of Comput. Sci., Frankfurt Univ., Germany pp. 0387
I.P. Shaik, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
M.L. Bushnell, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA pp. 0393
W. Ke, Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
P.R. Menon, Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA pp. 0400
 | Session 13: Test Pattern Generation for BIST |
N.A. Touba, Dept. of Electr. Eng., Stanford Univ., CA, USA pp. 0410
M. Chatterjee, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
D.K. Pradhan, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA pp. 0417
N. Zacharia, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Rajski, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Tyszer, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada pp. 0426
S. Lejmi, Ecole Polytech. de Montreal, Que., Canada
B. Ayari, Ecole Polytech. de Montreal, Que., Canada pp. 0434
G. Kemnitz, Inst. fur Tech. Inf., Tech. Univ. Dresden, Germany pp. 0440
 | Session 14: Self-Checking Systems I |
S.K. Shoukourian, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
A.G. Kostanian, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
V.A. Margarian, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
A.A. Ashour, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia pp. 0448
A. Bogliolo, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Damiani, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy pp. 0454
W.W. Weber, Dept. of Electr. Eng., Auburn Univ., AL, USA
A.D. Singh, Dept. of Electr. Eng., Auburn Univ., AL, USA pp. 0472
 | Best Paper - 1994 |
J. Carletta, Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
C. Papachristou, Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA pp. 0486 Usage of this product signifies your acceptance of the Terms of Use.
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