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IEEE Virtual Reality Conference 2003 (VR 2003)
Optical Tracking Using Projective Invariant Marker Pattern Properties
Los Angeles, CA
March 22-March 26
ISBN: 0-7695-1882-6
| ASCII Text | x | ||
| Robert van Liere, Jurriaan D. Mulder, "Optical Tracking Using Projective Invariant Marker Pattern Properties," Virtual Reality Conference, IEEE, pp. 191, IEEE Virtual Reality Conference 2003 (VR 2003), 2003. | |||
| BibTex | x | ||
| @article{ 10.1109/VR.2003.1191138, author = {Robert van Liere and Jurriaan D. Mulder}, title = {Optical Tracking Using Projective Invariant Marker Pattern Properties}, journal ={Virtual Reality Conference, IEEE}, volume = {0}, year = {2003}, issn = {1087-8270}, pages = {191}, doi = {http://doi.ieeecomputersociety.org/10.1109/VR.2003.1191138}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Virtual Reality Conference, IEEE TI - Optical Tracking Using Projective Invariant Marker Pattern Properties SN - 1087-8270 SP EP A1 - Robert van Liere, A1 - Jurriaan D. Mulder, PY - 2003 KW - null VL - 0 JA - Virtual Reality Conference, IEEE ER - | |||
In this paper, we describe a new optical tracker algorithm for the tracking of interaction devices in virtual and augmented reality. The tracker uses invariant properties of marker patterns to efficiently identify and reconstruct the pose of these interaction devices. Since invariant properties are sensitive to noise in the 2D marker positions, an off-line training session is used to determine deviations in these properties. These deviations are taken into account when searching for the patterns once the tracker is used.
Citation:
Robert van Liere, Jurriaan D. Mulder, "Optical Tracking Using Projective Invariant Marker Pattern Properties," vr, pp.191, IEEE Virtual Reality Conference 2003 (VR 2003), 2003
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