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IEEE Virtual Reality Conference 2001 (VR 2001)
Simulator Sickness and Presence in a High FOV Virtual Environment
Yokohama, Japan
March 13-March 17
ISBN: 0-7695-0948-7
Citation:
A.F. Seay, D.M. Krum, L. Hodges, W. Ribarsky, "Simulator Sickness and Presence in a High FOV Virtual Environment," vr, pp.299, IEEE Virtual Reality Conference 2001 (VR 2001), 2001
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