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Yokohama, Japan
Mar. 13, 2001 to Mar. 17, 2001
ISBN: 0-7695-0948-7
pp: 299
A.F. Seay, D.M. Krum, L. Hodges, W. Ribarsky, "Simulator Sickness and Presence in a High FOV Virtual Environment", VR, 2001, Virtual Reality Conference, IEEE, Virtual Reality Conference, IEEE 2001, pp. 299, doi:10.1109/VR.2001.913806
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