loading...
  • V
  • VLSID
  • 2000
  • 13th International Conference on VLSI Design
Advanced Search 
13th International Conference on VLSI Design
Calcutta, India
January 04-January 07
ISBN: 0-7695-0487-6
Table of Contents
Reviewers (PDF)
pp. xxxii
Tutorials
KEYNOTE ADDRESS
Wireless Market Evolution
Thursday Plenary Talks: Chair: V. D. Agrawal, Bell Labs., Lucent Technologies
Session 1A: Low Power Design: Chairs: K. Roy, Purdue University: A. Chandrakasan, Massachusetts Institute of Technology
S. Savithri, Motorola India Electronics Ltd.
R. Venkatesan, Motorola India Electronics Ltd.
S. Bhaskar, Motorola India Electronics Ltd.
pp. 34
Amit Sinha, Massachusetts Institute of Technology
Anantha P. Chandrakasan, Massachusetts Institute of Technology
pp. 50
Session 1B: Formal Verification: Chairs: S. Malik, Princeton University: P. Dasgupta, Indian Institute of Technology
P. Bose, IBM T. J. Watson Research Center
J.A. Abraham, IBM T. J. Watson Research Center
pp. 58
Partha S Roop, University of New South Wales
A. Sowmya, University of New South Wales
S. Ramesh, Indian Institute of Technology
pp. 64
Basant Rajan, Tata Institute of Fundamental Research
R.K. Shyamasundar, Tata Institute of Fundamental Research
pp. 76
Session 1C: Embedded Systems I: Chairs: R. Moona, Indian Institute of Technology P.P. Das, Alumnus Software
Arvind Rajawat, Indian Institute of Technology
M. Balakrishnan, Indian Institute of Technology
Anshul Kumar, Indian Institute of Technology
pp. 92
T. Vinod Kumar Gupta, Indian Institute of Technology
Purvesh Sharma, Indian Institute of Technology
M Balakrishnan, Indian Institute of Technology
Sharad Malik, Princeton University
pp. 98
Aviral Shrivastava, Indian Institute of Technology
Mohit Kumar, Indian Institute of Technology
Sanjiv Kapoor, Indian Institute of Technology
Shashi Kumar, Indian Institute of Technology
M. Balakrishnan, Indian Institute of Technology
pp. 110
Session 2A: Digital Imaging I: Chairs: M.K. Kundu, Indian Statistical Institute S. Gupta, Intel
Kolin Paul, Bengal Engineering College (Deemed University)
Ranadeep Ghosal, Bengal Engineering College (Deemed University)
Biplab Sikdar, Bengal Engineering College (Deemed University)
Santashil Pal Chaudhuri, Indian Institute of Technology
D. Roy Choudhury, Indian Institute of Technology
pp. 140
Kolin Paul, Bengal Engineering College (Deemed University)
P. Pal Chaudhuri, Bengal Engineering College (Deemed University)
D. Roy Chowdhury, Indian Institute of Technology
pp. 144
Session 2B: Signal Integrity I: Chairs: S. Sapatnekar, University of Minnesota U. Narayanan, Intel
Jinseong Choi, Georgia Institute of Technology
Sunjun Chun, Georgia Institute of Technology
Nanju Na, Georgia Institute of Technology
Madhavan Swaminathan, Georgia Institute of Technology
Larry Smith, Georgia Institute of Technology
pp. 156
Mondira Deb Pant, Georgia Institute of Technology
Pankaj Pant, Georgia Institute of Technology
D. Scott Wills, Georgia Institute of Technology
Vivek Tiwari, Intel Corporation
pp. 162
Session 2C: Testing I: Chairs: S.M. Reddy, University of Iowa D.K. Das, Jadavpur University
J. Khare, Level One Communications
H. T. Heineken, Level One Communications
M. d'Abreu, Level One Communications
pp. 178
S.A. Shaikh, Level One Communications, Inc.
J. Khare, Level One Communications, Inc.
H.T. Heineken, Level One Communications, Inc.
pp. 185
C. Ouyang, Level One Communications, Inc.
H.T. Heineken, Level One Communications, Inc.
J. Khare, Level One Communications, Inc.
S. Shaikh, Level One Communications, Inc.
M d'Abreu, Level One Communications, Inc.
pp. 192
Raghuram S. Tupuri, Advanced Micro Devices
Jacob A. Abraham, University of Texas at Austin
Daniel G. Saab, Case Western Reserve University
pp. 198
Session 3A: High-level Synthesis: Chairs: N.K. Jha, Princeton University A. Kumar, Indian Institute of Technology
Session 3B: Layout & Floorplanning: Chairs: R. Suaya, Mentor Graphics C. Peterson, Intel
Abdel Ejnioui, University of South Florida
N. Ranganathan, University of South Florida
pp. 248
R.K. Dash, Indian Institute of Technology
T. Pramod, Indian Institute of Technology
V. Vasudevan, Indian Institute of Technology
M. Ramakrishna, Indian Institute of Technology
pp. 254
Sushil Chandra Jain, Indian Institute of Technology
Shashi Kumar, Indian Institute of Technology
Anshul Kumar, Indian Institute of Technology
pp. 262
Yu-Liang Wu, Chinese University of Hong Kong
Wangning Long, University of California at Los Angeles
Hongbing Fan, Shandong University
pp. 268
Swarup Bhunia, Delsoft India Pvt. Ltd.
Subhashis Majumder, Delsoft India Pvt. Ltd.
Ayan Sircar, Delsoft India Pvt. Ltd.
Susmita Sur-Kolay, Indian Statistical Institute
Bhargab B. Bhattacharya, Indian Statistical Institute
pp. 274
Helvio P. Peixoto, University of Texas at Austin
Margarida F. Jacome, University of Texas at Austin
Ander Royo, Technical University of Madrid
pp. 280
Session 3C: Testing II: Chairs: M. d'Abreu, Intel B.B. Bhattacharya, Indian Statistical Institute
Hiroki Wada, Nara Institute of Science and Technology
Toshimitsu Masuzawa, Nara Institute of Science and Technology
Kewal K. Saluja, Nara Institute of Science and Technology
Hideo Fujiwara, Nara Institute of Science and Technology
pp. 300
Rob Sumners, University of Texas at Austin
Jayanta Bhadra, University of Texas at Austin
Jacob Abraham, University of Texas at Austin
pp. 312
Banquet Address
Friday Plenary Talk: Chair: P.P. Chakrabarti, Indian Institute of Technology
Session 4A: Digital Imaging II: Chairs: A.K. Majumdar, Indian Institute of Technology T. Acharya, Intel
Bedabrata Pain, California Institute of Technology
Guang Yang, California Institute of Technology
Monico Ortiz, California Institute of Technology
Kenneth McCarty, California Institute of Technology
Julie Heynssens, California Institute of Technology
Bruce Hancock, California Institute of Technology
Thomas Cunningham, California Institute of Technology
Chris Wrigley, California Institute of Technology
Charlie Ho, California Institute of Technology
pp. 342
Session 4B: Design: Chairs: S. Srinivasan, Indian Institute of Technology M. Mehendale, Texas Instruments
Session 4C: Signal Integrity II: Chairs: R. Roy, Intel S. Nag, Xilinx
N.S. Nagaraj, Texas Instruments Inc
Frank Cano, Texas Instruments Inc
Duane Young, Texas Instruments Inc
Deepak Vohra, Texas Instruments Inc
Manoj Das, Texas Instruments(India) Ltd.
pp. 370
Jeegar Tilak Shah, Indian Institute of Technology
Madhav P. Desai, Indian Institute of Technology
S. Sanyal, Tata Institute of Fundamental Research
pp. 376
Session 5A: Testing III: Chairs: V.D. Agrawal, Bell Labs, Lucent Technologies I. Sengupta, Indian Institute of Technology
Mohammad Gh. Mohammad, University of Wisconsin-Madison
Kewal K. Saluja, University of Wisconsin-Madison
Alex Yap, Motorola
pp. 406
Session 5B: Verification: Chairs: P. Bose, IBM A. Roy, Synopsys
Subir K. Roy, Fujitsu Laboratories Limited
Hiroaki Iwashita, Fujitsu Laboratories Limited
Tsuneo Nakata, Fujitsu Laboratories Limited
pp. 418
Vamsi Boppana, Fujitsu Laboratories of America, Inc.
Indradeep Ghosh, Fujitsu Laboratories of America, Inc.
Rajarshi Mukherjee, Fujitsu Laboratories of America, Inc.
Jawahar Jain, Fujitsu Laboratories of America, Inc.
Masahiro Fujita, Fujitsu Laboratories of America, Inc.
pp. 436
Session 5C: Embedded Systems II: Chairs: D. Bhattacharya, Texas Instruments S.K. Nandy, Indian Institute of Science
Karthikeyan Madathil, Texas Instruments (India) Ltd.
Jagdish C Rao, Texas Instruments (India) Ltd.
Subash Chander, Texas Instruments (India) Ltd.
Amitabh Menon, Texas Instruments (India) Ltd.
Avinash K Gautam, Texas Instruments (India) Ltd.
Amit M Brahme, Texas Instruments (India) Ltd.
H. Udayakumar, Texas Instruments (India) Ltd.
pp. 468
Session 6A: Analog / Mixed-signal Circuits: Chair: S. Sen, University of Calcutta
Ruchir Puri, IBM T. J. Watson Research Center
C.T. Chuang, IBM T. J. Watson Research Center
pp. 474
Sanjeev Kumar Maheshwari, CYPRESS Semiconductors
R S Krishanan, CYPRESS Semiconductors
G.S. Visweswaran, Indian Institute of Technology, Delhi
pp. 480
B. Senapati, Indian Institute of Technology
C.K. Maiti, Indian Institute of Technology
N.B. Chakrabarti, Indian Institute of Technology
pp. 488
Baidyanath Ray, Bengal Engineering College (Deemed University)
P.Pal Choudhuri, Bengal Engineering College (Deemed University)
Prasanta Kumar Nandi, Bengal Engineering College (Deemed University)
pp. 492
Session 6B: Synthesis and Timing Analysis: Chairs: N. Ranganathan, University of South Florida C.P. Ravikumar, Indian Institute of Technology
Prabir Dasgupta, Indian Institute of Technology
Santanu Chattopadhyay, Indian Institute of Technology
Indranil Sengupta, Indian Institute of Technology
pp. 538
Session 6C: Testing IV: Chairs: H. Fugiwara, National Institute of Science and Technology P. Pal Chaudhuri, B.E. College
Biplab K. Sikdar, Bengal Engineering College (D.U)
Kolin Paul, Bengal Engineering College (D.U)
Gosta Pada Biswas, Bengal Engineering College (D.U)
P. Pal Chaudhuri, Bengal Engineering College (D.U)
Vamsi Boppana, Fujitsu Laboratories of America Inc.
Cliff Yang, Fujitsu-WWSLT Ltd.
Sobhan Mukherjee, Fujitsu-WWSLT Ltd.
pp. 556
Gloria Huertas, Universidad de Sevilla
Diego Vazquez, Universidad de Sevilla
Adoración Rueda, Universidad de Sevilla
José L. Huertas, Universidad de Sevilla
pp. 568
VLSI Design 1999 Paper (late arrival)
Juha Plosila, University of Turku
Tiberiu Seceleanu, Turku Center for Computer Science
pp. 578
Usage of this product signifies your acceptance of the Terms of Use.