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  • 12th International Conference on VLSI Design - 'VLSI for the Information Appliance'
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12th International Conference on VLSI Design - 'VLSI for the Information Appliance'
Goa, India
January 10-January 13
ISBN: 0-7695-0013-7
Table of Contents
Invited Talks
Invited Talk: The Information Appliance and Its Interface to the Analog World: Easy - Or Not So Easy
TCAD to ECAD I
Low Power I
Bedabrata Pain, California Institute of Technology
Guang Yang, California Institute of Technology
Brita Olson, California Institute of Technology
Timothy Shaw, California Institute of Technology
Monico Ortiz, California Institute of Technology
Julie Heynssens, California Institute of Technology
Chris Wrigley, California Institute of Technology
Charlie Ho, California Institute of Technology
pp. 26
Testing I
Invited Talk: Embedded Test for Systems-on-a-Chip
TCAD to ECAD II
Co-Design and Synthesis
Ludovic Jacomme, Universit? Pierre et Marie Curie
Frédéric Pétrot, Universit? Pierre et Marie Curie
Rajesh K. Bawa, Universit? Pierre et Marie Curie
pp. 151
Analog Design I
S . Savithri, Motorola India Electronics Ltd
D.G. Blaauw, Motorola India Electronics Ltd
A. Dharchoudhury, Advanced Systems Technology Lab
pp. 175
Multi-Valued Logic
Verification I
Invited Talk: Practical Use of Formal Verification - Where are we? Where do we go?
Testing II
Verification II
Srivatsan Srinivasan, The University of Texas at Austin
Parminder Singh Chhabra, The University of Texas at Austin
Praveen Kumar Jaini, The University of Texas at Austin
Adnan Aziz, The University of Texas at Austin
Lizy John, The University of Texas at Austin
pp. 288
DSP
D.V.R. Murthy, Indian Institute of Technology
S. Ramachandran, Indian Institute of Technology
S. Srinivasan, Indian Institute of Technology
pp. 336
Logic Synthesis
Low Power II
Physical Design I
Bulent Basaran, Intel Corporation
Kiran Ganesh, Intel Corporation
Raymond Lau, Intel Corporation
Artour Levin, Intel Corporation
Miles McCoo, Intel Corporation
Srinivasan Rangarajan, Intel Corporation
Naresh Sehgal, Intel Corporation
pp. 448
Testing III
Digital Design and Applications
Jacob Augustine, Concordia University
William Lynch, Concordia University
Yuke Wang, Concordia University
Asim J. Al-Khalili, Concordia University
pp. 538
Physical Design II
Sandip Das, North Bengal University
Subhas C. Nandy, Indian Statistical Institute
Bhargab B. Bhattacharya, Indian Statistical Institute
pp. 564
Analog Design II
Joonbae Park, Seoul National University
Yido Koo, Seoul National University
Wonchan Kim, Seoul National University
pp. 584
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