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8th International Conference on VLSI Design
New Delhi, India
January 04-January 07
ISBN: 0-8186-6905-5
Table of Contents
1 - Routing I: Chair: S. Sahni - University of Florida - Gainesville, USA
S.R. Danda, Dept. of Comput. Sci., Western Michigan Univ., Kalamazoo, MI, USA
S. Madhwapathy, Dept. of Comput. Sci., Western Michigan Univ., Kalamazoo, MI, USA
N.A. Sherwani, Dept. of Comput. Sci., Western Michigan Univ., Kalamazoo, MI, USA
pp. 3
A. Lim, Information Technol. Inst., Singapore, Singapore
S. Sahni, Information Technol. Inst., Singapore, Singapore
V. Thanvantri, Information Technol. Inst., Singapore, Singapore
pp. 8
S. Das, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
S. Saxena, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
pp. 13
2 - Hardware-Software Design/CAD: Chair: R.W. Hartenstein - University of Kaiserlautern, Germany
R.S. Mitra, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
M.G. Qadir, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
A. Basu, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 19
A. Singhal, AT&T Bell Labs., Murray Hill, NJ, USA
Chi-Yuan Lo, AT&T Bell Labs., Murray Hill, NJ, USA
pp. 25
R.S. Mitra, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
P.S. Roop, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
A. Basu, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 30
3 - Sequential Automatic Test Pattern Generation: Chair: J.A. Abraham - University of Texas at Austin, USA
J. Sienicki, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
M. Bushnell, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
P. Agrawal, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
V. Agrawal, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 36
T.J. Chakraborty, AT&T Bell Labs., Princeton, NJ, USA
V.D. Agrawal, AT&T Bell Labs., Princeton, NJ, USA
pp. 42
M.K. Srinivas, CAD Lab./SERC, Indian Inst. of Sci., Bangalore, India
J. Jacob, CAD Lab./SERC, Indian Inst. of Sci., Bangalore, India
V.D. Agrawal, CAD Lab./SERC, Indian Inst. of Sci., Bangalore, India
pp. 47
4 - Field Programmable Gate Arrays: Chair: R. Grafton -National Science Foundation, USA
S. Kumar, Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
K. Forward, Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
M. Palaniswami, Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
pp. 53
S. Chattopadhyay, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
S. Roy, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
P. Pal Chaudhuri, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 57
A. Pal, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
R.K. Gorai, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
V.V.S.S. Raju, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 63
M. Mehendale, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
M.K. Ram Prasad, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
pp. 69
5 - High-Level Synthesis: Chair: N.D. Dutt - University of California - Irvine, USA
A. Kumar, Cadence Design Syst. (I) Pvt. Ltd., Noida, India
A. Kumar, Cadence Design Syst. (I) Pvt. Ltd., Noida, India
M. Balakrishnan, Cadence Design Syst. (I) Pvt. Ltd., Noida, India
pp. 75
J. Jain, Fujitsu Lab. of America, San Jose, CA, USA
D. Moundanos, Fujitsu Lab. of America, San Jose, CA, USA
J. Bitner, Fujitsu Lab. of America, San Jose, CA, USA
J.A. Abraham, Fujitsu Lab. of America, San Jose, CA, USA
D.S. Fussell, Fujitsu Lab. of America, San Jose, CA, USA
D.E. Ross, Fujitsu Lab. of America, San Jose, CA, USA
pp. 81
S. Sarkar, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
A. Basu, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
A.K. Majumdar, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 87
A. Saldanha, California Univ., Berkeley, CA, USA
N.V. Shenoy, California Univ., Berkeley, CA, USA
R.K. Brayton, California Univ., Berkeley, CA, USA
A.L. Sangiovanni-Vincentelli, California Univ., Berkeley, CA, USA
pp. 93
6-Combinational Automatic Test Pattern Generation: Chair: D. Bhattacharya - Yale University, USA
Xinghao Chen, CAIP Center, Rutgers Univ., Piscataway, NJ, USA
M.L. Bushnell, CAIP Center, Rutgers Univ., Piscataway, NJ, USA
pp. 99
A. Raghunathan, Dept. of Electr. Eng., Princeton Univ., NJ, USA
P. Ashar, Dept. of Electr. Eng., Princeton Univ., NJ, USA
S. Malik, Dept. of Electr. Eng., Princeton Univ., NJ, USA
pp. 104
S. Yadavalli, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 110
S. Venkatraman, LSI Logic Corp., Milpitas, CA, USA
S. Seth, LSI Logic Corp., Milpitas, CA, USA
P. Agrawal, LSI Logic Corp., Milpitas, CA, USA
pp. 116
7--Logic Synthesis and Retiming: Chair: A. Saldanha - Cadence Berkeley Labs, USA
U.K. Bhattacharyya, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
I. Sen Gupta, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
S. Shyama Nath, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
P. Dutta, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 121
C. Bolchini, Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
G. Buonanno, Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
D. Sciuto, Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
R. Stefanelli, Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
pp. 125
S. Simon, Inst. for Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
R. Bucher, Inst. for Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
J.A. Nossek, Inst. for Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
pp. 130
S.T. Chakradhar, Comput. & Commun. Res. Lab., NEC Res. Inst., Princeton, NJ, USA
pp. 135
8-VLSI Arithmetic I: Chair: M.R. Varanasi - University of South Florida, USA
P. Patra, Dept. of Comput. Sci., Texas Univ., Austin, TX, USA
D.S. Fussell, Dept. of Comput. Sci., Texas Univ., Austin, TX, USA
pp. 141
A. Skaf, Integrated Syst. Design Group, TIMA Lab./INPG, Grenoble, France
A. Guyot, Integrated Syst. Design Group, TIMA Lab./INPG, Grenoble, France
pp. 146
S. Krishnakumar, TI, Bangalore, India
P. Suresh, TI, Bangalore, India
S. Sadashiva Rao, TI, Bangalore, India
M.P. Pareek, TI, Bangalore, India
R. Gupta, TI, Bangalore, India
pp. 150
L. Penzo, Dipartimento di Elettronica, Politecnico di Milano, Italy
D. Sciuto, Dipartimento di Elettronica, Politecnico di Milano, Italy
C. Silvano, Dipartimento di Elettronica, Politecnico di Milano, Italy
pp. 156
9 - Delay Test: Chair: T. J. Chakraborty --AT&T Bell Labs, USA
A.K. Majhi, Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
J. Jacob, Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
L.M. Patnaik, Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
V.D. Agrawal, Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
pp. 161
K. Heragu, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
V.D. Agrawal, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
M.L. Bushnell, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 166
S.M. Nowick, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
N.K. Jha, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Fu-Chiung Cheng, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
pp. 171
I.P. Shaik, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
M.L. Bushnell, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 177
10 - Chip Design: Chair: J. Hatfield - University of Manchester Institute of Science and Technology, UK
P. Jayalakshmi, Semicond. Complex Ltd., Bangalore, India
S. Vidya, Semicond. Complex Ltd., Bangalore, India
S. Krishnakumar, Semicond. Complex Ltd., Bangalore, India
K. Ravisankar, Semicond. Complex Ltd., Bangalore, India
P. Kumar, Semicond. Complex Ltd., Bangalore, India
pp. 183
11 - Tools and Technology Posters: Chair: G.S. Visweswaran -- IIT, India
V. Puvvada, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
S. Potla, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
T. Selvam, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
P.R. Suresh, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
pp. 192
N. Subramanyam, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
K.G. Praveen, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
R. Ramani, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
D. Suryanarayana, Texas Instrum. (India) Pvt. Ltd., Bangalore, India
pp. 193
H.A. Naseem, High Density Electron. Center, Arkansas Univ., Fayetteville, AR, USA
A.P. Malshe, High Density Electron. Center, Arkansas Univ., Fayetteville, AR, USA
R.A. Beera, High Density Electron. Center, Arkansas Univ., Fayetteville, AR, USA
M.S. Haque, High Density Electron. Center, Arkansas Univ., Fayetteville, AR, USA
W.D. Brown, High Density Electron. Center, Arkansas Univ., Fayetteville, AR, USA
L.W. Schaper, High Density Electron. Center, Arkansas Univ., Fayetteville, AR, USA
pp. 194
12 - Panel: India in the VLSI World - High-Tech Innovator or Body Shop?
14 - Routing II: Chair: N. Sherwani - Western Michigan University, USA
R.K. Pal, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
S.P. Pal, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
M.M. Das, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
A. Pal, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 196
R.K. Pal, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
A.K. Datta, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
S.P. Pal, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
M.M. Das, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
A. Pal, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
pp. 202
J. Khare, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
S. Mitra, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
P.K. Nag, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
U. Maly, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
R. Rutenbar, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 208
15 - Image Compression: Chair: S. Choudhury - IIT, New Delhi, India
H. Sahabi, Dept. of Comput. Sci., Alberta Univ., Edmonton, Alta., Canada
A. Basu, Dept. of Comput. Sci., Alberta Univ., Edmonton, Alta., Canada
M. Fiala, Dept. of Comput. Sci., Alberta Univ., Edmonton, Alta., Canada
pp. 214
M. Kovac, Fac. of Electr. Eng., Zagreb Univ., Croatia
P. Ranganathan, Fac. of Electr. Eng., Zagreb Univ., Croatia
pp. 220
J. Augustine, Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
Wen Feng, Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
J. Jacob, Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
pp. 225
16 - Analog Circuit Test: Chair: A.B. Bhattacharya - IIT, New Delhi, India
A. Devgan, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
R.A. Rohrer, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 229
N. Nagi, LogicVision, San Jose, CA, USA
A. Chatterjee, LogicVision, San Jose, CA, USA
A. Balivada, LogicVision, San Jose, CA, USA
J.A. Abraham, LogicVision, San Jose, CA, USA
pp. 234
A.K.B. A'ain, Dept. of Eng., Lancaster Univ., UK
A.H. Bratt, Dept. of Eng., Lancaster Univ., UK
A.P. Dorey, Dept. of Eng., Lancaster Univ., UK
pp. 239
17 - Synthesis and Verification: Chair: S. Kumar - IIT, India
W.L. Bradley, Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
R.R. Vemuri, Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
pp. 243
B.M. Subraya, Dept. of Comput. Sci. & Eng., S.J. Coll. of Eng., Mysore, India
A. Kumar, Dept. of Comput. Sci. & Eng., S.J. Coll. of Eng., Mysore, India
S. Kumar, Dept. of Comput. Sci. & Eng., S.J. Coll. of Eng., Mysore, India
pp. 249
R. Kumar, Forschungszentrum Inf. Karlsruhe, Germany
T. Kropf, Forschungszentrum Inf. Karlsruhe, Germany
K. Schneider, Forschungszentrum Inf. Karlsruhe, Germany
pp. 255
18 - VLSI Technology/CAD: Chair: M.M. Hasan - IIT, Kanpur, India
S.Y. Kulkarni, Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
K.D. Patil, Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
K.V.V. Murthy, Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
pp. 260
D.V. Das, Cadence Design Syst. (India) Pvt. Inc., Noida, India
pp. 264
G.H.R. Krishna, Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
A.K. Aditya, Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
N.B. Chakrabarti, Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
S. Banerjee, Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
pp. 268
19 - Testability: Chair: S.D. Sherlekar - IIT, Bombay, India
C.P. Ravikumar, Dept. of Electr. Eng., Indian Inst. of Technol., Delhi, India
H. Joshi, Dept. of Electr. Eng., Indian Inst. of Technol., Delhi, India
pp. 272
S.M. Aziz, Dept. of Electr. & Electron. Eng., Bangladesh Univ. of Eng. & Technol., Dhaka, Bangladesh
pp. 278
A. Balakrishnan, RUTCOR, Rutgers Univ., New Brunswick, NJ, USA
S.T. Chakradhar, RUTCOR, Rutgers Univ., New Brunswick, NJ, USA
pp. 283
E.M. Rudnick, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 288
20 - Low-Power/Analog Design: Chair: P.R. Mukund - Rochester Institute of Technology, USA
M. Borah, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
M.J. Irwin, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
R.M. Owens, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
pp. 294
V. Catania, Istituto di Inf. e Telecommun., Catania Univ., Italy
M. Russo, Istituto di Inf. e Telecommun., Catania Univ., Italy
pp. 299
S.C. Prasad, Inf. Technol. Lab., Texas Instrum. Inc., Dallas, TX, USA
K. Roy, Inf. Technol. Lab., Texas Instrum. Inc., Dallas, TX, USA
pp. 305
G.A. Hadgis, Eastman Kodak Co., Rochester, NY, USA
P.R. Mukund, Eastman Kodak Co., Rochester, NY, USA
pp. 310
21 - Array Processor Design: Chair: L.M. Patnaik - IISc, India
G. Ascia, Istituto di Inf. e Telecommun., Catania Univ., Italy
V. Catania, Istituto di Inf. e Telecommun., Catania Univ., Italy
pp. 315
L. Kurian, Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
D. Brewer, Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
E. John, Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
pp. 321
M.S. Gopi, Supercomput. Educ. & Res. Centre, Indian Inst. of Sci., Bangalore, India
S. Manohar, Supercomput. Educ. & Res. Centre, Indian Inst. of Sci., Bangalore, India
pp. 326
V. Visvanathan, Supercomput. Educ. & Res. Centre, Indian Inst. of Sci., Bangalore, India
N. Ramanathan, Supercomput. Educ. & Res. Centre, Indian Inst. of Sci., Bangalore, India
pp. 332
22 - Diagnosis and Self-Checking: Chair: B. Mitra - Texas Instruments, Bangalore, India
Sreejit Chakravarty, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
Y. Gong, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
pp. 338
S. Chattopadhyay, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
D.R. Chowdhuri, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
S. Bhattacharjee, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
P.P. Chaudhuri, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
pp. 343
Yung-Yuan Chen, Dept. of Comput. Sci., Chung-Hua Polytech. Inst., Hsin-Chu, Taiwan
Ching-Hwa Cheng, Dept. of Comput. Sci., Chung-Hua Polytech. Inst., Hsin-Chu, Taiwan
Jwu-E Chen, Dept. of Comput. Sci., Chung-Hua Polytech. Inst., Hsin-Chu, Taiwan
pp. 349
B.R. Kishore, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
R.A. Parekhji, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
S. Pagey, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
S.D. Sherlekar, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
G. Venkatesh, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
pp. 355
23 - Floorplanning and Partitioning: Chair: B.B. Bhattacharya -- Indian Statistics Institute, India
Jin-Tai Yan, Dept. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Pei-Yung Hsiao, Dept. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 359
K. Shahookar, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
P. Mazumder, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 365
P.S. Dasgupta, Comput. Center, Indian Inst. of Manage., Calcutta, India
S. Sur-Kolay, Comput. Center, Indian Inst. of Manage., Calcutta, India
B.B. Bhattacharya, Comput. Center, Indian Inst. of Manage., Calcutta, India
pp. 370
D. Bhatia, Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
J. Haralambides, Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
pp. 376
24 - VLSI Arithmetic II: Chair: C. Shekhar- CEERI, India
L. Montalvo, Integrated Syst. Design Group, TIMA/INPG, Genoble, France
A. Guyot, Integrated Syst. Design Group, TIMA/INPG, Genoble, France
pp. 381
A. Guyot, Integrated Syst. Design Group, TIMA/INPG, Grenoble, France
L. Montalvo, Integrated Syst. Design Group, TIMA/INPG, Grenoble, France
A. Houelle, Integrated Syst. Design Group, TIMA/INPG, Grenoble, France
H. Mehrez, Integrated Syst. Design Group, TIMA/INPG, Grenoble, France
N. Vaucher, Integrated Syst. Design Group, TIMA/INPG, Grenoble, France
pp. 386
D.V. Poornaiah, Transmission R&D, Indian Telephone Ind. Ltd., Bangalore, India
P.V.A. Mohan, Transmission R&D, Indian Telephone Ind. Ltd., Bangalore, India
pp. 392
W. Amendola, Jr., Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
H.R. Srinivas, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
K.K. Parhi, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
pp. 398
25 - Design and Synthesis for Testability: Chair: S. Bhawmik -AT&T Bell Labs, USA
S.R. Das, Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
H.T. Ho, Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
W.-B. Jone, Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
A.R. Nayak, Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
pp. 403
C.R. Mohan, Cadence Design Syst. (India) Pvt Ltd., Noida, India
P.P. Chakrabarti, Cadence Design Syst. (India) Pvt Ltd., Noida, India
pp. 408
M. Franklin, Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
K.K. Saluja, Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
K. Kim, Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
pp. 414
J.P. Hurst, Center for Digital Syst. Res., Res. Triangle Inst., Research Triangle Park, NC, USA
A.D. Singh, Center for Digital Syst. Res., Res. Triangle Inst., Research Triangle Park, NC, USA
pp. 419
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