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Fall VIUF Workshop
Orlando, Florida
October 04-October 06
ISBN: 0-7695-0465-5
Table of Contents
Paper Session 1 — Design Reuse I
Ireneusz Janiszewski, Institute of Electron Technology
Robert Baraniecki, Institute of Electron Technology
Krystyna Siekierska, Institute of Electron Technology
pp. 14
Workshop 1
Paper Session 2 — Test & Functional Verification
Claus Schneider, Infineon Technologies, Cores and Modules
Axel Jahnke, Infineon Technologies, Cores and Modules
Georg Sigl, Infineon Technologies, Cores and Modules
pp. 24
Workshop 2
Paper Session 3 — Design Reuse II
F. Herrera, University of Cantabria
C. Sanz, University of Cantabria
I. Ugarte, University of Cantabria
E. Villar, University of Cantabria
pp. 50
Wolfgang Ecker, Infineon Technologies
Mike Heuchling, Infineon Technologies
Claus Schneider, Infineon Technologies
Martin Zambaldi, Infineon Technologies
Andre Windisch, Technical University of Chemnitz
Jochen Mades, Technical University of Darmstadt
Thomas Schneider, Technical University of Darmstadt
Ke Yang, Technical University of Darmstadt
pp. 57
Henning Coors, Eberhard-Karls-Universit?t Tuebingen
Natividad Martinez Madrid, Forschungszentrum Informatik (FZI)
Ralf Seepold, Forschungszentrum Informatik (FZI)
pp. 63
Workshop 3
Embedded Tutorial
Virtual Socket Interface Alliance: A Status Review
Plenary Session — Panel
Reuse: Where Are We so Far? What's Next?
Paper Session 4 — Business Issues
Workshop 4
Paper Session 5 — Design Reuse III
U. Bidarte, University of the Basque Country
J.A. Ezquerra, University of the Basque Country
A. Zuloaga, University of the Basque Country
J.L. Mart, University of the Basque Country
pp. 94
Workshop 5
Workshop Summary
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