- V
- VIUF
- 1997
- 1997 VHDL International User's Forum (VIUF '97)
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1997 VHDL International User's Forum (VIUF '97) Arlington, VA October 19-October 22 ISBN: 0-8186-8180-2 Table of Contents
 | Session 1: Verification |
A. Peymandoust, Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Z. Navabi, Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA pp. 2
B. Kadrovach, Res. & Dev. Center, Wright-Patterson AFB, OH, USA
B. Read, Res. & Dev. Center, Wright-Patterson AFB, OH, USA
R. Bishop, Res. & Dev. Center, Wright-Patterson AFB, OH, USA
L. Concha, Res. & Dev. Center, Wright-Patterson AFB, OH, USA
K. Olson, Res. & Dev. Center, Wright-Patterson AFB, OH, USA pp. 11
Z. Navabi, Dept. of Electr. & Comput. Eng., Tehran Univ., Iran pp. 18
 | Session 2: Performance Modeling |
W.W. Dungan, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
R.H. Klenke, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
J.H. Aylor, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA pp. 25
T. Bautista, CAD Div., Univ. of Las Palmas de Gran Canaria, Spain
G. Marrero, CAD Div., Univ. of Las Palmas de Gran Canaria, Spain
P.P. Carballo, CAD Div., Univ. of Las Palmas de Gran Canaria, Spain
A. Nunez, CAD Div., Univ. of Las Palmas de Gran Canaria, Spain pp. 43
 | Session 3: OO-VHDL |
P.J. Ashenden, Dept. of Comput. Sci., Adelaide Univ., SA, Australia
P.A. Wilsey, Dept. of Comput. Sci., Adelaide Univ., SA, Australia
D.E. Martin, Dept. of Comput. Sci., Adelaide Univ., SA, Australia pp. 60
 | Session 4: Synthesis |
 | Session 5: System Level Modeling |
T. Hadlich, Inst. of Autom., Magdeburg Univ., Germany pp. 109
 | Session 6: Model Generation and Metrics |
P. Chawla, Symvionics Inc., Beavercreek, OH, USA pp. 126
 | Session 7: FPGAs |
Jiang Niu, Bell Laboratories, Lucent Technologies Inc. pp. 135
T. Hadlich, Inst. of Autom., Magdeburg Univ., Germany pp. 150
 | Session 8: Legacy++ |
D. Soderberg, Electron. Lab., Defence Mater. Adm., Linkoping, Sweden pp. 157
P.J. Ashenden, Dept. of Comput. Sci., Adelaide Univ., SA, Australia
P.A. Wilsey, Dept. of Comput. Sci., Adelaide Univ., SA, Australia
D.E. Martin, Dept. of Comput. Sci., Adelaide Univ., SA, Australia pp. 170
 | Session R1: RASSP Model Library |
J.A. DeBardelaben, Center for Signal & Image Process., Georgia Inst. of Technol., Atlanta, GA, USA
V.K. Madisetti, Center for Signal & Image Process., Georgia Inst. of Technol., Atlanta, GA, USA
A.J. Gadient, Center for Signal & Image Process., Georgia Inst. of Technol., Atlanta, GA, USA pp. 183
 | Session R2: Performance Modeling |
R.H. Klenke, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
J.H. Aylor, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
B.W. Johnson, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
C.Y. Choi, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
M. Meyassed, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
R. Rao, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
W.W. Dungan, Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA pp. 190
 | Session 9: Test Benches and Reliability Analysis |
B. Alizadeh, Dept. of Electr. & Comput. Eng., Tehran Univ., Iran
Z. Navabi, Dept. of Electr. & Comput. Eng., Tehran Univ., Iran pp. 225
 | Session R3: Potpourri |
J. Wedgwood, Lockheed Martin Adv. Technol. Labs., Camden, NJ, USA
G. Buchanan, Lockheed Martin Adv. Technol. Labs., Camden, NJ, USA pp. 231
 | Session 10: Mixed Nuts |
J. Papanuskas, Autom. Equipment Div., Robert Bosch GmbH, Ruetlingen, Germany pp. 252
D.J. Gibson, Sch. of Design, Eng. & Comput., Bournemouth Univ., Poole, UK
M.K. Teal, Sch. of Design, Eng. & Comput., Bournemouth Univ., Poole, UK
D. Ait-Boudaoud, Sch. of Design, Eng. & Comput., Bournemouth Univ., Poole, UK
M. Winchester, Sch. of Design, Eng. & Comput., Bournemouth Univ., Poole, UK pp. 268 Usage of this product signifies your acceptance of the Terms of Use.
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