- T
- TAIC-PART
- 2006
- Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06)
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Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) Windsor, United Kingdom August 29-August 31 ISBN: 0-7695-2672-1 Table of Contents
 | Introduction |
 | Keynote Paper |
 | Motivation for Testing |
 | Fault Prediction |
 | Automated Inference and Abstraction |
 | PhD Papers |
 | Testing in Context |
 | Techniques |
 | Empirical Studies |
R. Najjar, School of Computer Science and Information Systems, Birbeck, UK
G. Loizou, School of Computer Science and Information Systems, Birbeck, UK pp. 181-192
 | Case Studies |
Petra Heck, Eindhoven University of Technology, The Netherlands pp. 211-220
 | Author Index | Usage of this product signifies your acceptance of the Terms of Use.
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