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2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement
Panel: Increase Industry and Academy Cooperation in Testing Technologies and Tools for Critical Industry Applications
Shanghai, China
July 08-July 10
ISBN: 978-0-7695-3758-0
Citation:
Bao Tang, "Panel: Increase Industry and Academy Cooperation in Testing Technologies and Tools for Critical Industry Applications," ssiri, pp.376, 2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement, 2009
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